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Afanasov IM, Shornikova ON, Kirilenko DA, Vlasov II, Zhang L, Verbeeck J, Avdeev VV, Van Tendeloo G (2010) Graphite structural transformations during intercalation by HNO3 and exfoliation. Oxford, 1862–1865
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Heat-induced transformation of CdSe-CdS-ZnS coremultishell quantum dots by Zn diffusion into inner layers”. Yalcin AO, Goris B, van Dijk-Moes RJA, Fan Z, Erdamar AK, Tichelaar FD, Vlugt TJH, Van Tendeloo G, Bals S, Vanmaekelbergh D, Zandbergen HW, van Huis MA;, Chemical communications 51, 3320 (2015). http://doi.org/10.1039/C4CC08647C
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Highly Efficient Hyperbranched CNT Surfactants: Influence of Molar Mass and Functionalization”. Bertels E, Bruyninckx K, Kurttepeli, Smet M, Bals S, Goderis B, Langmuir: the ACS journal of surfaces and colloids 30, 12200 (2014). http://doi.org/10.1021/la503032g
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A holographic method to measure the source size broadening in STEM”. Verbeeck J, Béché, A, van den Broek W, Ultramicroscopy 120, 35 (2012). http://doi.org/10.1016/j.ultramic.2012.05.007
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Homogeneity and composition of AlInGaN : a multiprobe nanostructure study”. Krause FF, Ahl JP, Tytko D, Choi PP, Egoavil R, Schowalter M, Mehrtens T, Müller-Caspary K, Verbeeck J, Raabe D, Hertkorn J, Engl K, Rosenauer A, Ultramicroscopy 156, 29 (2015). http://doi.org/10.1016/j.ultramic.2015.04.012
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A La2−xGdxZr2O7layer deposited by chemical solution: a promising seed layer for the fabrication of high Jcand low cost coated conductors”. Muguerra H, Pescheux A-C, Meledin A, Van Tendeloo G, Soubeyroux J-L, Journal of materials chemistry C : materials for optical and electronic devices 3, 11766 (2015). http://doi.org/10.1039/C5TC03365A
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Inelastic electron-vortex-beam scattering”. Van Boxem R, Partoens B, Verbeeck J, Physical review : A : atomic, molecular and optical physics 91, 032703 (2015). http://doi.org/10.1103/PhysRevA.91.032703
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Interface-controlled magnetism and transport of ultrathin manganite films”. Shapoval O, Huehn S, Verbeeck J, Jungbauer M, Belenchuk A, Moshnyaga V, Journal of applied physics 113, 17c711 (2013). http://doi.org/10.1063/1.4795422
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Combination of HAADF-STEM and ADF-STEM Tomography for Core-Shell Hybrid Materials”. Sentosun K, Sanz Ortiz MN, Batenburg KJ, Liz-Marzán LM, Bals S, Particle and particle systems characterization 32, 1063 (2015). http://doi.org/10.1002/ppsc.201500097
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Interlayer structure in YBCO-coated conductors prepared by chemical solution deposition”. Molina L, Egoavil R, Turner S, Thersleff T, Verbeeck J, Holzapfel B, Eibl O, Van Tendeloo G, Superconductor science and technology 26, 075016 (2013). http://doi.org/10.1088/0953-2048/26/7/075016
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Investigation of (Bi,Pb)2212 crystals : observation of modulation-free phase”. Musolino N, Bals S, Van Tendeloo G, Clayton N, Walker E, Flukiger R, Physica: C : superconductivity 401, 270 (2004). http://doi.org/10.1016/j.physc.2003.09.052
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Is magnetic chiral dichroism feasible with electron vortices?”.Schattschneider P, Löffler S, Stöger-Pollach M, Verbeeck J, Ultramicroscopy 136, 81 (2014). http://doi.org/10.1016/j.ultramic.2013.07.012
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Long-range orientation and atomic attachment of nanocrystals in 2D honeycomb superlattices”. Boneschanscher MP, Evers WH, Geuchies JJ, Altantzis T, Goris B, Rabouw FT, van Rossum SAP, van der Zant HSJ, Siebbeles LDA, Van Tendeloo G, Swart I, Hilhorst J, Petukhov AV, Bals S, Vanmaekelbergh D;, Science 344, 1377 (2014). http://doi.org/10.1126/science.1252642
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Epitaxial YBa2Cu3O7−xnanocomposite thin films from colloidal solutions”. Cayado P, De Keukeleere K, Garzón A, Perez-Mirabet L, Meledin A, De Roo J, Vallés F, Mundet B, Rijckaert H, Pollefeyt G, Coll M, Ricart S, Palau A, Gázquez J, Ros J, Van Tendeloo G, Van Driessche I, Puig T, Obradors X, Superconductor science and technology 28, 124007 (2015). http://doi.org/10.1088/0953-2048/28/12/124007
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Luminescent CuInS2 quantum dots by partial cation exchange in Cu2-xS nanocrystals”. van der Stam W, Berends AC, Rabouw FT, Willhammar T, Ke X, Meeldijk JD, Bals S, de Donega CM, Chemistry of materials 27, 621 (2015). http://doi.org/10.1021/cm504340h
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Magnetically decorated multiwalled carbon nanotubes as dual MRI and SPECT contrast agents”. Wang JTW, Cabana L, Bourgognon M, Kafa H, Protti A, Venner K, Shah AM, Sosabowski JK, Mather SJ, Roig A, Ke X, Van Tendeloo G, de Rosales RTM, Tobias G, Al-Jamal KT, Advanced functional materials 24, 1880 (2014). http://doi.org/10.1002/adfm.201302892
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Advanced electron crystallography through model-based imaging”. Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G, IUCrJ 3, 71 (2016). http://doi.org/10.1107/S2052252515019727
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Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures”. Tan H, Egoavil R, Béché, A, Martinez GT, Van Aert S, Verbeeck J, Van Tendeloo G, Rotella H, Boullay P, Pautrat A, Prellier W, Physical review : B : condensed matter and materials physics 88, 155123 (2013). http://doi.org/10.1103/PhysRevB.88.155123
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Mapping spin-polarized transitions with atomic resolution”. Schattschneider P, Schaffer B, Ennen I, Verbeeck J, Physical review : B : condensed matter and materials physics 85, 134422 (2012). http://doi.org/10.1103/PhysRevB.85.134422
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Measurement of the mean inner potential of ZnO nanorods by transmission electron holography”. Müller E, Kruse P, Gerthsen D, Schowalter M, Rosenauer A, Lamoen D, Kling R, Microscopy of Semiconducting Materials 107SPRINGER PROCEEDINGS IN PHYSICS, 303 (2005)
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Measuring lattice strain in three dimensions through electron microscopy”. Goris B, de Beenhouwer J, de Backer A, Zanaga D, Batenburg KJ, Sánchez-Iglesias A, Liz-Marzán LM, Van Aert S, Bals S, Sijbers J, Van Tendeloo G, Nano letters 15, 6996 (2015). http://doi.org/10.1021/acs.nanolett.5b03008
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Measuring the orbital angular momentum of electron beams”. Guzzinati G, Clark L, Béché, A, Verbeeck J, Physical review : A : atomic, molecular and optical physics 89, 025803 (2014). http://doi.org/10.1103/PhysRevA.89.025803
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A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM”. Van den Broek W, Rosenauer A, Van Aert S, Sijbers J, van Dyck D, Ultramicroscopy 141, 22 (2014). http://doi.org/10.1016/j.ultramic.2014.03.008
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Model-based determination of dielectric function by STEM low-loss EELS”. Zhang L, Turner S, Brosens F, Verbeeck J, Physical review : B : condensed matter and materials physics 81, 035102 (2010). http://doi.org/10.1103/PhysRevB.81.035102
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Monitoring galvanic replacement through three-dimensional morphological and chemical mapping”. Goris B, Polavarapu L, Bals S, Van Tendeloo G, Liz-Marzán LM, Nano letters 14, 3220 (2014). http://doi.org/10.1021/nl500593j
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MsSpec-1.0 : a multiple scattering package for electron spectroscopies in material science”. Sébilleau D, Natoli C, Gavaza GM, Zhao H, da Pieve F, Hatada K, Computer physics communications 182, 2567 (2011). http://doi.org/10.1016/j.cpc.2011.07.012
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Multimodal imaging of micron-sized iron oxide particles following in vitro and in vivo uptake by stem cells: down to the nanometer scale”. Roose D, Leroux F, de Vocht N, Guglielmetti C, Pintelon I, Adriaensen D, Ponsaerts P, van der Linden A-M, Bals S, Contrast media and molecular imaging 9, 400 (2014). http://doi.org/10.1002/cmmi.1589
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N-doped ordered mesoporous carbons prepared by a two-step nanocasting strategy as highly active and selective electrocatalysts for the reduction of O2 to H2O2”. Sheng X, Daems N, Geboes B, Kurttepeli M, Bals S, Breugelmans T, Hubin A, Vankelecom IFJ, Pescarmona PP, Applied catalysis : B : environmental 176-177, 212 (2015). http://doi.org/10.1016/j.apcatb.2015.03.049
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Nanoscale investigation of the degradation mechanism of a historical chrome yellow paint by quantitative electron energy loss spectroscopy mapping of chromium species”. Tan H, Tian H, Verbeeck J, Janssens K, Van Tendeloo G, Angewandte Chemie: international edition in English 52, 11360 (2013). http://doi.org/10.1002/anie.201305753
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Nanoscale mapping by electron energy-loss spectroscopy reveals evolution of organic solar cell contact selectivity”. Guerrero A, Pfannmöller M, Kovalenko A, Ripolles TS, Heidari H, Bals S, Kaufmann L-D, Bisquert J, Garcia-Belmonte G, Organic electronics: physics, materials, applications 16, 227 (2015). http://doi.org/10.1016/j.orgel.2014.11.007
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