| |
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
|
|
Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G. |
Measuring porosity at the nanoscale by quantitative electron tomography |
2010 |
Nano letters |
10 |
79 |
UA library record; WoS full record; WoS citing articles |
|
|
Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. |
Ultra-high resolution electron tomography for materials science : a roadmap |
2011 |
Microscopy and microanalysis |
17 |
|
UA library record |
|
|
Kadu, A.; van Leeuwen, T.; Batenburg, K.J. |
CoShaRP : a convex program for single-shot tomographic shape sensing |
2021 |
Inverse Problems |
37 |
|
UA library record; WoS full record |
