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“Electron energy-loss spectroscopy and first-principles calculation studies on a Ni-Ti shape memory alloy”. Yang Z, Tirry W, Lamoen D, Kulkova S, Schryvers D, Acta materialia 56, 395 (2008). http://doi.org/10.1016/j.actamat.2007.10.001
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 5.301
Times cited: 20
DOI: 10.1016/j.actamat.2007.10.001
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“Electronic band structures and native point defects of ultrafine ZnO nanocrystals”. Zeng Y-J, Schouteden K, Amini MN, Ruan S-C, Lu Y-F, Ye Z-Z, Partoens B, Lamoen D, Van Haesendonck C, ACS applied materials and interfaces 7, 10617 (2015). http://doi.org/10.1021/acsami.5b02545
Abstract: Ultrafine ZnO nanocrystals with a thickness down to 0.25 nm are grown by a metalorganic chemical vapor deposition method. Electronic band structures and native point defects of ZnO nanocrystals are studied by a combination of scanning tunneling microscopy/spectroscopy and first-principles density functional theory calculations. Below a critical thickness of nm ZnO adopts a graphitic-like structure and exhibits a wide band gap similar to its wurtzite counterpart. The hexagonal wurtzite structure, with a well-developed band gap evident from scanning tunneling spectroscopy, is established for a thickness starting from similar to 1.4 nm. With further increase of the thickness to 2 nm, V-O-V-Zn defect pairs are easily produced in ZnO nanocrystals due to the self-compensation effect in highly doped semiconductors.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT)
Impact Factor: 7.504
Times cited: 15
DOI: 10.1021/acsami.5b02545
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“Loss rate of a plasticizer in a nylon matrix calculated using macroscopic reaction-diffusion kinetics”. Zhang M-L, March NH, Peeters A, van Alsenoy C, Howard I, Lamoen D, Leys F, Journal Of Applied Physics 93, 1525 (2003). http://doi.org/10.1063/1.1535230
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 2.068
DOI: 10.1063/1.1535230
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