| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Jones, E.; Cooper, D.; Rouvière, J.-L.; Béché, A.; Azize, M.; Palacios, T.; Gradecak, S. |
Towards rapid nanoscale measurement of strain in III-nitride heterostructures |
2013 |
Applied Physics Letters |
103 |
6 |
UA library record; WoS full record; WoS citing articles |
| Yu, CP.; Vega Ibañez, F.; Béché, A.; Verbeeck, J. |
Quantum wavefront shaping with a 48-element programmable phase plate for electrons |
2023 |
SciPost Physics |
15 |
1 |
UA library record; WoS full record; WoS citing articles |
| Juchtmans, R.; Béché, A.; Abakumov, A.; Batuk, M.; Verbeeck, J. |
Using electron vortex beams to determine chirality of crystals in transmission electron microscopy |
2015 |
Physical review : B : condensed matter and materials physics |
91 |
54 |
UA library record; WoS full record; WoS citing articles |
| Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Spectroscopic coincidence experiments in transmission electron microscopy |
2019 |
Applied physics letters |
114 |
18 |
UA library record; WoS full record; WoS citing articles |
| van Huis, M.A.; Figuerola, A.; Fang, C.; Béché, A.; Zandbergen, H.W.; Manna, L. |
Letter Chemical transformation of Au-tipped CdS nanorods into AuS/Cd core/shell particles by electron beam irradiation |
2011 |
Nano letters |
11 |
25 |
UA library record; WoS full record; WoS citing articles |
| Van Aert, S.; De Backer, A.; Jones, L.; Martinez, G.T.; Béché, A.; Nellist, P.D. |
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy |
2019 |
Physical review letters |
122 |
3 |
UA library record; WoS full record; WoS citing articles |
| Vijayakumar, J.; Savchenko, T.M.; Bracher, D.M.; Lumbeeck, G.; Béché, A.; Verbeeck, J.; Vajda, Š.; Nolting, F.; Vaz, Ca.f.; Kleibert, A. |
Absence of a pressure gap and atomistic mechanism of the oxidation of pure Co nanoparticles |
2023 |
Nature communications |
14 |
1 |
UA library record; WoS full record; WoS citing articles |
| Van den Broek, W.; Reed, B.W.; Béché, A.; Velazco, A.; Verbeeck, J.; Koch, C.T. |
Various compressed sensing setups evaluated against Shannon sampling under constraint of constant illumination |
2019 |
IEEE transactions on computational imaging |
5 |
7 |
UA library record; WoS full record; WoS citing articles |
| Milagres de Oliveira, T.; Albrecht, W.; González-Rubio, G.; Altantzis, T.; Lobato Hoyos, I.P.; Béché, A.; Van Aert, S.; Guerrero-Martínez, A.; Liz-Marzán, L.M.; Bals, S. |
3D Characterization and Plasmon Mapping of Gold Nanorods Welded by Femtosecond Laser Irradiation |
2020 |
Acs Nano |
14 |
25 |
UA library record; WoS full record; WoS citing articles |
| Muller-Caspary, K.; Krause, F.F.; Grieb, T.; Loffler, S.; Schowalter, M.; Béché, A.; Galioit, V.; Marquardt, D.; Zweck, J.; Schattschneider, P.; Verbeeck, J.; Rosenauer, A. |
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy |
2016 |
Ultramicroscopy |
178 |
93 |
UA library record; WoS full record; WoS citing articles |
| Müller-Caspary, K.; Krause, F.F.; Winkler, F.; Béché, A.; Verbeeck, J.; Van Aert, S.; Rosenauer, A. |
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose |
2019 |
Ultramicroscopy |
203 |
25 |
UA library record; WoS full record; WoS citing articles |
| Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Spectrocopic coincidence experiment in transmission electron microscopy |
2019 |
|
|
|
UA library record |
| Cooper, D.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy |
2012 |
Applied Physics Letters |
100 |
|
UA library record; WoS full record; WoS citing articles |
| Béché, A.; Juchtmans, R.; Verbeeck, J. |
Efficient creation of electron vortex beams for high resolution STEM imaging |
2017 |
Ultramicroscopy |
178 |
30 |
UA library record; WoS full record; WoS citing articles |
| Guzzinati, G.; Clark, L.; Béché, A.; Verbeeck, J. |
Measuring the orbital angular momentum of electron beams |
2014 |
Physical review : A : atomic, molecular and optical physics |
89 |
42 |
UA library record; WoS full record; WoS citing articles |
| Cooper, D.; Rouvière, J.-L.; Béché, A.; Kadkhodazadeh, S.; Semenova, E.S.; Dunin-Borkowsk, R. |
Quantitative strain mapping of InAs/InP quantum dots with 1 nm spatial resolution using dark field electron holography |
2011 |
Applied physics letters |
99 |
26 |
UA library record; WoS full record; WoS citing articles |
| Cooper, D.; Denneulin, T.; Bernier, N.; Béché, A.; Rouvière, J.-L. |
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope |
2016 |
Micron |
80 |
50 |
UA library record; WoS full record; WoS citing articles |
| Wolf, D.; Rodriguez, L.A.; Béché, A.; Javon, E.; Serrano, L.; Magen, C.; Gatel, C.; Lubk, A.; Lichte, H.; Bals, S.; Van Tendeloo, G.; Fernández-Pacheco, A.; De Teresa, J.M.; Snoeck, E. |
3D Magnetic Induction Maps of Nanoscale Materials Revealed by Electron Holographic Tomography |
2015 |
Chemistry of materials |
27 |
50 |
UA library record; WoS full record; WoS citing articles |
| MacArthur, K.E.; Yankovich, A.B.; Béché, A.; Luysberg, M.; Brown, H.G.; Findlay, S.D.; Heggen, M.; Allen, L.J. |
Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale |
2021 |
Microscopy And Microanalysis |
|
|
UA library record; WoS full record; WoS citing articles |
| Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. |
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings |
2022 |
Ultramicroscopy |
232 |
18 |
UA library record; WoS full record; WoS citing articles |
| Idrissi, H.; Ghidelli, M.; Béché, A.; Turner, S.; Gravier, S.; Blandin, J.-J.; Raskin, J.-P.; Schryvers, D.; Pardoen, T. |
Atomic-scale viscoplasticity mechanisms revealed in high ductility metallic glass films |
2019 |
Scientific reports |
9 |
|
UA library record; WoS full record; WoS citing articles |
| Béché, A.; Van Boxem, R.; Van Tendeloo, G.; Verbeeck, J. |
Magnetic monopole field exposed by electrons |
2014 |
Nature physics |
10 |
131 |
UA library record; WoS full record; WoS citing articles |
| Jalabert, D.; Pelloux-Gervais, D.; Béché, A.; Hartmann, J.M.; Gergaud, P.; Rouvière, J.L.; Canut, B. |
Depth strain profile with sub-nm resolution in a thin silicon film using medium energy ion scattering |
2012 |
Physica Status Solidi A-Applications And Materials Science |
209 |
3 |
UA library record; WoS full record; WoS citing articles |
| Béché, A.; Goris, B.; Freitag, B.; Verbeeck, J. |
Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy |
2016 |
Applied physics letters |
108 |
40 |
UA library record; WoS full record; WoS citing articles |
| Li, K.; Béché, A.; Song, M.; Sha, G.; Lu, X.; Zhang, K.; Du, Y.; Ringer, S.P.; Schryvers, D. |
Atomistic structure of Cu-containing \beta" precipitates in an Al-Mg-Si-Cu alloy |
2014 |
Scripta materialia |
75 |
22 |
UA library record; WoS full record; WoS citing articles |
| Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. |
Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping |
2019 |
Applied physics letters |
114 |
17 |
UA library record; WoS full record; WoS citing articles |
| Cooper, D.; Denneulin, T.; Barnes, J.-P.; Hartmann, J.-M.; Hutin, L.; Le Royer, C.; Béché, A.; Rouvière, J.-L. |
Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy |
2012 |
Applied Physics Letters |
112 |
14 |
UA library record; WoS full record; WoS citing articles |
| Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. |
Evaluation of different rectangular scan strategies for STEM imaging |
2020 |
Ultramicroscopy |
|
13 |
UA library record; WoS full record; WoS citing articles |
| Verbeeck, J.; Béché, A.; van den Broek, W. |
A holographic method to measure the source size broadening in STEM |
2012 |
Ultramicroscopy |
120 |
29 |
UA library record; WoS full record; WoS citing articles |
| Denneulin, T.; Rouvière, J.L.; Béché, A.; Py, M.; Barnes, J.P.; Rochat, N.; Hartmann, J.M.; Cooper, D. |
The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography |
2011 |
Semiconductor science and technology |
26 |
|
UA library record; WoS full record; WoS citing articles |
