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Modeling and experimental investigation of the plasma uniformity in CF4/O2 capacitively coupled plasmas, operating in single frequency and dual frequency regime”. Zhang Y-R, Tinck S, De Schepper P, Wang Y-N, Bogaerts A, Journal of vacuum science and technology: A: vacuum surfaces and films 33, 021310 (2015). http://doi.org/10.1116/1.4906819
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Nanoscale Characterization of Growth of Secondary Phases in Off-Stoichiometric CZTS Thin Films”. Vishwakarma M, Karakulina OM, Abakumov AM, Hadermann J, Mehta BR, Journal of nanoscience and nanotechnology 18, 1688 (2018). http://doi.org/10.1166/jnn.2018.14261
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Multistep loading of titania nanoparticles in the mesopores of SBA-15 for enhanced photocatalytic activity”. de Witte K, Cool P, de Witte I, Ruys L, Rao J, Van Tendeloo G, Vansant EF, Journal of nanoscience and nanotechnology 7, 2511 (2007). http://doi.org/10.1166/jnn.2007.445
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Numerical modelling of gas discharge plasmas for various applications”. Bogaerts A, Gijbels R, Vacuum: surface engineering, surface instrumentation &, vacuum technology 69, 37 (2003). http://doi.org/10.1016/S0042-207X(02)00306-8
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Effect of high-frequency electromagnetic field on Te+-implanted (001) Si</tex>”. Kalitzova M, Vlakhov E, Marinov Y, Gesheva K, Ignatova VA, Lebedev O, Muntele C, Gijbels R, Vacuum: the international journal and abstracting service for vacuum science and technology 76, 325 (2004). http://doi.org/10.1016/j.vacuum.2004.07.055
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A scanning electron microscopy study on hollow silica microspheres: defects and influences of the synthesis composition”. Liu S, Wei M, Sui X, Cheng X, Cool P, Van Tendeloo G, Journal of sol-gel science and technology 49, 373 (2009). http://doi.org/10.1007/s10971-008-1875-0
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Validation of a newly developed FTIR in situ reactor: real time study of photocatalytic degradation of nitric oxide”. Hauchecorne B, Tytgat T, Terrens D, Vanpachtenbeke F, Lenaerts S, Infrared physics and technology 53, 469 (2010). http://doi.org/10.1016/J.INFRARED.2010.09.008
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Study of positive and negative plasma catalytic oxidation of ethylene”. Van Wesenbeeck K, Hauchecorne B, Lenaerts S, Environmental technology 38, 1554 (2017). http://doi.org/10.1080/09593330.2016.1237553
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Epitaxial CVD Growth of Ultra-Thin Si Passivation Layers on Strained Ge Fin Structures”. Loo R, Arimura H, Cott D, Witters L, Pourtois G, Schulze A, Douhard B, Vanherle W, Eneman G, Richard O, Favia P, Mitard J, Mocuta D, Langer R, Collaert N, ECS journal of solid state science and technology 7, P66 (2018). http://doi.org/10.1149/2.0191802JSS
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Study of the intrinsic limitations of the contact resistance of metal/semiconductor interfaces through atomistic simulations”. Dabral A, Pourtois G, Sankaran K, Magnus W, Yu H, de de Meux AJ, Lu AKA, Clima S, Stokbro K, Schaekers M, Collaert N, Horiguchi N, Houssa M, ECS journal of solid state science and technology 7, N73 (2018). http://doi.org/10.1149/2.0041806JSS
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On the evolution of strain and electrical properties in as-grown and annealed Si:P epitaxial films for source-drain stressor applications”. Dhayalan SK, Kujala J, Slotte J, Pourtois G, Simoen E, Rosseel E, Hikavyy A, Shimura Y, Loo R, Vandervorst W, ECS journal of solid state science and technology 7, P228 (2018). http://doi.org/10.1149/2.0071805JSS
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Insights into the C Distribution in Si:C/Si:C:P and the Annealing Behavior of Si:C Layers”. Dhayalan SK, Nuytten T, Pourtois G, Simoen E, Pezzoli F, Cinquanta E, Bonera E, Loo R, Rosseel E, Hikavyy A, Shimura Y, Vandervorst W, ECS journal of solid state science and technology 8, P209 (2019). http://doi.org/10.1149/2.0181903JSS
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Exploring alternative metals to Cu and W for interconnects applications using automated first-principles simulations”. Sankaran K, Clima S, Mees M, Pourtois G, ECS journal of solid state science and technology 4, N3127 (2015). http://doi.org/10.1149/2.0181501jss
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Visible light activation of room temperature NO2 gas sensors based on ZnO, SnO2 and In2O3 sensitized with CdSe quantum dots”. Chizhov AS, Rumyantseva MN, Vasiliev RB, Filatova DG, Drozdov KA, Krylov IV, Marchevsky AV, Karakulina OM, Abakumov AM, Gaskov AM, Thin solid films : an international journal on the science and technology of thin and thick films 618, 253 (2016). http://doi.org/10.1016/j.tsf.2016.09.029
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TEM study of B2 + L12 decomposition in a nanoscale Ni-rich Ni-Al film”. Schryvers D, Yandouzi M, Toth L, Thin solid films : an international journal on the science and technology of thin and thick films 326, 126 (1998). http://doi.org/10.1016/S0040-6090(98)00545-8
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XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers”. Conard T, de Witte H, Loo R, Verheyen P, Vandervorst W, Caymax M, Gijbels R, Thin solid films : an international journal on the science and technology of thin and thick films 343/344, 583 (1999). http://doi.org/10.1016/S0040-6090(99)00122-4
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Influence of the Ar/O2 ratio on the growth and biaxial alignment of yttria stabilized zirconia layers during reactive unbalanced magnetron sputtering”. Mahieu S, Ghekiere P, de Winter G, Depla D, de Gryse R, Lebedev OI, Van Tendeloo G, Thin solid films : an international journal on the science and technology of thin and thick films 484, 18 (2005). http://doi.org/10.1016/j.tsf.2005.01.021
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Growth of La2Mo2O9 films on porous Al2O3 substrates by radio frequency magnetron sputtering”. Laffez P, Chen XY, Banerjee G, Pezeril T, Rossell MD, Van Tendeloo G, Lacorre P, Liu JM, Liu Z-G, Thin solid films : an international journal on the science and technology of thin and thick films 500, 27 (2006). http://doi.org/10.1016/j.tsf.2005.10.062
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Metal-decorated multi-wall carbon nanotubes for low temperature gas sensing”. Espinosa EH, Lonescu R, Bittencourt C, Felten A, Erni R, Van Tendeloo G, Pireaux J-J, Llobet E, Thin solid films : an international journal on the science and technology of thin and thick films 515, 8322 (2007). http://doi.org/10.1016/j.tsf.2007.03.017
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The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg―Y―O thin films”. Jehanathan N, Georgieva V, Saraiva M, Depla D, Bogaerts A, Van Tendeloo G, Thin solid films : an international journal on the science and technology of thin and thick films 519, 5388 (2011). http://doi.org/10.1016/j.tsf.2011.02.050
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Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films”. Amin-Ahmadi B, Idrissi H, Galceran M, Colla MS, Raskin JP, Pardoen T, Godet S, Schryvers D, Thin solid films : an international journal on the science and technology of thin and thick films 539, 145 (2013). http://doi.org/10.1016/j.tsf.2013.05.083
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Effect of selenium content of CuInSex alloy nanopowder precursors on recrystallization of printed CuInSe2 absorber layers during selenization heat treatment”. E Zaghi A, Buffière M, Koo J, Brammertz G, Batuk M, Verbist C, Hadermann J, Kim WK, Meuris M, Poortmans J, Vleugels J;, Thin solid films : an international journal on the science and technology of thin and thick films , 1 (2014). http://doi.org/10.1016/j.tsf.2014.10.003
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Effect of the burn-out step on the microstructure of the solution-processed Cu(In,Ga)Se2 solar cells”. Batuk M, Buffiere M, Zaghi AE, Lenaers N, Verbist C, Khelifi S, Vleugels J, Meuris M, Hadermann J, Thin solid films : an international journal on the science and technology of thin and thick films 583, 142 (2015). http://doi.org/10.1016/j.tsf.2015.03.063
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Thermal conductivity of titanium nitride/titanium aluminum nitride multilayer coatings deposited by lateral rotating cathode arc”. Samani MK, Ding XZ, Khosravian N, Amin-Ahmadi B, Yi Y, Chen G, Neyts EC, Bogaerts A, Tay BK, Thin solid films : an international journal on the science and technology of thin and thick films 578, 133 (2015). http://doi.org/10.1016/j.tsf.2015.02.032
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Optical and photoelectrical properties of nanocrystalline indium oxide with small grains”. Forsh EA, Abakumov AM, Zaytsev VB, Konstantinova EA, Forsh PA, Rumyantseva MN, Gaskov AM, Kashkarov PK, Thin solid films : an international journal on the science and technology of thin and thick films 595, 25 (2015). http://doi.org/10.1016/j.tsf.2015.10.053
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Physical and electrical characterization of high-performance Cu2ZnSnSe4 based thin film solar cells”. Oueslati S, Brammertz G, Buffiere M, ElAnzeery H, Touayar O, Koeble C, Bekaert J, Meuris M, Poortmans J, Thin solid films : an international journal on the science and technology of thin and thick films 582, 224 (2015). http://doi.org/10.1016/j.tsf.2014.10.052
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Identification of substitutional nitrogen and surface paramagnetic centers in nanodiamond of dynamic synthesis by electron paramagnetic resonance”. Orlinskii SB, Bogomolov RS, Kiyamova AM, Yavkin BV, Mamin GM, Turner S, Van Tendeloo G, Shiryaev AA, Vlasov II, Shenderova O, Nanoscience and nanotechnology letters 3, 63 (2011). http://doi.org/10.1166/nnl.2011.1121
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Crack initiation in tapered high Si stainless steel specimens : stress threshold analyses”. Penders A, Konstantinovic MJ, Bosch RW, Schryvers D, Corrosion Engineering Science And Technology , 1 (2020). http://doi.org/10.1080/1478422X.2020.1785651
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“Branched&rdquo, structural transformation of the L12-Al3Zr phase manipulated by Cu substitution/segregation in the Al-Cu-Zr alloy system”. Ding L, Zhao M, Ehlers FJH, Jia Z, Zhang Z, Weng Y, Schryvers D, Liu Q, Idrissi H, Journal of materials science &, technology 185, 186 (2024). http://doi.org/10.1016/j.jmst.2023.11.015
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Aggregation of purple bacteria in an upflow photobioreactor to facilitate solid/liquid separation : impact of organic loading rate, hydraulic retention time and water composition”. Blansaer N, Alloul A, Verstraete W, Vlaeminck SE, Smets BF, Bioresource technology 348, 126806 (2022). http://doi.org/10.1016/J.BIORTECH.2022.126806
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