| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Javon, E.; Lubk; Cours, R.; Reboh, S.; Cherkashin, N.; Houdellier, F.; Gatel, C.; Hytch, M.J. |
Dynamical effects in strain measurements by dark-field electron holography |
2014 |
Ultramicroscopy |
147 |
10 |
UA library record; WoS full record; WoS citing articles |
| Vanrompay, H.; Skorikov, A.; Bladt, E.; Béché, A.; Freitag, B.; Verbeeck, J.; Bals, S. |
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges |
2021 |
Ultramicroscopy |
221 |
15 |
UA library record; WoS full record; WoS citing articles |
| Bladt, E.; Pelt, D.M.; Bals, S.; Batenburg, K.J. |
Electron tomography based on highly limited data using a neural network reconstruction technique |
2015 |
Ultramicroscopy |
158 |
25 |
UA library record; WoS full record; WoS citing articles |
| Jannis, D.; Hofer, C.; Gao, C.; Xie, X.; Béché, A.; Pennycook, Tj.; Verbeeck, J. |
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications |
2022 |
Ultramicroscopy |
233 |
31 |
UA library record; WoS full record; WoS citing articles |
| De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J. |
Dynamical electron diffraction in substitutionally disordered column structures |
1995 |
Ultramicroscopy |
60 |
14 |
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; Béché, A.; Müller-Caspary, K.; Guzzinati, G.; Luong, M.A.; Den Hertog, M. |
Demonstration of a 2 × 2 programmable phase plate for electrons |
2018 |
Ultramicroscopy |
190 |
73 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Verbeeck, J.; de Backer, S.; Scheunders, P.; Schryvers, D. |
Acquisition of the EELS data cube by tomographic reconstruction |
2006 |
Ultramicroscopy |
106 |
6 |
UA library record; WoS full record; WoS citing articles |
| Stefan Löffler; Matthieu Bugnet; Nicolas Gauquelin; Sorin Lazar; Elias Assmann; Karsten Held; Gianluigi A. Botton; Peter Schattschneider |
Real-space mapping of electronic orbitals |
2017 |
Ultramicroscopy |
177 |
|
UA library record |
| Van Eyndhoven, G.; Kurttepeli, M.; van Oers, C.J.; Cool, P.; Bals, S.; Batenburg, K.J.; Sijbers, J. |
Pore REconstruction and Segmentation (PORES) method for improved porosity quantification of nanoporous materials |
2015 |
Ultramicroscopy |
148 |
7 |
UA library record; WoS full record; WoS citing articles |
| Zhuge, X.; Jinnai, H.; Dunin-Borkowski, R.E.; Migunov, V.; Bals, S.; Cool, P.; Bons, A.-J.; Batenburg, K.J. |
Automated discrete electron tomography – Towards routine high-fidelity reconstruction of nanomaterials |
2017 |
Ultramicroscopy |
175 |
22 |
UA library record; WoS full record; WoS citing articles |
| Goris, B.; Meledina, M.; Turner, S.; Zhong, Z.; Batenburg, K.J.; Bals, S. |
Three dimensional mapping of Fe dopants in ceria nanocrystals using direct spectroscopic electron tomography |
2016 |
Ultramicroscopy |
171 |
13 |
UA library record; WoS full record; WoS citing articles |
| Hofer, C.; Pennycook, T.J. |
Reliable phase quantification in focused probe electron ptychography of thin materials |
2023 |
Ultramicroscopy |
254 |
|
UA library record; WoS full record; WoS citing articles |
| Susi, T.; Madsen, J.; Ludacka, U.; Mortensen, J.J.; Pennycook, T.J.; Lee, Z.; Kotakoski, J.; Kaiser, U.; Meyer, J.C. |
Efficient first principles simulation of electron scattering factors for transmission electron microscopy |
2019 |
Ultramicroscopy |
197 |
3 |
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; Bertoni, G. |
Deconvolution of core electron energy loss spectra |
2009 |
Ultramicroscopy |
109 |
13 |
UA library record; WoS full record; WoS citing articles |
| van den Broek, W.; Van Aert, S.; van Dyck, D. |
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
16 |
UA library record; WoS full record; WoS citing articles |
| Lubk, A.; Javon, E.; Cherkashin, N.; Reboh, S.; Gatel, C.; Hytch, M. |
Dynamic scattering theory for dark-field electron holography of 3D strain fields |
2014 |
Ultramicroscopy |
136 |
18 |
UA library record; WoS full record; WoS citing articles |
| Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D. |
Dark field electron holography for strain measurement |
2011 |
Ultramicroscopy |
111 |
31 |
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; Bertoni, G. |
Model-based quantification of EELS spectra: treating the effect of correlated noise |
2008 |
Ultramicroscopy |
108 |
16 |
UA library record; WoS full record; WoS citing articles |
| Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. |
Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography |
2013 |
Ultramicroscopy |
131 |
73 |
UA library record; WoS full record; WoS citing articles |
| Schattschneider, P.; Verbeeck, J.; Hamon, A.L. |
Real space maps of atomic transitions |
2009 |
Ultramicroscopy |
109 |
10 |
UA library record; WoS full record; WoS citing articles |
| Li, C.; Tardajos, A.P.; Wang, D.; Choukroun, D.; Van Daele, K.; Breugelmans, T.; Bals, S. |
A simple method to clean ligand contamination on TEM grids |
2021 |
Ultramicroscopy |
221 |
10 |
UA library record; WoS full record; WoS citing articles |
| Egoavil, R.; Gauquelin, N.; Martinez, G.T.; Van Aert, S.; Van Tendeloo, G.; Verbeeck, J. |
Atomic resolution mapping of phonon excitations in STEM-EELS experiments |
2014 |
Ultramicroscopy |
147 |
22 |
UA library record; WoS full record; WoS citing articles |
| Martinez, G.T.; Jones, L.; de Backer, A.; Béché, A.; Verbeeck, J.; Van Aert, S.; Nellist, P.D. |
Quantitative STEM normalisation : the importance of the electron flux |
2015 |
Ultramicroscopy |
159 |
27 |
UA library record; WoS full record; WoS citing articles |
| Bals, S.; Kilaas, R.; Kisielowski, C. |
Nonlinear imaging using annular dark field TEM |
2005 |
Ultramicroscopy |
104 |
15 |
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; Van Aert, S.; Bertoni, G. |
Model-based quantification of EELS spectra: including the fine structure |
2006 |
Ultramicroscopy |
106 |
38 |
UA library record; WoS full record; WoS citing articles |
| De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. |
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images |
2016 |
Ultramicroscopy |
171 |
43 |
UA library record; WoS full record; WoS citing articles |
| Roelandts, T.; Batenburg, K.J.; Biermans, E.; Kübel, C.; Bals, S.; Sijbers, J. |
Accurate segmentation of dense nanoparticles by partially discrete electron tomography |
2012 |
Ultramicroscopy |
114 |
34 |
UA library record; WoS full record; WoS citing articles |
| Alania, M.; Altantzis, T.; De Backer, A.; Lobato, I.; Bals, S.; Van Aert, S. |
Depth sectioning combined with atom-counting in HAADF STEM to retrieve the 3D atomic structure |
2016 |
Ultramicroscopy |
177 |
13 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; Chen, J.H.; van Dyck, D. |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy |
2010 |
Ultramicroscopy |
110 |
6 |
UA library record; WoS full record; WoS citing articles |
| Zhong, Z.; Goris, B.; Schoenmakers, R.; Bals, S.; Batenburg, K.J. |
A bimodal tomographic reconstruction technique combining EDS-STEM and HAADF-STEM |
2017 |
Ultramicroscopy |
174 |
26 |
UA library record; WoS full record; WoS citing articles |
