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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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|
Schattschneider, P.; Verbeeck, J.; Hamon, A.L. |
Real space maps of atomic transitions |
2009 |
Ultramicroscopy |
109 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Müller, K.; Schowalter, M.; Jansen, J.; Tsuda, K.; Titantah, J.; Lamoen, D.; Rosenauer, A. |
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data |
2009 |
Ultramicroscopy |
109 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Ke, X.; Bals, S.; Romo Negreira, A.; Hantschel, T.; Bender, H.; Van Tendeloo, G. |
TEM sample preparation by FIB for carbon nanotube interconnects |
2009 |
Ultramicroscopy |
109 |
21 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Broek, W.; Verbeeck, J.; Schryvers, D.; de Backer, S.; Scheunders, P. |
Tomographic spectroscopic imaging; an experimental proof of concept |
2009 |
Ultramicroscopy |
109 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bertoni, G.; Verbeeck, J. |
Accuracy and precision in model based EELS quantification |
2008 |
Ultramicroscopy |
108 |
44 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Rosenauer, A.; Schowalter, M.; Titantah, J.T.; Lamoen, D. |
An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission electron microscopy |
2008 |
Ultramicroscopy |
108 |
25 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Croitoru, M.D.; van Dyck, D.; Liu, Y.Z.; Zhang, Z. |
Measurement of specimen thickness by phase change determination in TEM |
2008 |
Ultramicroscopy |
108 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Bertoni, G. |
Model-based quantification of EELS spectra: treating the effect of correlated noise |
2008 |
Ultramicroscopy |
108 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Hébert; Rubino, S.; Novák, P.; Rusz, J.; Houdellier, F.; Gatel, C.; Schattschneider, P. |
Optimal aperture sizes and positions for EMCD experiments |
2008 |
Ultramicroscopy |
108 |
27 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Bertoni, G.; Schattschneider, P. |
The Fresnel effect of a defocused biprism on the fringes in inelastic holography |
2008 |
Ultramicroscopy
T2 – 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN |
108 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. |
Electron channelling based crystallography |
2007 |
Ultramicroscopy |
107 |
32 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. |
Inelastic electron holography as a variant of the Feynman thought experiment |
2007 |
Ultramicroscopy |
107 |
13 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van den Broek, W.; Verbeeck, J.; de Backer, S.; Scheunders, P.; Schryvers, D. |
Acquisition of the EELS data cube by tomographic reconstruction |
2006 |
Ultramicroscopy |
106 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Kruse, P.; Schowalter, M.; Lamoen, D.; Rosenauer, A.; Gerthsen, D. |
Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography |
2006 |
Ultramicroscopy |
106 |
50 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. |
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images |
2006 |
Ultramicroscopy |
106 |
18 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Radtke, G.; Botton, G.A.; Verbeeck, J. |
Electron inelastic, scattering and anisotropy: the two-dimensional point of view |
2006 |
Ultramicroscopy |
106 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Potapov, P.; Lichte, H.; Verbeeck, J.; van Dyck, D. |
Experiments on inelastic electron holography |
2006 |
Ultramicroscopy |
106 |
28 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J. |
Interpretation of “Energy-filtered electron-diffracted beam holography” by R.A. Herring |
2006 |
Ultramicroscopy |
106 |
8 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Van Aert, S.; Bertoni, G. |
Model-based quantification of EELS spectra: including the fine structure |
2006 |
Ultramicroscopy |
106 |
38 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bertoni, G.; Beyers, E.; Verbeeck, J.; Mertens, M.; Cool, P.; Vansant, E.F.; Van Tendeloo, G. |
Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy |
2006 |
Ultramicroscopy |
106 |
83 |
UA library record; WoS full record; WoS citing articles |
|
|
|
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
2005 |
Ultramicroscopy |
104 |
70 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
2005 |
Ultramicroscopy |
104 |
37 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bals, S.; Kilaas, R.; Kisielowski, C. |
Nonlinear imaging using annular dark field TEM |
2005 |
Ultramicroscopy |
104 |
15 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. |
Plasmon holographic experiments: theoretical framework |
2005 |
Ultramicroscopy |
102 |
43 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Potapov, P.L.; Schryvers, D. |
Measuring the absolute position of EELS ionisation edges in a TEM |
2004 |
Ultramicroscopy |
99 |
29 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Verbeeck, J.; Van Aert, S. |
Model based quantification of EELS spectra |
2004 |
Ultramicroscopy |
101 |
147 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. |
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? |
2003 |
Ultramicroscopy |
98 |
26 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
Optimal experimental design of STEM measurement of atom column positions |
2002 |
Ultramicroscopy |
90 |
35 |
UA library record; WoS full record; WoS citing articles |
|
|
|
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. |
Does a monochromator improve the precision in quantitative HRTEM? |
2001 |
Ultramicroscopy |
89 |
22 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. |
Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging |
1997 |
Ultramicroscopy |
69 |
11 |
UA library record; WoS full record; WoS citing articles |
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