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  Author Title Year Publication Volume Times cited Additional Links Links
Laffez, P.; Retoux, R.; Boullay, P.; Zaghrioui, M.; Lacorre, P.; Van Tendeloo, G. Transmission electron microscopy of NdNiO3 thin films on silicon substrates 2000 European physical journal: applied physics 12 16 UA library record; WoS full record; WoS citing articles doi
Charlier, E.; van Doorselaer, M.; Gijbels, R.; de Keyzer, R.; Geuens, I. Unveiling the composition of sulphur sensitization specks by their interactions with TAI 2000 Journal Of Imaging Science And Technology 44 16 UA library record; WoS full record; WoS citing articles
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