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Records |
Links |
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Author |
Fanidis, C.; van Dyck, D.; van Landuyt, J. |
![find record details (via OpenURL) openurl](img/xref.gif)
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Title |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: 1: theoretical framework |
Type |
A1 Journal article |
|
Year |
1992 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
|
Volume |
41 |
Issue |
|
Pages |
55-64 |
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|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
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Language |
|
Wos |
A1992HX68100005 |
Publication Date |
2002-10-18 |
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Series Editor |
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Series Title |
|
Abbreviated Series Title |
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|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
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|
Impact Factor |
2.436 |
Times cited |
17 |
Open Access |
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|
Notes |
|
Approved |
no |
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Call Number |
UA @ lucian @ c:irua:4092 |
Serial |
1608 |
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Permanent link to this record |
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Author |
Fanidis, C.; van Dyck, D.; van Landuyt, J. |
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Title |
Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases |
Type |
A1 Journal article |
|
Year |
1993 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
|
Volume |
48 |
Issue |
|
Pages |
133-164 |
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|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
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Language |
|
Wos |
A1993KM78800013 |
Publication Date |
0000-00-00 |
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Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0304-3991 |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
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|
Impact Factor |
2.436 |
Times cited |
6 |
Open Access |
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Notes |
|
Approved |
no |
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|
Call Number |
UA @ lucian @ c:irua:6782 |
Serial |
1609 |
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Permanent link to this record |
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Author |
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. |
![find record details (via OpenURL) openurl](img/xref.gif)
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Title |
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? |
Type |
A1 Journal article |
|
Year |
2003 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
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Volume |
98 |
Issue |
|
Pages |
27-42 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
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Language |
|
Wos |
000186831500003 |
Publication Date |
2003-04-25 |
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Series Editor |
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Series Title |
|
Abbreviated Series Title |
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|
Series Volume |
|
Series Issue |
|
Edition |
|
|
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ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
2.843 |
Times cited |
26 |
Open Access |
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|
|
Notes |
|
Approved |
Most recent IF: 2.843; 2003 IF: 1.665 |
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Call Number |
UA @ lucian @ c:irua:47516 |
Serial |
1749 |
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Permanent link to this record |
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Author |
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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Title |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
Type |
A1 Journal article |
|
Year |
2005 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
|
Volume |
104 |
Issue |
2 |
Pages |
83-106 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
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|
Language |
|
Wos |
000230526400001 |
Publication Date |
2005-04-09 |
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Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
2.843 |
Times cited |
70 |
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: 2.843; 2005 IF: 2.490 |
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|
Call Number |
UA @ lucian @ c:irua:57229 |
Serial |
1959 |
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Permanent link to this record |
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Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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|
Title |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
Type |
A1 Journal article |
|
Year |
2005 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
|
Volume |
104 |
Issue |
2 |
Pages |
107-125 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
Amsterdam |
Editor |
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|
Language |
|
Wos |
000230526400002 |
Publication Date |
2005-04-08 |
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|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
2.843 |
Times cited |
37 |
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: 2.843; 2005 IF: 2.490 |
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|
Call Number |
UA @ lucian @ c:irua:57131 |
Serial |
1960 |
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Permanent link to this record |
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Author |
Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
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|
Title |
Modification of the multislice method for calculating coherent STEM images |
Type |
A1 Journal article |
|
Year |
1995 |
Publication |
Physica status solidi: A: applied research |
Abbreviated Journal |
|
|
|
Volume |
150 |
Issue |
|
Pages |
13-22 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Berlin |
Editor |
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|
|
Language |
|
Wos |
A1995RQ21500002 |
Publication Date |
2007-01-12 |
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Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0031-8965;1521-396X; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
|
Times cited |
5 |
Open Access |
|
|
|
Notes |
|
Approved |
no |
|
|
Call Number |
UA @ lucian @ c:irua:13292 |
Serial |
2159 |
|
Permanent link to this record |
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|
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Author |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
|
|
Title |
The notion of resolution |
Type |
H3 Book chapter |
|
Year |
2008 |
Publication |
|
Abbreviated Journal |
|
|
|
Volume |
|
Issue |
|
Pages |
1228-1265 |
|
|
Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
|
|
|
Language |
|
Wos |
|
Publication Date |
0000-00-00 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
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|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
|
|
Impact Factor |
|
Times cited |
|
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: NA |
|
|
Call Number |
UA @ lucian @ c:irua:68656 |
Serial |
2370 |
|
Permanent link to this record |
|
|
|
|
Author |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
|
|
Title |
The notion of resolution |
Type |
H3 Book chapter |
|
Year |
2007 |
Publication |
|
Abbreviated Journal |
|
|
|
Volume |
|
Issue |
|
Pages |
1228-1265 |
|
|
Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
|
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
|
Thesis |
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|
Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
|
|
|
Language |
|
Wos |
|
Publication Date |
0000-00-00 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
|
|
Impact Factor |
|
Times cited |
|
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: NA |
|
|
Call Number |
UA @ lucian @ c:irua:68657 |
Serial |
2371 |
|
Permanent link to this record |
|
|
|
|
Author |
van Dyck, D.; Van Aert, S.; Croitoru, M.D. |
|
|
Title |
Obstacles on the road towards atomic resolution tomography |
Type |
A3 Journal article |
|
Year |
2005 |
Publication |
Microscoy and microanalysis |
Abbreviated Journal |
|
|
|
Volume |
11 |
Issue |
S2 |
Pages |
238-239 |
|
|
Keywords |
A3 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab |
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
|
Editor |
|
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|
Language |
|
Wos |
|
Publication Date |
0000-00-00 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
|
ISBN |
|
Additional Links |
UA library record |
|
|
Impact Factor |
|
Times cited |
|
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: NA |
|
|
Call Number |
UA @ lucian @ c:irua:57129 |
Serial |
2426 |
|
Permanent link to this record |
|
|
|
|
Author |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
![find record details (via OpenURL) openurl](img/xref.gif)
|
|
Title |
Optimal experimental design of STEM measurement of atom column positions |
Type |
A1 Journal article |
|
Year |
2002 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
|
Volume |
90 |
Issue |
|
Pages |
273-289 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
|
Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
|
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Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
|
|
Language |
|
Wos |
000174770900004 |
Publication Date |
2002-07-25 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
2.843 |
Times cited |
35 |
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: 2.843; 2002 IF: 1.772 |
|
|
Call Number |
UA @ lucian @ c:irua:47517 |
Serial |
2483 |
|
Permanent link to this record |
|
|
|
|
Author |
Amelinckx, S.; van Heurck, C.; van Dyck, D.; Van Tendeloo, G. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
|
|
Title |
A peculiar diffraction effect in FCC crystals of C60 |
Type |
A1 Journal article |
|
Year |
1992 |
Publication |
Physica status solidi: A: applied research |
Abbreviated Journal |
|
|
|
Volume |
131 |
Issue |
|
Pages |
589-604 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
Berlin |
Editor |
|
|
|
Language |
|
Wos |
A1992JE20400030 |
Publication Date |
2007-01-13 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
0031-8965;1521-396X; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
|
Times cited |
13 |
Open Access |
|
|
|
Notes |
|
Approved |
no |
|
|
Call Number |
UA @ lucian @ c:irua:4371 |
Serial |
2568 |
|
Permanent link to this record |
|
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|
|
Author |
van Dyck, D.; Van Aert, S.; den Dekker, A.J. |
![find record details (via OpenURL) openurl](img/xref.gif)
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|
Title |
Physical limits on atomic resolution |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
|
|
Volume |
10 |
Issue |
|
Pages |
153-157 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
|
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Corporate Author |
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Thesis |
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|
Publisher |
|
Place of Publication |
Cambridge, Mass. |
Editor |
|
|
|
Language |
|
Wos |
000188882100022 |
Publication Date |
2004-08-11 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
1431-9276;1435-8115; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
1.891 |
Times cited |
14 |
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: 1.891; 2004 IF: 2.389 |
|
|
Call Number |
UA @ lucian @ c:irua:47515 |
Serial |
2616 |
|
Permanent link to this record |
|
|
|
|
Author |
Van Aert, S.; van Dyck, D.; den Dekker, A.J. |
![goto web page (via DOI) doi](http://nano.uantwerpen.be/nanorefs/img/doi.gif)
|
|
Title |
Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative |
Type |
A1 Journal article |
|
Year |
2006 |
Publication |
Optics express |
Abbreviated Journal |
Opt Express |
|
|
Volume |
14 |
Issue |
9 |
Pages |
3830-3839 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
|
Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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|
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Address |
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Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
|
Editor |
|
|
|
Language |
|
Wos |
000237296200013 |
Publication Date |
2006-05-04 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
1094-4087; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
3.307 |
Times cited |
45 |
Open Access |
|
|
|
Notes |
Fwo |
Approved |
Most recent IF: 3.307; 2006 IF: 4.009 |
|
|
Call Number |
UA @ lucian @ c:irua:58262 |
Serial |
2883 |
|
Permanent link to this record |
|
|
|
|
Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
![find record details (via OpenURL) openurl](img/xref.gif)
|
|
Title |
Statistical experimental design for quantitative atomic resolution transmission electron microscopy |
Type |
H1 Book chapter |
|
Year |
2004 |
Publication |
|
Abbreviated Journal |
Adv Imag Elect Phys |
|
|
Volume |
|
Issue |
|
Pages |
1-164 |
|
|
Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
|
|
Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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|
|
Address |
|
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Corporate Author |
|
Thesis |
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|
|
Publisher |
Academic Press |
Place of Publication |
San Diego, Calif. |
Editor |
|
|
|
Language |
|
Wos |
000223226700001 |
Publication Date |
2011-01-05 |
|
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title |
|
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
|
ISSN |
1076-5670; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
|
Impact Factor |
|
Times cited |
13 |
Open Access |
|
|
|
Notes |
|
Approved |
Most recent IF: NA |
|
|
Call Number |
UA @ lucian @ c:irua:47513 |
Serial |
3156 |
|
Permanent link to this record |
|
|
|
|
Author |
Van Tendeloo, G.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; Amelinckx, S. |
|
|
Title |
Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp |
Type |
A1 Journal article |
|
Year |
1994 |
Publication |
MRS bulletin |
Abbreviated Journal |
Mrs Bull |
|
|
Volume |
|
Issue |
|
Pages |
57-59 |
|
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
|
Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
|
|
|
Address |
|
|
|
Corporate Author |
|
Thesis |
|
|
|
Publisher |
|
Place of Publication |
Pittsburgh, Pa |
Editor |
|
|
|
Language |
|
Wos |
A1994PH66300015 |
Publication Date |
0000-00-00 |
|
|
Series Editor |
|
Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0883-7694 |
ISBN |
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Additional Links |
UA library record; WoS full record; |
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Impact Factor |
5.667 |
Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ lucian @ c:irua:9996 |
Serial |
3821 |
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Permanent link to this record |
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Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
![find book details (via ISBN) isbn](img/isbn.gif)
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Title |
High resolution electron microscopy from imaging towards measuring |
Type |
H2 Book chapter |
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Year |
2001 |
Publication |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
Abbreviated Journal |
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Volume |
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Issue |
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Pages |
2081-2086 |
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Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Ieee |
Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
2002-11-13 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
0-7803-6646-8 |
Additional Links |
UA library record |
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Impact Factor |
|
Times cited |
|
Open Access |
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|
|
Notes |
|
Approved |
Most recent IF: NA |
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|
Call Number |
UA @ lucian @ c:irua:136870 |
Serial |
4501 |
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Permanent link to this record |
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Author |
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
![find book details (via ISBN) isbn](img/isbn.gif)
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Title |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
Type |
H1 Book chapter |
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Year |
2008 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
97-98 |
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Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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Language |
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Wos |
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Publication Date |
2009-03-17 |
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Series Editor |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-3-540-85154-7 |
Additional Links |
UA library record |
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Impact Factor |
|
Times cited |
|
Open Access |
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|
|
Notes |
|
Approved |
Most recent IF: NA |
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|
Call Number |
UA @ lucian @ c:irua:136865 |
Serial |
4493 |
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Permanent link to this record |
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Author |
Proost, K.; Schalm, O.; Janssens, K.; Van Dyck, D. |
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Title |
Investigation of the chemical state and 3D distribution of Mn in corroded glass fragments |
Type |
H3 Book chapter |
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Year |
2005 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Vision lab |
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Abstract ![sorted by Abstract field, descending order (down)](img/sort_desc.gif) |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
|
Open Access |
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|
|
Notes |
|
Approved |
Most recent IF: NA |
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|
Call Number |
UA @ admin @ c:irua:50851 |
Serial |
5674 |
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Permanent link to this record |