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Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy”. Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Microscopy and microanalysis 13, 332 (2007). http://doi.org/10.1017/S1431927607081664
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Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Bals S, Erni R, van Dyck D, Van Tendeloo G, Microscopy and microanalysis 15, 464 (2009). http://doi.org/10.1017/S1431927609093957
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EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure”. Bach D, Schneider R, Gerthsen D, Verbeeck J, Sigle W, Microscopy and microanalysis 15, 505 (2009). http://doi.org/10.1017/S143192760999105X
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Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire”. Tian H, Schryvers D, Shabalovskaya S, van Humbeeck J, Microscopy and microanalysis 15, 62 (2009). http://doi.org/10.1017/S1431927609090059
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Computational aspects in quantitative EELS”. Verbeeck J, Van Aert S, Zhang L, Haiyan T, Schattschneider P, Rosenauer A, Microscopy and microanalysis 16, 240 (2010). http://doi.org/10.1017/S143192761005511X
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Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts”. Ke X, Bals S, Cott D, Hantschel T, Bender H, Van Tendeloo G, Microscopy and microanalysis 16, 210 (2010). http://doi.org/10.1017/S1431927609991371
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Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study”. Idrissi H, Turner S, Mitsuhara M, Wang B, Hata S, Coulombier M, Raskin J-P, Pardoen T, Van Tendeloo G, Schryvers D, Microscopy and microanalysis 17, 983 (2011). http://doi.org/10.1017/S143192761101213X
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Ultra-high resolution electron tomography for materials science : a roadmap”. Batenburg KJ, Bals S, Van Aert S, Roelandts T, Sijbers J, Microscopy and microanalysis 17, 934 (2011). http://doi.org/10.1017/S143192761100554X
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Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency”. van den Broek W, Van Aert S, van Dyck D, Microscopy and microanalysis 18, 336 (2012). http://doi.org/10.1017/S1431927611012633
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Annular dark-field transmission electron microscopy for low contrast materials”. Leroux F, Bladt E, Timmermans J-P, Van Tendeloo G, Bals S, Microscopy and microanalysis 19, 629 (2013). http://doi.org/10.1017/S1431927613000020
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Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy”. Lu J, Roeffaers MBJ, Bartholomeeusen E, Sels BF, Schryvers D, Microscopy and microanalysis 20, 42 (2014). http://doi.org/10.1017/S1431927613013731
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Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM”. Grieten E, Caen J, Schryvers D, Microscopy and microanalysis 20, 1585 (2014). http://doi.org/10.1017/S1431927614012860
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Towards quantitative EDX results in 3 dimensions”. Goris B, Freitag B, Zanaga D, Bladt E, Altantzis T, Ringnalda J, Bals S, Microscopy and microanalysis 20, 766 (2014). http://doi.org/10.1017/S1431927614005558
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Wet-STEM tomography : principles, potentialities and limitations”. Masenelli-Varlot K, Malchere A, Ferreira J, Heidari Mezerji H, Bals S, Messaoudi C, Garrido SM, Microscopy and microanalysis 20, 366 (2014). http://doi.org/10.1017/S1431927614000105
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Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM”. Jones L, Martinez GT, Béché, A, Van Aert S, Nellist PD, Microscopy and microanalysis 20, 126 (2014). http://doi.org/10.1017/S1431927614002359
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The incorporation of nanoparticles into conventional glass-ionomer dental restorative cements”. Gjorgievska E, Van Tendeloo G, Nicholson JW, Coleman NJ, Slipper IJ, Booth S, Microscopy and microanalysis 21, 392 (2015). http://doi.org/10.1017/S1431927615000057
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Crack initiation in tapered high Si stainless steel specimens : stress threshold analyses”. Penders A, Konstantinovic MJ, Bosch RW, Schryvers D, Corrosion Engineering Science And Technology , 1 (2020). http://doi.org/10.1080/1478422X.2020.1785651
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Polytypism in mcalpineite : a study of natural and synthetic Cu₃TeO₆”. Missen OP, Mills SJ, Canossa S, Hadermann J, Nenert G, Weil M, Libowitzky E, Housley RM, Artner W, Kampf AR, Rumsey MS, Spratt J, Momma K, Dunstan MA, Acta Crystallographica. Section B: Structural Science, Crystal Engineering and Materials (Online) 78 (2022). http://doi.org/10.1107/S2052520621013032
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Atomic defects, functional groups and properties in MXenes”. Cui W, Hu Z-Y, Unocic RR, Van Tendeloo G, Sang X, Chinese Chemical Letters 32, 339 (2021). http://doi.org/10.1016/J.CCLET.2020.04.024
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Effect of clay modification on structureproperty relationships and thermal degradation kinetics of \beta-polypropylene/clay composite materials”. Papageorgiou DG, Filippousi M, Pavlidou E, Chrissafis K, Van Tendeloo G, Bikiaris D, Journal of thermal analysis and calorimetry 122, 393 (2015). http://doi.org/10.1007/s10973-015-4705-y
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Advanced electron tomography of nanoparticle assemblies”. Altantzis T, Zanaga D, Bals S, Europhysics letters 119, 38001 (2017). http://doi.org/10.1209/0295-5075/119/38001
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Orthorhombic vs. hexagonal epitaxial SrIrO3 thin films : structural stability and related electrical transport properties”. Bhat SG, Gauquelin N, Sebastian NK, Sil A, Béché, A, Verbeeck J, Samal D, Kumar PSA, Europhysics letters 122, 28003 (2018). http://doi.org/10.1209/0295-5075/122/28003
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Quantum-size effects on T-c in superconducting nanofilms”. Shanenko AA, Croitoru MD, Peeters FM, Europhysics letters 76, 498 (2006). http://doi.org/10.1209/epl/i2006-10274-6
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Direct observation of nanometer-scale pinning sites in (Nd0.33Eu0.20Gd0.47)Ba2Cu3O7-\delta single crystals”. Das P, Koblischka MR, Turner S, Van Tendeloo G, Wolf T, Jirsa M, Hartmann U, Europhysics letters 83, 37005 (2008). http://doi.org/10.1209/0295-5075/83/37005
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Spin effects in electron vortex states”. Van Boxem R, Verbeeck J, Partoens B, Europhysics letters 102, 40010 (2013). http://doi.org/10.1209/0295-5075/102/40010
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Direct structural and spectroscopic investigation of ultrathin films of tetragonal CuO: Six-fold coordinated copper”. Samal D, Tan H, Takamura Y, Siemons W, Verbeeck J, Van Tendeloo G, Arenholz E, Jenkins CA, Rijnders G, Koster G, Europhysics letters 105, 17003 (2014). http://doi.org/10.1209/0295-5075/105/17003
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The superconducting bismuth-based mixed oxides”. Antipov EV, Khasanova NR, Pshirkov JS, Putilin SN, Bougerol C, Lebedev OI, Van Tendeloo G, Baranov AN, Park YW, Current applied physics T2 –, QTSM and QFS 02 Symposium, MAY 08-10, 2002, SEOUL, SOUTH KOREA 2, 425 (2002). http://doi.org/10.1016/S1567-1739(02)00105-0
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Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach”. Samaeeaghmiyoni V, Idrissi H, Groten J, Schwaiger R, Schryvers D, Micron 94, 66 (2017). http://doi.org/10.1016/j.micron.2016.12.005
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Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope”. Cooper D, Denneulin T, Bernier N, Béché, A, Rouvière J-L, Micron 80, 145 (2016). http://doi.org/10.1016/J.MICRON.2015.09.001
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Nanoscale investigation by TEM and STEM-EELS of the laser induced yellowing”. Godet M, Vergès-Belmin V, Gauquelin N, Saheb M, Monnier J, Leroy E, Bourgon J, Verbeeck J, Andraud C, Micron 115, 25 (2018). http://doi.org/10.1016/j.micron.2018.08.006
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