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Author  |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Potgieter-Vermaak, S.; Van Grieken, R.; Potgieter, H. |
Die risikoprofiel van Pb en Cr in stedelike padstof |
2012 |
Litnet akademies : 'n joernaal vir die geesteswetenskappe |
9 |
|
UA library record |
|
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Potgieter-Vermaak, S.; Van Grieken, R.; Potgieter, J.H. |
Integrated analytical techniques for analysing individual environmental particles |
2012 |
|
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|
UA library record |
|
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Potgieter-Vermaak, S.; Van Grieken, R.; Potgieter, J.H. |
Integrated analytical techniques for the characterisation of environmental particles |
2010 |
Spectroscopy Europe |
22 |
|
UA library record |
|
|
|
Potgieter-Vermaak, S.; Worobiec, A.; Darchuk, L.; Van Grieken, R. |
Micro-Raman spectroscopy for the analysis of environmental particles |
2011 |
|
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UA library record |
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Potgieter-Vermaak, S.S.; Godoi, R.H.M.; Van Grieken, R.; Potgieter, J.H.; Oujja, M.; Castillejo, M. |
Micro-structural characterization of black crust and laser cleaning of building stones by micro-Raman and SEM techniques |
2005 |
Spectrochimica acta: part A: molecular and biomolecular spectroscopy |
61 |
|
UA library record; WoS full record; WoS citing articles |
|
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Potgieter-Vermaak, S.S.; Mmari, A.; Van Grieken, R.; McCrindle, R.I.; Potgieter, J.H. |
Degradation of galvanised iron roofing material in Tanzania by atmospheric corrosion |
2011 |
Corrosion engineering science and technology |
46 |
|
UA library record; WoS full record; WoS citing articles |
|
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Potgieter-Vermaak, S.S.; Potgieter, J.H.; Belleil, M.; DeWeerdt, F.; Van Grieken, R. |
The application of Raman spectrometry to the investigation of cement: part 2: a micro-Raman study of OPC, slag and fly ash |
2006 |
Cement and concrete research |
36 |
|
UA library record; WoS full record; WoS citing articles |
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Potgieter-Vermaak, S.S.; Potgieter, J.H.; Kruger, R.A.; Spolnik, Z.; Van Grieken, R. |
A characterisation of the surface properties of an ultra fine fly ash (UFFA) used in the polymer industry |
2005 |
Fuel |
84 |
|
UA library record; WoS full record; WoS citing articles |
|
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Potgieter-Vermaak, S.S.; Potgieter, J.H.; Monama, P.; Van Grieken, R. |
Comparison of limestone, dolomite and fly ash as pre-treatment agents for acid mine drainage |
2006 |
Minerals engineering |
19 |
|
UA library record; WoS full record; WoS citing articles |
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Potgieter-Vermaak, S.S.; Potgieter, J.H.; Van Grieken, R. |
The application of Raman spectrometry to investigate and characterize cement: part I: a review |
2006 |
Cement and concrete research |
36 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Potgieter-Vermaak, S.S.; Potgieter, J.H.; Worobiec, A.; Van Grieken, R.; Marjanovic, L.; Moeketsi, S. |
Fingerprinting of South African ordinary Portland cements, cement blends and mortars for identification purposes: discrimination with starplots and PCA |
2007 |
Cement and concrete research |
37 |
|
UA library record; WoS full record; WoS citing articles |
|
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Potgieter-Vermaak, S.S.; Van Grieken, R. |
Preliminary evaluation of micro-Raman spectrometry for the characterization of individual aerosol particles |
2006 |
Applied spectroscopy |
60 |
|
UA library record; WoS full record; WoS citing articles |
|
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Potters, G.; Schoeters, G.; Tytgat, T.; Horvath, G.; Ludecke, C.; Cool, P.; Lenaerts, S.; Appels, L.; Dewil, R. |
Pyrolysis kinetics of bamboo material |
2010 |
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UA library record |
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Poulain, R.; Lumbeeck, G.; Hunka, J.; Proost, J.; Savolainen, H.; Idrissi, H.; Schryvers, D.; Gauquelin, N.; Klein, A. |
Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism |
2022 |
ACS applied electronic materials |
4 |
|
UA library record; WoS full record; WoS citing articles |
|
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Pour, M.D.; Motiee, N.; Barati, A.A.; Taheri, F.; Azadi, H.; Gebrehiwot, K.; Lebailly, P.; Van Passel, S.; Witlox, F. |
Impacts of the Hara biosphere reserve on livelihood and welfare in Persian Gulf |
2017 |
Ecological Economics |
141 |
7 |
UA library record; WoS full record; WoS citing articles; WoS full record; WoS citing articles |
|
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Pourbabak, S. |
Influence of nano and microstructural features and defects in finegrained NiTi on the thermal and mechanical reversibility of the martensitic transformation |
2020 |
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UA library record |
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Pourbabak, S.; Montero-Sistiaga, M.L.; Schryvers, D.; Van Humbeeck, J.; Vanmeensel, K. |
Microscopic investigation of as built and hot isostatic pressed Hastelloy X processed by Selective Laser Melting |
2019 |
Materials characterization |
153 |
2 |
UA library record; WoS full record; WoS citing articles |
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Pourbabak, S.; Orekhov, A.; Samaee, V.; Verlinden, B.; Van Humbeeck, J.; Schryvers, D. |
In-Situ TEM Stress Induced Martensitic Transformation in Ni50.8Ti49.2 Microwires |
2019 |
Shape memory and superelasticity |
5 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Pourbabak, S.; Orekhov, A.; Schryvers, D. |
Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires |
2020 |
Microscopy Research And Technique |
|
|
UA library record; WoS full record; WoS citing articles |
|
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Pourbabak, S.; Verlinden, B.; Van Humbeeck, J.; Schryvers, D. |
DSC cycling effects on phase transformation temperatures of micron and submicron grain Ni50.8Ti49.2 microwires |
2020 |
Shape memory and superelasticity |
|
1 |
UA library record; WoS full record; WoS citing articles |
|
|
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Pourbabak, S.; Wang, X.; Van Dyck, D.; Verlinden, B.; Schryvers, D. |
Ni cluster formation in low temperature annealed Ni50.6Ti49.4 |
2017 |
Functional materials letters |
10 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
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Pourghaderi, M.A.; Magnus, W.; Sorée, B.; de Meyer, K.; Meuris, M.; Heyns, M. |
General 2D Schrödinger-Poisson solver with open boundary conditions for nano-scale CMOS transistors |
2008 |
Journal of computational electronics |
7 |
3 |
UA library record; WoS full record; WoS citing articles |
|
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Pourghaderi, M.A.; Magnus, W.; Sorée, B.; Meuris, M.; de Meyer, K.; Heyns, M. |
Ballistic current in metal-oxide-semiconductor field-effect transistors: the role of device topology |
2009 |
Journal of applied physics |
106 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
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Pourghaderi, M.A.; Magnus, W.; Sorée, B.; Meuris, M.; de Meyer, K.; Heyns, M. |
Tunneling-lifetime model for metal-oxide-semiconductor structures |
2009 |
Physical review : B : solid state |
80 |
2 |
UA library record; WoS full record; WoS citing articles |
|
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Pourtois, G.; Dabral, A.; Sankaran, K.; Magnus, W.; Yu, H.; de de Meux, A.J.; Lu, A.K.A.; Clima, S.; Stokbro, K.; Schaekers, M.; Houssa, M.; Collaert, N.; Horiguchi, N. |
Probing the intrinsic limitations of the contact resistance of metal/semiconductor interfaces through atomistic simulations |
2017 |
Semiconductors, Dielectrics, And Metals For Nanoelectronics 15: In Memory Of Samares Kar |
|
1 |
UA library record; WoS full record; WoS citing articles |
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Pourtois, G.; Lauwers, A.; Kittl, J.; Pantisano, L.; Sorée, B.; De Gendt, S.; Magnus, W.; Heyns, A.; Maex, K. |
First-principle calculations on gate/dielectric interfaces : on the origin of work function shifts |
2005 |
Microelectronic engineering |
80 |
31 |
UA library record; WoS full record; WoS citing articles |
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Pouyet, E.; Cotte, M.; Fayard, B.; Salome, M.; Meirer, F.; Mehta, A.; Uffelman, E.S.; Hull, A.; Vanmeert, F.; Kieffer, J.; Burghammer, M.; Janssens, K.; Sette, F.; Mass, J. |
2D X-ray and FTIR micro-analysis of the degradation of cadmium yellow pigment in paintings of Henri Matisse |
2015 |
Applied physics A : materials science & processing |
121 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Prabhakara, V. |
Strain measurement for semiconductor applications with Raman spectroscopy and Transmission electron microscopy |
2021 |
|
|
|
UA library record |
|
|
|
Prabhakara, V.; Jannis, D.; Béché, A.; Bender, H.; Verbeeck, J. |
Strain measurement in semiconductor FinFET devices using a novel moiré demodulation technique |
2019 |
Semiconductor science and technology |
|
8 |
UA library record; WoS full record; WoS citing articles |
|
|
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Prabhakara, V.; Jannis, D.; Guzzinati, G.; Béché, A.; Bender, H.; Verbeeck, J. |
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale |
2020 |
Ultramicroscopy |
219 |
4 |
UA library record; WoS full record; WoS citing articles |
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