| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Sankaran, K.J.; Hoang, D.Q.; Srinivasu, K.; Korneychuk, S.; Turner, S.; Drijkoningen, S.; Pobedinskas, P.; Verbeeck, J.; Leou, K.C.; Lin, I.N.; Haenen, K. |
|
2016 |
Physica status solidi : A : applications and materials science |
213 |
5 |
UA library record; WoS full record; WoS citing articles |
| Korneychuk, S.; Guzzinati, G.; Verbeeck, J. |
Measurement of the Indirect Band Gap of Diamond with EELS in STEM |
2018 |
Physica status solidi : A : applications and materials science |
215 |
6 |
UA library record; WoS full record; WoS citing articles |
| Guzzinati, G.; Béché, A.; McGrouther, D.; Verbeeck, J. |
Prospects for out-of-plane magnetic field measurements through interference of electron vortex modes in the TEM |
2019 |
Journal of optics |
21 |
3 |
UA library record; WoS full record; WoS citing articles |
| Ramachandran, D.; Egoavil, R.; Crabbe, A.; Hauffman, T.; Abakumov, A.; Verbeeck, J.; Vandendael, I.; Terryn, H.; Schryvers, D. |
TEM and AES investigations of the natural surface nano-oxide layer of an AISI 316L stainless steel microfibre |
2016 |
Journal of microscopy |
264 |
12 |
UA library record; WoS full record; WoS citing articles |
| Jannis, D.; Müller-Caspary, K.; Béché, A.; Verbeeck, J. |
Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope |
2021 |
Applied Sciences-Basel |
11 |
9 |
UA library record; WoS full record; WoS citing articles |
| Guda, A.A.; Smolentsev, N.; Verbeeck, J.; Kaidashev, E.M.; Zubavichus, Y.; Kravtsova, A.N.; Polozhentsev, O.E.; Soldatov, A.V. |
X-ray and electron spectroscopy investigation of the coreshell nanowires of ZnO:Mn |
2011 |
Solid state communications |
151 |
12 |
UA library record; WoS full record; WoS citing articles |
| Lebedev, O.I.; Verbeeck, J.; Van Tendeloo, G.; Hayashi, N.; Terashima, T.; Takano, M. |
Structure and microstructure of epitaxial SrnFenO3n-1 films |
2004 |
Philosophical magazine |
84 |
4 |
UA library record; WoS full record; WoS citing articles |
| Bertoni, G.; Verbeeck, J.; Brosens, F. |
Fitting the momentum dependent loss function in EELS |
2011 |
Microscopy research and technique |
74 |
6 |
UA library record; WoS full record; WoS citing articles |
| Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
|
|
|
UA library record |
| Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
|
|
|
UA library record |
| Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry |
1991 |
Journal of crystal growth |
110 |
40 |
UA library record; WoS full record; WoS citing articles |
