| Records |
| Author |
Ramachandran, D.; Egoavil, R.; Crabbe, A.; Hauffman, T.; Abakumov, A.; Verbeeck, J.; Vandendael, I.; Terryn, H.; Schryvers, D. |
| Title |
TEM and AES investigations of the natural surface nano-oxide layer of an AISI 316L stainless steel microfibre |
Type |
A1 Journal article |
| Year |
2016 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
| Volume |
264 |
Issue |
264 |
Pages |
207-214 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
The chemical composition, nanostructure and electronic structure of nanosized oxide scales naturally formed on the surface of AISI 316L stainless steel microfibres used for strengthening of composite materials have been characterised using a combination of scanning and transmission electron microscopy with energy-dispersive X-ray, electron energy loss and Auger spectroscopy. The analysis reveals the presence of three sublayers within the total surface oxide scale of 5.0-6.7 nm thick: an outer oxide layer rich in a mixture of FeO.Fe2 O3 , an intermediate layer rich in Cr2 O3 with a mixture of FeO.Fe2 O3 and an inner oxide layer rich in nickel. |
| Address |
Electron Microscopy for Materials Science, University of Antwerp, Antwerp, Belgium |
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
|
Editor |
|
| Language |
English |
Wos |
000385944300009 |
Publication Date |
2016-06-17 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.692 |
Times cited |
12 |
Open Access |
|
| Notes |
This work was supported by SIM vzw, Technologiepark 935, BE-9052 Zwijnaarde, Belgium, within the InterPoCo project of the H-INT-S horizontal program. The authors are also thankful to Stijn Van den Broeck for help in FIB sample preparation, to Hamed Heidari for useful comments and to the N.V. Bekaert S.A. company for providing the microfibres. RE acknowledges funding by the European Union Council under the 7th Framework Program (FP7) grant nr NMP3-LA-2010-246102 IFOX. |
Approved |
Most recent IF: 1.692 |
Call Number  |
c:irua:134087 |
Serial |
4096 |
| Permanent link to this record |
| |
|
| |
| Author |
Lu, J.; Bartholomeeusen, E.; Sels, B.F.; Schryvers, D. |
| Title |
Internal architecture of coffin-shaped ZSM-5 zeolite crystals with hourglass contrast unravelled by focused ion beam-assisted transmission electron microscopy: INTERNAL ARCHITECTURE OF COFFIN-SHAPED |
Type |
A1 Journal article |
| Year |
2017 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
| Volume |
265 |
Issue |
265 |
Pages |
27-33 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
Optical microscopy, focused ion beam and transmission electron microscopy are combined to study the internal architecture in a coffin-shaped ZSM-5 crystal showing an hourglass contrast in optical microscopy. Based on parallel lamellas from different positions in the crystal, the orientation relationships between the intergrowth components of the crystal are studied and the internal architecture and growth mechanism are illustrated. The crystal is found to contain two pyramid-like components aside from a central component. Both pyramid-like components are rotated by 90 degrees along the common c-axis and with respect to the central component while the interfaces between the components show local zig-zag feature, the latter indicating variations in relative growth velocity of the two components. The pyramid-like intergrowth components are larger and come closer to one another in the middle of the crystal than at the edges, but they do not connect. A model of multisite nucleation and growth of 90 degrees intergrowth components is proposed. |
| Address |
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| Corporate Author |
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Thesis |
|
| Publisher |
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Place of Publication |
|
Editor |
|
| Language |
|
Wos |
000392487400004 |
Publication Date |
2016-08-19 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.692 |
Times cited |
4 |
Open Access |
OpenAccess |
| Notes |
Fonds Wetenschappelijk Onderzoek, G.0603.10N ; |
Approved |
Most recent IF: 1.692 |
| Call Number |
EMAT @ emat @ c:irua:141015 |
Serial |
4437 |
| Permanent link to this record |
| |
|
| |
| Author |
Cautaerts, N.; Delville, R.; Schryvers, D. |
| Title |
ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt angles |
Type |
A1 Journal article |
| Year |
2019 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
| Volume |
273 |
Issue |
3 |
Pages |
189-198 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
|
| Address |
|
| Corporate Author |
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Thesis |
|
| Publisher |
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Place of Publication |
|
Editor |
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| Language |
|
Wos |
000458426100004 |
Publication Date |
2018-12-24 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.692 |
Times cited |
2 |
Open Access |
Not_Open_Access |
| Notes |
ENGIE Ph.D. sponsorship, 2015-AC-007 – BSUEZ6900 ; |
Approved |
Most recent IF: 1.692 |
| Call Number |
EMAT @ emat @UA @ admin @ c:irua:157474 |
Serial |
5163 |
| Permanent link to this record |
| |
|
| |
| Author |
Skorikov, A.; Batenburg, K.J.; Bals, S. |
| Title |
Analysis of 3D elemental distribution in nanomaterials : towards higher throughput and dose efficiency |
Type |
A1 Journal article |
| Year |
2023 |
Publication |
Journal of microscopy |
Abbreviated Journal |
|
| Volume |
289 |
Issue |
3 |
Pages |
157-163 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
Many advanced nanomaterials rely on carefully designed morphology and elemental distribution to achieve their functionalities. Among the few experimental techniques that can directly visualise the 3D elemental distribution on the nanoscale are approaches based on electron tomography in combination with energy-dispersive X-ray spectroscopy (EDXS) and electron energy loss spectroscopy (EELS). Unfortunately, these highly informative methods are severely limited by the fundamentally low signal-to-noise ratio, which makes long experimental times and high electron irradiation doses necessary to obtain reliable 3D reconstructions. Addressing these limitations has been the major research question for the development of these techniques in recent years. This short review outlines the latest progress on the methods to reduce experimental time and electron irradiation dose requirements for 3D elemental distribution analysis and gives an outlook on the development of this field in the near future. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
|
| Language |
|
Wos |
000910532600001 |
Publication Date |
2022-12-26 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2 |
Times cited |
2 |
Open Access |
OpenAccess |
| Notes |
ERC Consolidator Grant, Grant/Award Number: 815128 |
Approved |
Most recent IF: 2; 2023 IF: 1.692 |
| Call Number |
UA @ admin @ c:irua:193428 |
Serial |
7281 |
| Permanent link to this record |
| |
|
| |
| Author |
Mehta, A.N.; Zhang, H.; Dabral, A.; Richard, O.; Favia, P.; Bender, H.; Delabie, A.; Caymax, M.; Houssa, M.; Pourtois, G.; Vandervorst, W. |
| Title |
Structural characterization of SnS crystals formed by chemical vapour deposition |
Type |
A1 Journal article |
| Year |
2017 |
Publication |
Journal of microscopy
T2 – 20th International Conference on Microscopy of Semiconducting Materials, (MSM), APR 09-13, 2017, Univ Oxford, Univ Oxford, Oxford, ENGLAND |
Abbreviated Journal |
J Microsc-Oxford |
| Volume |
268 |
Issue |
3 |
Pages |
276-287 |
| Keywords |
A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
| Abstract |
<script type='text/javascript'>document.write(unpmarked('The crystal and defect structure of SnS crystals grown using chemical vapour deposition for application in electronic devices are investigated. The structural analysis shows the presence of two distinct crystal morphologies, that is thin flakes with lateral sizes up to 50 m and nanometer scale thickness, and much thicker but smaller crystallites. Both show similar Raman response associated with SnS. The structural analysis with transmission electron microscopy shows that the flakes are single crystals of -SnS with [010] normal to the substrate. Parallel with the surface of the flakes, lamellae with varying thickness of a new SnS phase are observed. High-resolution transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), first-principles simulations (DFT) and nanobeam diffraction (NBD) techniques are employed to characterise this phase in detail. DFT results suggest that the phase is a strain stabilised \u0027 one grown epitaxially on the -SnS crystals. TEM analysis shows that the crystallites are also -SnS with generally the [010] direction orthogonal to the substrate. Contrary to the flakes the crystallites consist of two to four grains which are tilted up to 15 degrees relative to the substrate. The various grain boundary structures and twin relations are discussed. Under high-dose electron irradiation, the SnS structure is reduced and -Sn formed. It is shown that this damage only occurs for SnS in direct contact with SiO2. Lay description SnS is a p-type semiconductor, which has attracted significant interest for electronic devices due to its unique properties, low-toxicity and abundance of Sn in nature. Although in the past it has been most extensively studied as the absorber material in solar cells, it has recently garnered interest for application as a p-type two-dimensional semiconductor in nanoelectronic devices due to its anisotropic layered structure similar to the better known phosphorene. Tin sulphide can take the form of several phases and the electronic properties of the material depend strongly on its crystal structure. It is therefore crucial to study the crystal structure of the material in order to predict the electronic properties and gain insight into the growth mechanism. In this work, SnS crystals deposited using a chemical vapour deposition technique are investigated extensively for their crystal and defect structure using transmission electron microscopy (TEM) and related techniques. We find the presence of two distinct crystal morphologies, that is thin flakes with lateral sizes up to 50 m and nm scale thickness, and much thicker but smaller crystallites. The flakes are single crystals of -SnS and contain lamellae with varying thickness of a different phase which appear to be -SnS at first glance. High-resolution scanning transmission electron microscopy is used to characterise these lamellae where the annular bright field (ABF) mode better reveals the position of the sulphur columns. The sulphur columns in the lamellae are found to be shifted relative to the -SnS structure which indicates the formation of a new phase which is a distorted version of the phase which we tentatively refer to as \u0027-SnS. Simulations based on density functional theory (DFT) are used to model the interface and a similar shift of sulphur columns in the -SnS layer is observed which takes place as a result of strong interaction at the interface between the two phases resulting in strain transfer. Nanobeam electron diffraction (NBD) is used to map the lattice mismatch in the thickness of the flakes which reveals good in-plane matching and some expansion out-of-plane in the lamellae. Contrary to the flakes the crystallites are made solely of -SnS and consist of two to four grains which are tilted up to 15 degrees relative to the substrate. The various grain boundary structures and twin relations are discussed. At high electron doses, SnS is reduced to -Sn, however the damage occurs only for SnS in direct contact with SiO2.')); |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
Wiley |
Place of Publication |
Hoboken |
Editor |
|
| Language |
|
Wos |
000415900300009 |
Publication Date |
2017-09-28 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.692 |
Times cited |
2 |
Open Access |
Not_Open_Access |
| Notes |
|
Approved |
Most recent IF: 1.692 |
| Call Number |
UA @ lucian @ c:irua:147692 |
Serial |
4898 |
| Permanent link to this record |
| |
|
| |
| Author |
Oleshko, V.; Gijbels, R.; Jacob, W. |
| Title |
Energy-filtering TEM and electron energy-loss spectroscopy of double structure tabular microcrystals of silver halide emulsions |
Type |
A1 Journal article |
| Year |
1996 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
| Volume |
183 |
Issue |
1 |
Pages |
27-38 |
| Keywords |
A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
| Abstract |
|
| Address |
|
| Corporate Author |
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Thesis |
|
| Publisher |
|
Place of Publication |
Oxford |
Editor |
|
| Language |
|
Wos |
A1996UZ02800005 |
Publication Date |
2003-11-02 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720;1365-2818; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.331 |
Times cited |
8 |
Open Access |
|
| Notes |
|
Approved |
no |
| Call Number |
UA @ lucian @ c:irua:16248 |
Serial |
1039 |
| Permanent link to this record |
| |
|
| |
| Author |
Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. |
| Title |
Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy |
Type |
A1 Journal article |
| Year |
1997 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
| Volume |
188 |
Issue |
|
Pages |
79-87 |
| Keywords |
A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
| Abstract |
|
| Address |
|
| Corporate Author |
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Thesis |
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| Publisher |
|
Place of Publication |
Oxford |
Editor |
|
| Language |
|
Wos |
A1997YF51000009 |
Publication Date |
0000-00-00 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.692 |
Times cited |
6 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.692; 1997 IF: 1.083 |
| Call Number |
UA @ lucian @ c:irua:20461 |
Serial |
1086 |
| Permanent link to this record |
| |
|
| |
| Author |
Potapov, P.L.; Kulkova, S.E.; Schryvers, D. |
| Title |
Study of changes in L32 EELS ionisation edges upon formation of Ni-based intermetallic compounds |
Type |
A1 Journal article |
| Year |
2003 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
| Volume |
210 |
Issue |
|
Pages |
102-109 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Oxford |
Editor |
|
| Language |
|
Wos |
000182189600014 |
Publication Date |
2005-12-01 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720;1365-2818; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.692 |
Times cited |
11 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.692; 2003 IF: 1.779 |
| Call Number |
UA @ lucian @ c:irua:48778 |
Serial |
3328 |
| Permanent link to this record |
| |
|
| |
| Author |
Yang, Z.; Schryvers, D.; Roels, F.; d' Haese, P.C.; de Broe, M.E. |
| Title |
Demonstration of lanthanum in liver cells by energy-dispersive X-ray spectroscopy, electron energy loss spectroscopy and high-resolution transmission electron microscopy |
Type |
A1 Journal article |
| Year |
2006 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
| Volume |
223 |
Issue |
2 |
Pages |
133-139 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Pathophysiology |
| Abstract |
|
| Address |
|
| Corporate Author |
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Thesis |
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| Publisher |
|
Place of Publication |
Oxford |
Editor |
|
| Language |
|
Wos |
000239702700006 |
Publication Date |
2006-08-10 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720;1365-2818; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.692 |
Times cited |
29 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.692; 2006 IF: 1.947 |
| Call Number |
UA @ lucian @ c:irua:59109 |
Serial |
633 |
| Permanent link to this record |
| |
|
| |
| Author |
Cao, S.; Tirry, W.; van den Broek, W.; Schryvers, D. |
| Title |
Optimization of a FIB/SEM slice-and-view study of the 3D distribution of Ni4Ti3 precipitates in NiTi |
Type |
A1 Journal article |
| Year |
2009 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
| Volume |
233 |
Issue |
1 |
Pages |
61-68 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
The 3D morphology and distribution of lenticular Ni4Ti3 precipitates in the austenitic B2 matrix of a binary Ni51Ti49 alloy has been investigated by a slice-and-view procedure in a dual-beam focused ion beam/scanning electron microscope system. Due to the weak contrast of the precipitates, proper imaging conditions need to be selected first to allow for semi-automated image treatment. Knowledgeable imaging is further needed to ensure that all variants of the precipitates are observed with equal probability, regardless of sample orientation. Finally, a volume ratio of 10.2% for the Ni4Ti3 precipitates could be calculated, summed over all variants, which yields a net composition of Ni50.27Ti49.73 for the matrix, leading to an increase of 125 degrees for the martensitic start temperature. Also, the expected relative orientation of the different variants of the precipitates could be confirmed. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
|
Place of Publication |
Oxford |
Editor |
|
| Language |
|
Wos |
000262511900008 |
Publication Date |
2009-01-15 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720;1365-2818; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.692 |
Times cited |
22 |
Open Access |
|
| Notes |
Multimat Fwo; G0465.05 |
Approved |
Most recent IF: 1.692; 2009 IF: 1.612 |
| Call Number |
UA @ lucian @ c:irua:76026 |
Serial |
2486 |
| Permanent link to this record |
| |
|
| |
| Author |
Montoya, E.; Bals, S.; Van Tendeloo, G. |
| Title |
Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam |
Type |
A1 Journal article |
| Year |
2008 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
| Volume |
231 |
Issue |
3 |
Pages |
359-363 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
|
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Oxford |
Editor |
|
| Language |
|
Wos |
000259611000001 |
Publication Date |
2008-08-28 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720;1365-2818; |
ISBN |
|
Additional Links |
UA library record; WoS full record |
| Impact Factor |
1.692 |
Times cited |
|
Open Access |
|
| Notes |
The authors are grateful to M. Huijben and G. Rijnders of the MESA+ group at the University of Twente (NI) for the growth of the multilayers. This work has been performed under the Interuniversity Attraction Poles programme – Belgian State Belgian Science Policy. The authors acknowledge financial support from the European Union under the framework 6 program under a contract for an Integrated Infrastructure initiative. Part of this work was performed with financial support from the European Union under the framework 6 programme, under a contract for an Integrated Infrastructure Initiative (Reference No. 02601.9 ESTEEM). |
Approved |
Most recent IF: 1.692; 2008 IF: 1.409 |
| Call Number |
UA @ lucian @ c:irua:76522 |
Serial |
2849 |
| Permanent link to this record |
| |
|
| |
| Author |
Verleysen, E.; Bender, H.; Richard, O.; Schryvers, D.; Vandervorst, W. |
| Title |
Characterization of nickel silicides using EELS-based methods |
Type |
A1 Journal article |
| Year |
2010 |
Publication |
Journal of microscopy |
Abbreviated Journal |
J Microsc-Oxford |
| Volume |
240 |
Issue |
1 |
Pages |
75-82 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
The characterization of Ni-silicides using electron energy loss spectroscopy (EELS) based methods is discussed. A series of Ni-silicide phases is examined: Ni3Si, Ni31Si12, Ni2Si, NiSi and NiSi2. The composition of these phases is determined by quantitative core-loss EELS. A study of the low loss part of the EELS spectrum shows that both the energy and the shape of the plasmon peak are characteristic for each phase. Examination of the Ni-L edge energy loss near edge structure (ELNES) shows that the ratio and the sum of the L2 and L3 white line intensities are also characteristic for each phase. The sum of the white line intensities is used to determine the trend in electron occupation of the 3d states of the phases. The dependence of the plasmon energy on the electron occupation of the 3d states is demonstrated. |
| Address |
|
| Corporate Author |
|
Thesis |
|
| Publisher |
|
Place of Publication |
Oxford |
Editor |
|
| Language |
|
Wos |
000281715400009 |
Publication Date |
2010-05-20 |
| Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
| Series Volume |
|
Series Issue |
|
Edition |
|
| ISSN |
0022-2720; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.692 |
Times cited |
11 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.692; 2010 IF: 1.872 |
| Call Number |
UA @ lucian @ c:irua:84879 |
Serial |
329 |
| Permanent link to this record |
