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Author (up) Title Year Publication Volume Times cited Additional Links
Vanrompay, H.; Béché, A.; Verbeeck, J.; Bals, S. Experimental Evaluation of Undersampling Schemes for Electron Tomography of Nanoparticles 2019 Particle and particle systems characterization 36 12 UA library record; WoS full record; WoS citing articles
Vanrompay, H.; Skorikov, A.; Bladt, E.; Béché, A.; Freitag, B.; Verbeeck, J.; Bals, S. Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges 2021 Ultramicroscopy 221 15 UA library record; WoS full record; WoS citing articles
Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. Bandgap measurement of high refractive index materials by off-axis EELS 2017 Ultramicroscopy 182 3 UA library record; WoS full record; WoS citing articles
Vávra, O.; Gaži, S.; Golubović, D.S.; Vávra, I.; Dérer, J.; Verbeeck, J.; Van Tendeloo, G.; Moshchalkov, V.V. 0 and π phase Josephson coupling through an insulating barrier with magnetic impurities 2006 Physical review : B : condensed matter and materials physics 74 27 UA library record; WoS full record; WoS citing articles
Vega Ibañez, F.; Béché, A.; Verbeeck, J. Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? 2022 Microscopy and microanalysis 3 UA library record; WoS full record; WoS citing articles
Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings 2022 Ultramicroscopy 232 18 UA library record; WoS full record; WoS citing articles
Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. Evaluation of different rectangular scan strategies for STEM imaging 2020 Ultramicroscopy 13 UA library record; WoS full record; WoS citing articles
Verbeeck, J. Interpretation of “Energy-filtered electron-diffracted beam holography” by R.A. Herring 2006 Ultramicroscopy 106 8 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Bals, S.; Lamoen, D.; Luysberg, M.; Huijben, M.; Rijnders, G.; Brinkman, A.; Hilgenkamp, H.; Blank, D.H.A.; Van Tendeloo, G. Electronic reconstruction at n-type SrTiO3/LaAlO3 interfaces 2010 Physical review : B : condensed matter and materials physics 81 25 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Béché, A.; Müller-Caspary, K.; Guzzinati, G.; Luong, M.A.; Den Hertog, M. Demonstration of a 2 × 2 programmable phase plate for electrons 2018 Ultramicroscopy 190 73 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Béché, A.; van den Broek, W. A holographic method to measure the source size broadening in STEM 2012 Ultramicroscopy 120 29 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Bertoni, G. Deconvolution of core electron energy loss spectra 2009 Ultramicroscopy 109 13 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Bertoni, G. Model-based quantification of EELS: is standardless quantification possible? 2008 Microchimica acta 161 5 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Bertoni, G. Model-based quantification of EELS spectra: treating the effect of correlated noise 2008 Ultramicroscopy 108 16 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Bertoni, G.; Lichte, H. A holographic biprism as a perfect energy filter? 2011 Ultramicroscopy 111 13 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Bertoni, G.; Schattschneider, P. The Fresnel effect of a defocused biprism on the fringes in inelastic holography 2008 Ultramicroscopy T2 – 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN 108 15 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Guzzinati, G.; Clark, L.; Juchtmans, R.; Van Boxem, R.; Tian, H.; Béché, A.; Lubk, A.; Van Tendeloo, G. Shaping electron beams for the generation of innovative measurements in the (S)TEM 2014 Comptes rendus : physique 15 22 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Hébert; Rubino, S.; Novák, P.; Rusz, J.; Houdellier, F.; Gatel, C.; Schattschneider, P. Optimal aperture sizes and positions for EMCD experiments 2008 Ultramicroscopy 108 27 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Lebedev, O.I.; Van Tendeloo, G.; Cagnon, L.; Bougerol, C.; Tourillon, T. Fe and Co nanowires and nanotubes synthesized by template electrodeposition: a HRTEM and EELS study 2003 Journal of the electrochemical society 150 41 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Lebedev, O.I.; Van Tendeloo, G.; Mercey, B. SrTiO3(100)/(LaMnO3)m(SrMnO3)n layered heterostructures: a combined EELS and TEM study 2002 Physical review : B : condensed matter and materials physics 66 32 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Lebedev, O.I.; Van Tendeloo, G.; Silcox, J.; Mercey, B.; Hervieu, M.; Haghiri-Gosnet, A.M. Electron energy-loss spectroscopy study of a (LaMnO3)8(SrMnO3)4 heterostructure 2001 Applied physics letters 79 19 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Sc hattschneider, P.; Rosenauer, A. Image simulation of high resolution energy filtered TEM images 2009 Ultramicroscopy 109 36 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Schattschneider, P.; Lazar, S.; Stöger-Pollach, M.; Löffler, S.; Steiger-Thirsfeld, A.; Van Tendeloo, G. Atomic scale electron vortices for nanoresearch 2011 Applied physics letters 99 90 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Tian, H.; Béché, A. A new way of producing electron vortex probes for STEM 2012 Ultramicroscopy 113 62 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Tian, H.; Schattschneider, P. Production and application of electron vortex beams 2010 Nature 467 626 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Tian, H.; Van Tendeloo, G. How to manipulate nanoparticles with an electron beam? 2013 Advanced materials 25 75 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Van Aert, S. Model based quantification of EELS spectra 2004 Ultramicroscopy 101 147 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Van Aert, S.; Bertoni, G. Model-based quantification of EELS spectra: including the fine structure 2006 Ultramicroscopy 106 38 UA library record; WoS full record; WoS citing articles
Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. Computational aspects in quantitative EELS 2010 Microscopy and microanalysis 16 UA library record
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. Plasmon holographic experiments: theoretical framework 2005 Ultramicroscopy 102 43 UA library record; WoS full record; WoS citing articles