Records |
Author |
Van Grieken, R. |
Title |
New members of the editorial board of X-ray Spectrometry |
Type |
A1 Journal article |
Year |
2013 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
42 |
Issue |
1 |
Pages |
1-2 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000314971600001 |
Publication Date |
2012-12-22 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
|
ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:104627 |
Serial |
8301 |
Permanent link to this record |
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Author |
Van Grieken, R. |
Title |
Editorial : award for best X-Ray Spectrometry referee during 2011-2012 |
Type |
A1 Journal article |
Year |
2013 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
42 |
Issue |
1 |
Pages |
3 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000314971600002 |
Publication Date |
2012-12-22 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record |
Impact Factor |
|
Times cited |
|
Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:104628 |
Serial |
7830 |
Permanent link to this record |
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|
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Author |
Van Grieken, R. |
Title |
Editorial : introducing Dr Markowicz as X-Ray Spectrometry's new associate editor for Europe |
Type |
A1 Journal article |
Year |
2013 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
42 |
Issue |
4 |
Pages |
175 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Wos |
000320727900001 |
Publication Date |
2013-06-20 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:108738 |
Serial |
7832 |
Permanent link to this record |
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Author |
Vanmeert, F.; Mudronja, D.; Fazinic, S.; Janssens, K.; Tibljas, D. |
Title |
Semi-quantitative analysis of the formation of a calcium oxalate protective layer for monumental limestone using combined micro-XRF and micro-XRPD |
Type |
A1 Journal article |
Year |
2013 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
42 |
Issue |
4 |
Pages |
256-261 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
A current method for the protection of cretaceous limestone present in various monuments consists of performing a passivating treatment with ammonium oxalate (AmOx). A calcium oxalate protective layer is formed on the surface and enhances the acid resistance of the stone. The in-depth formation of the calcium oxalate layer was investigated on cross sections by using combined micro X-ray fluorescence and micro X-ray powder diffraction (mu XRF/mu XRPD). XRPD showed the presence of both whewellite and weddellite in the calcite stone matrix. A correction was made for sample misalignment, which was visible in both the fluorescence and the diffraction line measurements. A semi-quantitative analysis was performed on the basis of Klug's equation for a two-phase mixture (the presence of weddellite was neglected) without the need for a known reference sample. By assuming two extreme compositions for a reference weight fraction (1 and 99wt%), it was possible to obtain whewellite concentration profiles, which can be used for comparing the effectiveness of different methods for the application of AmOx to the stone surface and the effect of treatment time and AmOx concentration used. It is shown that for the relative amounts of whewellite formed, the differences due to the assumed weight fractions are smaller than the errors due to sample heterogeneity and preferred orientation. Copyright (c) 2013 John Wiley & Sons, Ltd. |
Address |
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Thesis |
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Place of Publication |
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Language |
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Wos |
000320727900015 |
Publication Date |
2013-05-14 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
5 |
Open Access |
|
Notes |
; The authors would like to thank De Nolf W. for his valuable feedback on the analysis of the X-ray diffraction data. We acknowledge SOLEIL for provision of SR facilities (proposal ID 20100979), and we would like to thank Dr. C. Mocuta for his assistance at the DIFFABS beamline. This research was supported by the Interuniversity Attraction Poles Program – Belgian Science Policy (IUAP VI/16). The text also presents results of GOA 'XANES meets ELNES' (Research Fund University of Antwerp, Belgium) and from FWO (Brussels, Belgium) projects no. G.0704.08 and G.01769.09. The EU Community's FP7 Research Infrastructures program for the CHARISMA Project (grant agreement 228330) and, within framework in particular, the access possibilities to the SOLEIL and IPANEMA facilities are also acknowledged. ; |
Approved |
Most recent IF: 1.298; 2013 IF: 1.187 |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:109579 |
Serial |
5827 |
Permanent link to this record |
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Author |
Van Dyck, P.; Török, S.; Van Grieken, R. |
Title |
Monte Carlo simulation of backscattered peaks in secondary target energy-dispersive X-ray spectra |
Type |
A1 Journal article |
Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
15 |
Issue |
4 |
Pages |
231-238 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
A Monte Carlo simulation has been developed to describe the incoherent and coherent scatter processes for the complex geometry of a secondary target energy-dispersive x-ray fluorescence system. Photons are followed from the x-ray tube anode until the detection of scattered secondary target photons in the active Si layer of the detector. The program quantitatively shows the broadening of the incoherent scatter peak with increasing atomic number, and it models the incoherent peak shape adequately. The incoherent-to-coherent scatter intensity ratios obtained differ by 1030% from the theoretical values, while their dependence on the sample atomic number corresponds to that expected from theory. |
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Corporate Author |
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Thesis |
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Place of Publication |
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Language |
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Wos |
A1986E535600001 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:113612 |
Serial |
8280 |
Permanent link to this record |
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|
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Author |
Markowicz, A.; Storms, H.; Van Grieken, R. |
Title |
A simple absorption correction for electron probe X-ray microanalysis of bulk samples |
Type |
A1 Journal article |
Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
15 |
Issue |
2 |
Pages |
115-119 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
A simple procedure is proposed for the calculation of the absorption correction factor in electron-probe x-ray microanalysis. It is based on the concept of an effective depth of x-ray production, assuming a rectangular depth distribution function for x-ray generation. This effective x-ray production depth is expressed as a fraction of the x-ray excitation depth given by Whelan's expression. Adequate values for this fraction are presented. Two versions are considered. In the first the effective x-ray production is a function of both the characteristic x-ray energy and the atomic numbers of the matrix elements, whereas in the second one, which is indicated for routine use, the energy dependence is neglected. Calculations pointed to satisfactory results, even for low x-ray energies and high overvoltages. |
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Place of Publication |
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Wos |
A1986C017300007 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:113872 |
Serial |
8524 |
Permanent link to this record |
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Author |
Markowicz, A.; Storms, H.; Van Grieken, R. |
Title |
Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples |
Type |
A1 Journal article |
Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
15 |
Issue |
2 |
Pages |
131-133 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
A new equation for predicting the generated bremsstrahlung background intensity in electron-probe x-ray microanalysis has been verified experimentally. This equation is applicable to all bulk composite specimens and reduces to Kramers' equation for pure elements only. The experimental verification has been carried out for Al2O3, Fe2O3 and ZrO2 with radiation energies from 4.2 to 14.8 keV. The predicted bremsstrahlung intensities are in good agreement with the experimental data. |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Language |
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Wos |
A1986C017300009 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:113873 |
Serial |
7937 |
Permanent link to this record |
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Author |
Van Grieken, R. |
Title |
Introducing John Campbell, the new regional editor for North America of X-Ray Spectrometry |
Type |
Editorial |
Year |
2014 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
43 |
Issue |
2 |
Pages |
67 |
Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Publisher |
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Place of Publication |
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Wos |
000331386000001 |
Publication Date |
2014-02-07 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:114470 |
Serial |
8120 |
Permanent link to this record |
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Author |
Van Grieken, R. |
Title |
Awards for best referees of X-ray Spectrometry |
Type |
Editorial |
Year |
2014 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
43 |
Issue |
2 |
Pages |
68-69 |
Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Publisher |
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Place of Publication |
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Wos |
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Publication Date |
2014-02-07 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:114471 |
Serial |
7542 |
Permanent link to this record |
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Author |
Van Grieken, R.E.; Adams, F.C. |
Title |
Folding of aerosol loaded filters during X-ray fluorescence analysis |
Type |
A1 Journal article |
Year |
1976 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
5 |
Issue |
2 |
Pages |
61-67 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Folding aerosol loaded filters in two with the loaded side inwards during the X-ray analysis not only reduces possible filter heterogeneity effects and improves sample protection, but also increases the sensitivity and renders filter paper absorption corrections simple and more accurate in many instances. It is shown that folding an aerosol loaded Whatman filter paper during Kα X-rays counting leads to an increased sensitivity for all elements up from calcium, scandium or titanium (depending on the sensitivity definition and on the aerosol load) and for all elements up from phosphorus, sulphur or chlorine in the case of the Nuclepore filter. Although the absorption by the filter, into which the aerosol penetrates to some extent, is always more important in the sandwich than in the usual geometry, the dependence of the absorption correction on the usually unknown average deposition depth is less pronounced. Assuming all the aerosol material to be collected at the very surface of the filter and hence being present in the centre of the sandwich to be analysed, leads to an extremely simple filter paper absorption correction which is less prone to uncertainties than more sophisticated corrections in the usual geometry requiring additional measurements. This is the case for all elements up from potassium on Whatman filters and up from phosphorus on Nuclepore filters. |
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Wos |
A1976BM95300002 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116480 |
Serial |
7976 |
Permanent link to this record |
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Author |
Sauter, L.; Van der Ben, D.; Van Grieken, R. |
Title |
Trace analysis of estuarine brown algae by energy-dispersive X-ray fluorescence |
Type |
A1 Journal article |
Year |
1979 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
8 |
Issue |
4 |
Pages |
159-163 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Brown algae, which are good indicators for estuarine metal pollution, can advantageously be analysed by energy-dispersive X-ray fluorescence. The use of thin film samples and samples of intermediate thickness has several advantages over the conventional thick pellet procedure. A quite homogeneous thin target is prepared by suspending 15 mg of dried and ground seaweed powder in bi-distilled water and evaporating the slurry on a 10 cm2 Mylar foil held in a Teflon ring. The effective sample weight in the beam is calculated by a procedure based on the scatter peaks in the spectrum. Sensitivities are typically in the 215 ppm range. The coefficient of variation per analysis averaged over ten elements amounts to 10%. The natural concentration variation in seaweed specimens at one location is 13%. Samples from locations in the more polluted western Scheldt estuary yield significantly higher values for several elements, relative to the eastern Scheldt sites. Possible trace element variations between the top and base of plants, and between different seaweed specimens and sampling seasons, are discussed. |
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Wos |
A1979JC63700003 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116481 |
Serial |
8687 |
Permanent link to this record |
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Author |
Markowicz, A.; Van Dyck, P.; Van Grieken, R. |
Title |
Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis |
Type |
A1 Journal article |
Year |
1980 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
9 |
Issue |
2 |
Pages |
52-56 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
In X-ray fluorescence analysis the concept of radiometric diameter, d, is often introduced in considerations of the fluorescent intensity from a particulate sample. It represents the mean geometric path of the X-rays through one particle and is usually simply taken to be equal to the volume-to-area ratio of the particle. The effective radiometric path is, however, itself dependent on geometry and absorption effects. Rigorous calculations of the fluorescent intensity from a particle in the π and π/2 geometries were carried out to evaluate the errors involved. It appears that, for π geometry, the discrepancy between these exact results and the intensity calculated via the use of d does not exceed 5.2%. For the π/2 geometry, the errors are much larger and can amount to 50% in realistic cases of X-ray fluorescence analysis. These conclusions are also applicable to monolayers. The effective radiometric diameter approaches d only when absorption effects become negligible, but is smaller in other cases. |
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Wos |
A1980JN16500003 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116482 |
Serial |
8451 |
Permanent link to this record |
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Author |
Van Dyck, P.; Markowicz, A.; Van Grieken, R. |
Title |
Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal |
Type |
A1 Journal article |
Year |
1980 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
9 |
Issue |
2 |
Pages |
70-76 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
A method has been investigated which allows calculations from the X-ray fluorescence spectra of the absorption coefficients at any energy for any sample, without any additional measurement. Use is made of the ratio of the characteristic X-ray signals from a Zr wire positioned in front of the sample and from a Pd foil placed behind the sample, both in a fixed geometry. From the experimentally measured absorption coefficient at the Pd L energy (2.9 keV), the coefficients for higher energies are calculated. By the use of an iterative computer routine in which corrections for the enhancement of the Pd foil by the sample are also included, an accuracy of 2% or better on the absorption coefficient determination can be reached for homogenous samples in one measurement. Grain-size and heterogeneity effects induce inaccuracies on the absorption coefficient determinations which might well reach 20% for particulate samples like intermediate thickness deposits of geological materials. This approach thus has the same limitations as the classical transmission method for such heterogeneous samples. |
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Wos |
A1980JN16500007 |
Publication Date |
2005-05-28 |
Series Editor |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116483 |
Serial |
7541 |
Permanent link to this record |
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Author |
Van Dyck, P.; Van Grieken, R. |
Title |
Automated matrix-correction of line ratios in energy-dispersive x-ray fluorescence spectrum deconvolution |
Type |
A1 Journal article |
Year |
1983 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
12 |
Issue |
3 |
Pages |
111-114 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Most computer XRF-spectrum deconvolution routines make use of fixed intensity ratios for the lines from one element. The magnitude of the error that fixed ratios imply has been quantitatively evaluated for samples with a varible thickness or matrix. A procedure for routinely adapting the line ratios according to the matrix effect in every sample (by making use of the matrix information present in the scatter peaks) enhances the accuracy of the spectrum evaluation. |
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Wos |
A1983RA69700004 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116484 |
Serial |
7539 |
Permanent link to this record |
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Author |
Török, S.; Van Dyck, P.; Van Grieken, R. |
Title |
Heterogeneity effects in direct X-ray fluorescence analysis of hair |
Type |
A1 Journal article |
Year |
1984 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
13 |
Issue |
1 |
Pages |
27-32 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
The methodology of direct hair analysis by energy-dispersive x-ray fluorescence was studied. The effect on the XRF result of having a non-homogeneous radial distribution of the analyte in a single hair strand and the macroscopic effects in a bundle of hairs were calculated to evaluate possible systematic errors. The detection limits were mapped as a function of the target thickness and surface fraction. It appeared that a 10 mg cm−2 sample thickness, i. e. a target with about four layers of hair strands, is recommended. The standard deviation of this simple direct analytical method is 619% for some important elements. Discrepancies with neutron activation analysis had a mean value of around 15%. About twelve elements can be determined simultaneously on a routine basis. |
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Wos |
A1984SB70200004 |
Publication Date |
2005-05-28 |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116485 |
Serial |
8029 |
Permanent link to this record |
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|
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Author |
Van Dyck, P.; Markowicz, A.; Van Grieken, R. |
Title |
Influence of sample thickness, excitation energy and geometry on particle size effects in XRF |
Type |
A1 Journal article |
Year |
1985 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
14 |
Issue |
4 |
Pages |
183-187 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Expressions are presented for calculating the matrix effect and the pure particle size effect in the XRF analysis of particulate samples with a discrete particle size. The equations are based on the absorption-weighted radiometric diameter concept. Two excitationdetection geometries are considered, with the angles between the sample plane and both the incident and emerging radiation being either 90° (π geometry) or 45° (π/2 geometry). Calculations were made for different sample loadings and exciting radiation energies. The influence of these parameters on the matrix and pure particle size effects is shown. From the results, it is possible to predict the performances of alternative experimental correction procedures for the particle size effect, involving dual measurements at different excitation energies or in different excitationdetection geometries. |
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Wos |
A1985ATB6100007 |
Publication Date |
2005-05-28 |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116486 |
Serial |
8097 |
Permanent link to this record |
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Author |
Labrecque, J.J.; Beusen, J.M.; Van Grieken, R.E. |
Title |
Determination of barium, lanthanum, cerium and neodymium in lateritic materials by various energy-dispersive X-ray fluorescence techniques and neutron activation analysis |
Type |
A1 Journal article |
Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
15 |
Issue |
1 |
Pages |
13-18 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
A comparison of four methods for the determination of barium, lanthanum, cerium and neodymium in lateritic materials from Brazil is presented. Three of the methods were based on x-ray fluorescence (XRF) spectroscopy: two by radioisotope excitation (Co-57 and Am-241) and one by secondary target XRF (a molybdenum target with a tungsten anode). The other method was based on neutron activation analysis employing both a Ge(Li) coaxial detector and a high-purity germanium detector. The results from these four methods were similar for lanthanum, cerium and neodymium, but for barium at low concentrations (<500 ppm) the neutron activation and the secondary target XRF methods were not suitable. Data on the precision and accuracy of these methods using a series of standard reference rocks are given. The advantages and limitations of each of these methods with respect to the analysis of lateritic materials are discussed. |
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Wos |
A1986AYN6000003 |
Publication Date |
2005-05-28 |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116487 |
Serial |
7774 |
Permanent link to this record |
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Author |
Török, S.; Braun, T.; Van Dyck, P.; Van Grieken, R. |
Title |
Heterogeneity effects in direct XRF analysis of traces of heavy metals preconcentrated on polyurethane foam sorbents |
Type |
A1 Journal article |
Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
15 |
Issue |
1 |
Pages |
7-11 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Trace amounts of heavy metals were preconcentrated on discs of polyurethane (PU) foam loaded with ammonium diethyldithiocarbamate (DDTC), to increase the sensitivity of XRF. Since the diameter of the cavities in the open-cell PU foams reaches 30300 μm, considerable heterogeneity effects might occur, which could reduce the accuracy of the method. The possible systematic error introduced by considering the sample to be homogeneous is calculated using the Berry et al. model. The calculations show that the underestimation of the absorption correction factor when considering the sample as being homogeneous is less than 2% for high-Z elements when the sample thickness is at least 2 mm. The detection limits are also around the minima for this thickness. |
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Place of Publication |
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Wos |
A1986AYN6000002 |
Publication Date |
2005-05-28 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
|
ISSN |
0049-8246 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116488 |
Serial |
8030 |
Permanent link to this record |
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Author |
Storms, H.M.; Janssens, K.H.; Török, S.B.; Van Grieken, R.E. |
Title |
Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles |
Type |
A1 Journal article |
Year |
1989 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
18 |
Issue |
2 |
Pages |
45-52 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
The ArmstrongBuseck correction for absorption effects in electron probe x-ray microanalysis of particles considers seven specific particle shapes, and for these geometries exact correction equations are used. This procedure implies that the analyst has to associate the particle to be analysed with a certain particle type; an arbitrary relative thickness is sometimes assumed. A theoretical study was made of this absorption correction as a function of the particle composition, type and thickness for micrometre-sized particles. It appears that a correct choice of the particle type is critical. However, when the analytical results are normalized to 100%, the differences between the models are much less pronounced, and it is justified to assume a spherical model in all cases. |
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Wos |
A1989U261400001 |
Publication Date |
2005-05-28 |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116489 |
Serial |
5616 |
Permanent link to this record |
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Author |
Muia, L.M.; Van Grieken, R. |
Title |
Theoretical evaluation of the effective alpha and De Jongh approaches in X-ray fluorescence analysis of geological materials in borax glass beads |
Type |
A1 Journal article |
Year |
1989 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
18 |
Issue |
6 |
Pages |
259-262 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
An evaluation of the accuracy and suitability of the LachanceTraill algorithm using effective α-coefficients, and the De Jongh α approach for x-ray fluorescence analysis of borax glass beads prepared from geological material was performed. By using theoretical α-coefficients obtained from the same standard and calculated elemental intensities, the two algorithms were compared under identical conditions. When only the monitor standard is used, the LachanceTrail1 approach is found to be inferior to the De Jongh basic α method. If multi-standard calibration is performed for both approaches, the accuracies are almost identical and no significant difference is found in the results. The LachanceTraill algorithm has the advantage of being easier to implement on a minicomputer and, when used without standards, it is found to give results within a few percent of the true values, which is a useful indicator in the choice of appropriate standards for more accurate analytical work. |
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Wos |
A1989CE70800002 |
Publication Date |
2005-05-28 |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Open Access |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116490 |
Serial |
8660 |
Permanent link to this record |
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Author |
Araujo, M.F.; van Espen, P.; Van Grieken, R. |
Title |
Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation |
Type |
A1 Journal article |
Year |
1990 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
19 |
Issue |
1 |
Pages |
29-33 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
Abstract |
A semi-empirical approach is described for determining the mass per unit area of a sample being analysed. The method can be used to estimate the concentration of minor and trace elements in matrices containing a substantial amount of light elements. The procedure utilizes the coherently and incoherently scattered radiation induced in the sample by the filtered continuum radiation of a rhodium x-ray tube. The relationship between the intensity of the scattered radiation per unit mass and the average atomic number of the sample is established via calibration graphs, which can be applied for different x-ray tube voltages and for different primary beam filters. The overall procedure was validated by the analysis of several geological standards, deposited as thin slurries of unknown thickness either on Mylar foil or on Nuclepore filters. |
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Wos |
A1990CU24700005 |
Publication Date |
2005-05-28 |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116491 |
Serial |
7787 |
Permanent link to this record |
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Author |
Muia, L.M.; Van Grieken, R. |
Title |
Use of theoretical accurate binary influence coefficients with Tertian's equation in X-ray fluorescence analysis of silicate rocks in borax glass beads |
Type |
A1 Journal article |
Year |
1990 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
19 |
Issue |
3 |
Pages |
141-144 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
A study of the suitability of the Tertian algorithm using new accurate binary influence coefficients and a comparison standard for x-ray fluorescence analysis of geological materials prepared as borax glass beads was performed. The algorithm was found to give satisfactory results for the analysis of four major components in geological materials. Even in the worst case, when there is a factor of 20 difference in the concentration in the specimen and a comparison standard, the algorithm gives results which differ from the true results by a factor of about 2. This makes the algorithm attractive as a diagnostic tool in analyses of unknown specimens and in the identification of appropriate standards. The binary coefficients are easily calculated so that the algorithm can be implemented on a minicomputer. |
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Wos |
A1990DJ47800009 |
Publication Date |
2005-05-28 |
Series Editor |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:116492 |
Serial |
8725 |
Permanent link to this record |
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Author |
Arana, A.; Loureiro, A.L.; Barbosa, H.M.J.; Van Grieken, R.; Artaxo, P. |
Title |
Optimized energy dispersive X-ray fluorescence analysis of atmospheric aerosols collected at pristine and perturbed Amazon Basin sites |
Type |
A1 Journal article |
Year |
2014 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
|
Volume |
43 |
Issue |
4 |
Pages |
228-237 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Elemental composition of aerosols is important to source apportionment studies and to understand atmospheric processes that influence aerosol composition. Energy dispersive X-ray fluorescence spectroscopy was applied for measuring the elemental composition of Amazonian atmospheric aerosols. The instrument used was a spectrometer Epsilon 5, PANalytical B. V., with tridimensional geometry that reduces the background signal with a polarized X-ray detection. The measurement conditions were optimized for low-Z elements, e. g. Mg, Al, Si, that are present at very low concentrations in the Amazon. From Na to K, our detection limits are about 50% to 75% lower than previously published results for similar instrument. Calibration was performed using Micromatter standards, except for P whose standard was produced by nebulization of an aqueous solution of KH2PO4 at our laboratory. The multi-element reference material National Institute of Standards and Technology-2783 (air particulate filter) was used for evaluating the accuracy of the calibration procedure of the 22 elements in our standard analysis routine, and the uncertainty associated with calibration procedures was evaluated. The overall performance of the instrument and validation of our measurements were assessed by comparison with results obtained from parallel analysis using particle-induced X-ray emission and another Epsilon 5 spectrometer. The elemental composition in 660 samples collected at a pristine site in the Amazon Basin and of 1416 samples collected at a site perturbed by land use change was determined. Our measurements show trace elements associated with biogenic aerosols, soil dust, biomass burning, and sea-salt, even for the very low concentrations as observed in Amazonia. Copyright (C) 2014 John Wiley & Sons, Ltd. |
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Wos |
000337724600006 |
Publication Date |
2014-06-09 |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:118419 |
Serial |
8342 |
Permanent link to this record |
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Author |
Van Grieken, R. |
Title |
2014 Award for best referee of X-Ray Spectrometry |
Type |
Editorial |
Year |
2014 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
43 |
Issue |
6 |
Pages |
311-311 |
Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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000344178700001 |
Publication Date |
2014-09-27 |
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Abbreviated Series Title |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:121210 |
Serial |
7385 |
Permanent link to this record |
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Author |
Van Grieken, R. |
Title |
Introducing four new members of the editorial board of X-ray spectrometry |
Type |
Editorial |
Year |
2015 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
44 |
Issue |
1 |
Pages |
1-2 |
Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
000346727300001 |
Publication Date |
2014-12-22 |
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Abbreviated Series Title |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:123608 |
Serial |
8119 |
Permanent link to this record |
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Author |
Cabal, A.; Schalm, O.; Eyskens, P.; Willems, P.; Harth, A.; van Espen, P. |
Title |
Comparison of x-ray absorption and emission techniques for the investigation of paintings |
Type |
A1 Journal article |
Year |
2015 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
44 |
Issue |
3 |
Pages |
141-148 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Antwerp Cultural Heritage Sciences (ARCHES) |
Abstract |
Four x-ray techniques: computed radiography, emission radiography, energy-resolved radiography and imaging x-ray fluorescence were compared using four mock-up panel paintings. The paintings have different stratigraphy and pigments and are representative for different historical periods. One of the paintings has a hidden underlying painting. The type of pigments used mainly influences the information obtained by both the emission and absorption measurements; high-Z white pigment and high-Z color pigments giving the best contrast. Each of the techniques revealed interesting aspects of the paintings, but none of them could reveal the hidden painting to a satisfactory level. Due to the statistical quality of the spectral data, x-ray fluorescence gives elemental images with high contrast. The radiographic images are better to reveal the internal structure. Imaging x-ray fluorescence and energy-resolved radiography measurements can be done simultaneously, and the combination has the highest potential for the study of complex multilayer paintings. Copyright (c) 2015 John Wiley & Sons, Ltd. |
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Wos |
000353644500010 |
Publication Date |
2015-02-05 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:126016 |
Serial |
7698 |
Permanent link to this record |
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Author |
Romero-Pastor, J.; Garcia-Porras, A.; Van Grieken, R.; Potgieter-Vermaak, S.; Coll-Conesa, J.; Cardell, C. |
Title |
New insights in technology characterization of medieval Valencia glazes |
Type |
A1 Journal article |
Year |
2015 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
44 |
Issue |
6 |
Pages |
426-435 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
This study shows the first Raman microscopy (RM) and scanning electron microscopy with energy dispersive X-ray spectroscopy (SEM-EDX) characterization of two 14th and 15th century lead-glazed and luster ceramics from the Manises and Paterna workshops (Valencia, Spain) produced after the Aragon Christian conquest of the Iberian Peninsula (14th century). According to experts, these coetaneous ceramics were most probably involved in a process of technological transfer from the Islamic area of Southeast Spain to the Christian area of Valencia (East Spain) at the beginning of the 14th century; later on, the celebrated Manises and Paterna workshops were formed. Although these ceramics have been studied widely in terms of production technology (ceramic body, glazes and luster) using an array of diverse analytical techniques, until now, an RM study has not been carried out. This paper presents results regarding the complex chemical composition of the glaze and luster coloring agents, and the quality of color manufacturing processes, elucidating firing conditions via spectral components analysis (i.e., Q(n) for stretching/bending components) and polymerization index (Ip), emphasizing chronology and pigment technology changes between both Valencian workshops. Coloring agents identified in glazes and lusters were cobalt present in blue glazes, copper in greenish glazes, copper and cobalt in the turquoise glaze, and pyrolusite in black glazes. Tin oxyde was used as an opacifier in white glazes. Two luster manufacture recipes were recognized mainly based on copper and silver compounds. Calculated firing temperatures were up to 1000 degrees C for white glazes and up to 600 degrees C for luster and color glazes. Copyright (c) 2015 John Wiley & Sons, Ltd. |
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Wos |
000363279600002 |
Publication Date |
2015-03-12 |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:129445 |
Serial |
8300 |
Permanent link to this record |
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Author |
Cabal, A.; Legrand, S.; Van den Bril, B.; Tote, K.; Janssens, K.; van Espen, P. |
Title |
Study of the uniformity of aerosol filters by scanning MA-XRF |
Type |
A1 Journal article |
Year |
2017 |
Publication |
X-ray spectrometry
T2 – 17th European Conference on X-Ray Spectrometry (EXRS), JUN 19-24, 2016, Univ Gothenburg, Univ Gothenburg, Gothenburg, SWEDEN |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
46 |
Issue |
5 |
Pages |
461-466 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Energy-dispersive X-ray fluorescence (XRF) is an attractive analytical method to determine the level of air pollution by heavy metals. The concentration of the filter in ng/cm(2) is obtained by direct comparison of the net characteristic line intensity of an element with that of a thin film standard. As the sampled area on the filter and the area of the standard are larger than the area analysed by the instrument, the distribution of the elements on the surface of both samples and standards have to be sufficiently uniform. If this is not the case, biased concentration estimates are obtained. Two scanning macro-XRF setups with a beam diameter of similar to 0.5 mm were used to investigate the distribution of elements in (1) commercially available (Micromatter) standards, (2) in-house quartz filter standards obtained with an aerosol generator and (3) particulatematter (PM10) collected on quartz filters by a Leckel SEQ 47/50 sampler. The uniformity of the Micromatter standards was better than 2%. At least some in-house standards showed a concave distribution with less material at the edges. The maximum bias introduced by this is less than 5%. Because of the limited sensitivity of scanning XRF compared with conventional XRF, the distribution of only a few common elements like Ca and Fe could be determined reliably in aerosol filters. The distribution of some heavy elements could only be measured in filters sampled in polluted regions. In general, the loading of particulate matter over the filters was uniform. Copyright (C) 2017 John Wiley & Sons, Ltd. |
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Wos |
000409246400026 |
Publication Date |
2017-03-21 |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
4 |
Open Access |
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Notes |
; ; |
Approved |
Most recent IF: 1.298 |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:145644 |
Serial |
5852 |
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Author |
Ozen, S.A.; Ozkalayci, F.; Cevik, U.; Van Grieken, R. |
Title |
Investigation of heavy metal distributions along 15m soil profiles using EDXRF, XRD, SEM-EDX, and ICP-MS techniques |
Type |
A1 Journal article |
Year |
2018 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
47 |
Issue |
3 |
Pages |
231-241 |
Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
The research of soil contamination by heavy metal is an important field due to its environmental and health implications. The goal was to study the elemental mobility as a function of depth. For this reason, the distribution of heavy metals (V, Cr, Co, Ni, Cu, Zn, As, Sn, and Pb) was investigated along soil profiles up to a depth of 15m at 9 sampling sites in the Nilufer industrial district (Bursa, Turkey). Elemental analyses were done with the Epsilon 5 energy dispersive X-ray fluorescence and inductively coupled plasma mass spectrometry equipment. Particle analysis was performed with a JEOL scanning electron microscope equipped with a Si(Li) X-ray detector. The crystallographic compositions of oxide compounds in soil samples were identified by a Rigaku X-ray diffraction instrument. Different parameters such as the soil's chemical (mineralogical structure, pH, and electrical conductivity) and physical properties (the number of blows, the stiffness index, the liquidity index, the plasticity index, and the water content) were analyzed. To assess the mobility of the heavy metals, diffusion (D) and convection coefficients (?) were calculated with the finite difference method. Convection was determined to dominate the studied region. In addition, the mobility coefficient was determined for each metal. High mobilities were determined for Zn and V, moderate mobilities for Cr, Ni, Cu, and As, and low mobilities were determined for Co and Pb. The results revealed that elements had reached depths of up to 15m, causing irreversible soil contamination that may lead to environmental health issues. |
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Wos |
000430188700005 |
Publication Date |
2018-03-09 |
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ISSN |
0049-8246 |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:150722 |
Serial |
8123 |
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Author |
Romano, F.P.; Janssens, K. |
Title |
Preface to the special issue on: MA-XRF “developments and applications of macro-XRF in conservation, art, and archeology” (Trieste, Italy, 24 and 25 September 2017) |
Type |
Editorial |
Year |
2019 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
Volume |
48 |
Issue |
4 |
Pages |
249-250 |
Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Corporate Author |
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Wos |
000472210700001 |
Publication Date |
2019-05-10 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
Impact Factor |
1.298 |
Times cited |
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Open Access |
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Notes |
; ; |
Approved |
Most recent IF: 1.298 |
Call Number ![sorted by Call Number field, ascending order (up)](img/sort_asc.gif) |
UA @ admin @ c:irua:161295 |
Serial |
5786 |
Permanent link to this record |