|
Records |
|
Author |
van den Broek, W.; Van Aert, S.; van Dyck, D. |
|
Title |
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency |
Type |
A1 Journal article |
|
Year |
2012 |
Publication |
Microscopy and microanalysis |
Abbreviated Journal |
Microsc Microanal |
|
Volume |
18 |
Issue |
2 |
Pages |
336-342 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
Abstract |
The charge-coupled devices used in electron microscopy are coated with a scintillating crystal that gives rise to a severe modulation transfer function (MTF). Exact knowledge of the MTF is imperative for a good correspondence between image simulation and experiment. We present a practical method to measure the MTF above the Nyquist frequency from the beam blocker's shadow image. The image processing has been fully automated and the program is made public. The method is successfully tested on three cameras with various beam blocker shapes. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Cambridge, Mass. |
Editor |
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Language |
|
Wos |
000302084700011 |
Publication Date |
2012-02-14 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
1431-9276;1435-8115; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
1.891 |
Times cited |
15 |
Open Access |
|
|
Notes |
Fwo |
Approved |
Most recent IF: 1.891; 2012 IF: 2.495 |
|
Call Number |
UA @ lucian @ c:irua:96557 |
Serial |
1297 |
Permanent link to this record |
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|
|
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Author |
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Ding, X.; Salje, E.K.H. |
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Title |
Functional twin boundaries |
Type |
A1 Journal article |
|
Year |
2013 |
Publication |
Phase transitions |
Abbreviated Journal |
Phase Transit |
|
Volume |
86 |
Issue |
11 |
Pages |
1052-1059 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
Abstract |
Functional interfaces are at the core of research in the emerging field of domain boundary engineering where polar, conducting, chiral, and other interfaces and twin boundaries have been discovered. Ferroelectricity was found in twin walls of paraelectric CaTiO3. We show that the effect of functional interfaces can be optimized if the number of twin boundaries is increased in densely twinned materials. Such materials can be produced by shear in the ferroelastic phase rather than by rapid quench from the paraelastic phase. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
New York |
Editor |
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Language |
|
Wos |
000327475900002 |
Publication Date |
2013-01-16 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0141-1594;1029-0338; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
1.06 |
Times cited |
5 |
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: 1.06; 2013 IF: 1.044 |
|
Call Number |
UA @ lucian @ c:irua:107344 |
Serial |
1304 |
Permanent link to this record |
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Author |
de Backer, A.; Van Aert, S.; van Dyck, D. |
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Title |
High precision measurements of atom column positions using model-based exit wave reconstruction |
Type |
A1 Journal article |
|
Year |
2011 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
Volume |
111 |
Issue |
9/10 |
Pages |
1475-1482 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
Abstract |
In this paper, it has been investigated how to measure atom column positions as accurately and precisely as possible using a focal series of images. In theory, it is expected that the precision would considerably improve using a maximum likelihood estimator based on the full series of focal images. As such, the theoretical lower bound on the variances of the unknown atom column positions can be attained. However, this approach is numerically demanding. Therefore, maximum likelihood estimation has been compared with the results obtained by fitting a model to a reconstructed exit wave rather than to the full series of focal images. Hence, a real space model-based exit wave reconstruction technique based on the channelling theory is introduced. Simulations show that the reconstructed complex exit wave contains the same amount of information concerning the atom column positions as the full series of focal images. Only for thin samples, which act as weak phase objects, this information can be retrieved from the phase of the reconstructed complex exit wave. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
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Language |
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Wos |
000300461200004 |
Publication Date |
2011-07-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.843 |
Times cited |
8 |
Open Access |
|
|
Notes |
Fwo |
Approved |
Most recent IF: 2.843; 2011 IF: 2.471 |
|
Call Number |
UA @ lucian @ c:irua:91879 |
Serial |
1438 |
Permanent link to this record |
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|
|
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Author |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
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Title |
High-resolution electron microscopy and electron tomography: resolution versus precision |
Type |
A1 Journal article |
|
Year |
2002 |
Publication |
Journal of structural biology |
Abbreviated Journal |
J Struct Biol |
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Volume |
138 |
Issue |
|
Pages |
21-33 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract |
|
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Address |
|
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
New York |
Editor |
|
|
Language |
|
Wos |
000177978800003 |
Publication Date |
2002-09-17 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
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Series Issue |
|
Edition |
|
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ISSN |
1047-8477; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.767 |
Times cited |
33 |
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: 2.767; 2002 IF: 4.194 |
|
Call Number |
UA @ lucian @ c:irua:47520 |
Serial |
1446 |
Permanent link to this record |
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|
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Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
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Title |
High-resolution electron microscopy : from imaging toward measuring |
Type |
A1 Journal article |
|
Year |
2002 |
Publication |
IEEE transactions on instrumentation and measurement |
Abbreviated Journal |
Ieee T Instrum Meas |
|
Volume |
51 |
Issue |
4 |
Pages |
611-615 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
New York, N.Y. |
Editor |
|
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Language |
|
Wos |
000178992000010 |
Publication Date |
2003-01-03 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
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Series Issue |
|
Edition |
|
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ISSN |
0018-9456; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.456 |
Times cited |
13 |
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: 2.456; 2002 IF: 0.592 |
|
Call Number |
UA @ lucian @ c:irua:47521 |
Serial |
1450 |
Permanent link to this record |
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Author |
Bals, S.; Van Aert, S.; Van Tendeloo, G. |
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Title |
High resolution electron tomography |
Type |
A1 Journal article |
|
Year |
2013 |
Publication |
Current opinion in solid state and materials science |
Abbreviated Journal |
Curr Opin Solid St M |
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Volume |
17 |
Issue |
3 |
Pages |
107-114 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
Reaching atomic resolution in 3D has been the ultimate goal in the field of electron tomography for many years. Significant progress, both on the theoretical as well as the experimental side has recently resulted in several exciting examples demonstrating the ability to visualise atoms in 3D. In this paper, we will review the different steps that have pushed the resolution in 3D to the atomic level. A broad range of methodologies and practical examples together with their impact on materials science will be discussed. Finally, we will provide an outlook and will describe future challenges in the field of high resolution electron tomography. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
London |
Editor |
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Language |
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Wos |
000323869800003 |
Publication Date |
2013-03-30 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
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Series Issue |
|
Edition |
|
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ISSN |
1359-0286; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
6.938 |
Times cited |
24 |
Open Access |
|
|
Notes |
Fwo; 312483 Esteem; Countatoms; |
Approved |
Most recent IF: 6.938; 2013 IF: 7.167 |
|
Call Number |
UA @ lucian @ c:irua:109454 |
Serial |
1457 |
Permanent link to this record |
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|
|
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Author |
Schryvers, D.; Van Aert, S. |
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Title |
High-resolution visualization techniques : structural aspects |
Type |
H1 Book chapter |
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Year |
2012 |
Publication |
|
Abbreviated Journal |
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Volume |
|
Issue |
|
Pages |
135-149 |
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Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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Language |
|
Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
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Series Issue |
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Edition |
|
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ISSN |
|
ISBN |
978-3-642-20942-0 |
Additional Links |
UA library record |
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Impact Factor |
|
Times cited |
|
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: NA |
|
Call Number |
UA @ lucian @ c:irua:94124 |
Serial |
1464 |
Permanent link to this record |
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|
|
|
Author |
Van Aert, S.; den Dekker, A.J.; van Dyck, D. |
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Title |
How to optimize the experimental design of quantitative atomic resolution TEM experiments? |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Micron |
Abbreviated Journal |
Micron |
|
Volume |
35 |
Issue |
|
Pages |
425-429 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract |
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Address |
|
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
|
Editor |
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Language |
|
Wos |
000221721000005 |
Publication Date |
2004-03-06 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0968-4328; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
1.98 |
Times cited |
14 |
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: 1.98; 2004 IF: 1.464 |
|
Call Number |
UA @ lucian @ c:irua:47514 |
Serial |
1495 |
Permanent link to this record |
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Author |
Morozov, V.A.; Bertha, A.; Meert, K.W.; Van Rompaey, S.; Batuk, D.; Martinez, G.T.; Van Aert, S.; Smet, P.F.; Raskina, M.V.; Poelman, D.; Abakumov, A.M.; Hadermann, J.; |
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Title |
Incommensurate modulation and luminescence in the CaGd2(1-x)Eu2x(MoO4)4(1-y)(WO)4y (0\leq x\leq1, 0\leq y\leq1) red phosphors |
Type |
A1 Journal article |
|
Year |
2013 |
Publication |
Chemistry of materials |
Abbreviated Journal |
Chem Mater |
|
Volume |
25 |
Issue |
21 |
Pages |
4387-4395 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
Abstract |
Scheelite related compounds (A',A '') [(B',B '')O-4], with B', B '' = W and/or Mo are promising new light-emitting materials for photonic applications, including phosphor converted LEDs (light-emitting diodes). In this paper, the creation and ordering of A-cation vacancies and the effect of cation substitutions in the scheelite-type framework are investigated as a factor for controlling the scheelite-type structure and luminescent properties. CaGd2(1-x)Eu2x(MoO4)(4(1-y))(WO4)(4y) (0 <= x <= 1, 0 <= y <= 1) solid solutions with scheelite-type structure were synthesized by a solid state method, and their structures were investigated using a combination of transmission electron microscopy techniques and powder X-ray diffraction. Within this series all complex molybdenum oxides have (3 + 2)D incommensurately modulated structures with superspace group I4(1)/a(alpha,beta,0)00(-beta,alpha,0)00, while the structures of all tungstates are (3 + 1)D incommensurately modulated with superspace group I2/b(alpha beta 0)00. In both cases the modulation arises because of cation-vacancy ordering at the A site. The prominent structural motif is formed by columns of A-site vacancies running along the c-axis. These vacant columns occur in rows of two or three aligned along the [110] direction of the scheelite subcell. The replacement of the smaller Gd3+ by the larger Eu3+ at the A-sublattice does not affect the nature of the incommensurate modulation, but an increasing replacement of Mo6+ by W6+ switches the modulation from (3 + 2)D to (3 + 1)D regime. Thus, these solid solutions can be considered as a model system where the incommensurate modulation can be monitored as a function of cation nature while the number of cation vacancies at the A sites remain constant upon the isovalent cation replacement. All compounds' luminescent properties were measured, and the optical properties were related to the structural properties of the materials. CaGd2(1-x)(MoO4)(4(1-y))(WO4)(4y) phosphors emit intense red light dominated by the D-5(0)-F-7(2) transition at 612 nm, along with other transitions from the D-5(1) and D-5(0) excited states. The intensity of the 5D0-7F2 transition reaches a maximum at x = 0.5 for y = 0 and 1. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
Washington, D.C. |
Editor |
|
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Language |
|
Wos |
000327045000030 |
Publication Date |
2013-09-24 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0897-4756;1520-5002; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
9.466 |
Times cited |
63 |
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: 9.466; 2013 IF: 8.535 |
|
Call Number |
UA @ lucian @ c:irua:112776 |
Serial |
1594 |
Permanent link to this record |
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|
|
Author |
Dunin-Borkowski, R.E.; Lichte, H.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. |
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Title |
Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays |
Type |
Editorial |
|
Year |
2013 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
Volume |
134 |
Issue |
|
Pages |
1-1 |
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Keywords |
Editorial; Electron microscopy for materials research (EMAT) |
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Abstract |
|
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Address |
|
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Corporate Author |
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Thesis |
|
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Publisher |
Elsevier science bv |
Place of Publication |
Amsterdam |
Editor |
|
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Language |
|
Wos |
000324474900001 |
Publication Date |
2013-07-24 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.843 |
Times cited |
1 |
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: 2.843; 2013 IF: 2.745 |
|
Call Number |
UA @ lucian @ c:irua:109917 |
Serial |
1721 |
Permanent link to this record |
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Author |
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. |
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Title |
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? |
Type |
A1 Journal article |
|
Year |
2003 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
Volume |
98 |
Issue |
|
Pages |
27-42 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract |
|
|
Address |
|
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Corporate Author |
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Thesis |
|
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Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
|
Language |
|
Wos |
000186831500003 |
Publication Date |
2003-04-25 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.843 |
Times cited |
26 |
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: 2.843; 2003 IF: 1.665 |
|
Call Number |
UA @ lucian @ c:irua:47516 |
Serial |
1749 |
Permanent link to this record |
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Author |
Lu, J.; Martinez, G.T.; Van Aert, S.; Schryvers, D. |
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Title |
Lattice deformations in quasi-dynamic strain glass visualised and quantified by aberration corrected electron microscopy |
Type |
A1 Journal article |
|
Year |
2014 |
Publication |
Physica status solidi: B: basic research |
Abbreviated Journal |
Phys Status Solidi B |
|
Volume |
251 |
Issue |
10 |
Pages |
2034-2040 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
Abstract |
Advanced transmission electron microscopy and statistical parameter estimated quantification procedures were applied to study the room temperature quasi-dynamical strain glass state in NiTi alloys. Nanosized strain pockets are visualised and the displacements of the atom columns are quantified. A comparison is made with conventional high-resolution transmission electron microscopy images of point defect induced strains in NiAl alloys. |
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Address |
|
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
Berlin |
Editor |
|
|
Language |
|
Wos |
000344360000009 |
Publication Date |
2014-03-31 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0370-1972; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
1.674 |
Times cited |
2 |
Open Access |
|
|
Notes |
Fwo |
Approved |
Most recent IF: 1.674; 2014 IF: 1.489 |
|
Call Number |
UA @ lucian @ c:irua:120471 |
Serial |
1801 |
Permanent link to this record |
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|
|
|
Author |
Van Aert, S.; Chen, J.H.; van Dyck, D. |
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Title |
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy |
Type |
A1 Journal article |
|
Year |
2010 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
Volume |
110 |
Issue |
11 |
Pages |
1404-1410 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
Abstract |
A widely used performance criterion in high-resolution transmission electron microscopy (HRTEM) is the information limit. It corresponds to the inverse of the maximum spatial object frequency that is linearly transmitted with sufficient intensity from the exit plane of the object to the image plane and is limited due to partial temporal coherence. In practice, the information limit is often measured from a diffractogram or from Young's fringes assuming a weak phase object scattering beyond the inverse of the information limit. However, for an aberration corrected electron microscope, with an information limit in the sub-angstrom range, weak phase objects are no longer applicable since they do not scatter sufficiently in this range. Therefore, one relies on more strongly scattering objects such as crystals of heavy atoms observed along a low index zone axis. In that case, dynamical scattering becomes important such that the non-linear and linear interaction may be equally important. The non-linear interaction may then set the experimental cut-off frequency observed in a diffractogram. The goal of this paper is to quantify both the linear and the non-linear information transfer in terms of closed form analytical expressions. Whereas the cut-off frequency set by the linear transfer can be directly related with the attainable resolution, information from the non-linear transfer can only be extracted using quantitative, model-based methods. In contrast to the historic definition of the information limit depending on microscope parameters only, the expressions derived in this paper explicitly incorporate their dependence on the structure parameters as well. In order to emphasize this dependence and to distinguish from the usual information limit, the expressions derived for the inverse cut-off frequencies will be referred to as the linear and non-linear structural information limit. The present findings confirm the well-known result that partial temporal coherence has different effects on the transfer of the linear and non-linear terms, such that the non-linear imaging contributions are damped less than the linear imaging contributions at high spatial frequencies. This will be important when coherent aberrations such as spherical aberration and defocus are reduced. |
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Address |
|
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Corporate Author |
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Thesis |
|
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Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
|
Language |
|
Wos |
000282562100008 |
Publication Date |
2010-07-15 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.843 |
Times cited |
6 |
Open Access |
|
|
Notes |
Fwo |
Approved |
Most recent IF: 2.843; 2010 IF: 2.063 |
|
Call Number |
UA @ lucian @ c:irua:83689 |
Serial |
1821 |
Permanent link to this record |
|
|
|
|
Author |
Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. |
|
Title |
Advanced electron crystallography through model-based imaging |
Type |
A1 Journal article |
|
Year |
2016 |
Publication |
IUCrJ |
Abbreviated Journal |
Iucrj |
|
Volume |
3 |
Issue |
3 |
Pages |
71-83 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab; Engineering Management (ENM) |
|
Abstract |
The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions, chemical concentrations and atomic numbers. For this purpose, statistical parameter estimation theory has been shown to provide reliable results. In this theory, observations are considered purely as data planes, from which structure parameters have to be determined using a parametric model describing the images. As such, the positions of atom columns can be measured with a precision of the order of a few picometres, even though the resolution of the electron microscope is still one or two orders of magnitude larger. Moreover, small differences in average atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark-field scanning transmission electron microscopy images. In addition, this theory allows one to measure compositional changes at interfaces, to count atoms with single-atom sensitivity, and to reconstruct atomic structures in three dimensions. This feature article brings the reader up to date, summarizing the underlying theory and highlighting some of the recent applications of quantitative model-based transmisson electron microscopy. |
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Address |
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Corporate Author |
|
Thesis |
|
|
Publisher |
|
Place of Publication |
|
Editor |
|
|
Language |
|
Wos |
000368590900010 |
Publication Date |
2015-11-13 |
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
2052-2525; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
5.793 |
Times cited |
30 |
Open Access |
OpenAccess |
|
Notes |
The authors gratefully acknowledge the Research Foundation Flanders (FWO, Belgium) for funding and for a PhD grant to ADB. The research leading to these results has received funding from the European Union 7th Framework Program (FP7/20072013) under grant agreement No. 312483 (ESTEEM2). SB and GVT acknowledge the European Research Council under the 7th Framework Program (FP7), ERC grant No. 335078 – COLOURATOMS and ERC grant No. 246791 – COUNTATOMS.; esteem2jra2; ECASSara; (ROMEO:green; preprint:; postprint:can ; pdfversion:can); |
Approved |
Most recent IF: 5.793 |
|
Call Number |
c:irua:129589 c:irua:129589 |
Serial |
3965 |
Permanent link to this record |
|
|
|
|
Author |
Tan, H.; Egoavil, R.; Béché, A.; Martinez, G.T.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Rotella, H.; Boullay, P.; Pautrat, A.; Prellier, W. |
|
Title |
Mapping electronic reconstruction at the metal-insulator interface in LaVO3/SrVO3 heterostructures |
Type |
A1 Journal article |
|
Year |
2013 |
Publication |
Physical review : B : condensed matter and materials physics |
Abbreviated Journal |
Phys Rev B |
|
Volume |
88 |
Issue |
15 |
Pages |
155123-155126 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
Abstract |
A (LaVO3)6/(SrVO3)(3) superlattice is studied with a combination of sub-A resolved scanning transmission electron microscopy and monochromated electron energy-loss spectroscopy. The V oxidation state is mapped with atomic spatial resolution enabling us to investigate electronic reconstruction at the LaVO3/SrVO3 interfaces. Surprisingly, asymmetric charge distribution is found at adjacent chemically symmetric interfaces. The local structure is proposed and simulated with a double channeling calculation which agrees qualitatively with our experiment. We demonstrate that local strain asymmetry is the likely cause of the electronic asymmetry of the interfaces. The electronic reconstruction at the interfaces extends much further than the chemical composition, varying from 0.5 to 1.2 nm. This distance corresponds to the length of charge transfer previously found in the (LaVO3)./(SrVO3). metal/insulating and the (LaAlO3)./(SrTiO3). insulating/insulating interfaces. |
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Address |
|
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Corporate Author |
|
Thesis |
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Publisher |
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Place of Publication |
|
Editor |
|
|
Language |
|
Wos |
000326087100003 |
Publication Date |
2013-10-21 |
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Series Editor |
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Series Title |
|
Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
1098-0121;1550-235X; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
3.836 |
Times cited |
15 |
Open Access |
|
|
Notes |
Hercules; 246791 COUNTATOMS; 278510 VORTEX; 246102 IFOX; 312483 ESTEEM2; FWO; GOA XANES meets ELNES; esteem2jra3 ECASJO; |
Approved |
Most recent IF: 3.836; 2013 IF: 3.664 |
|
Call Number |
UA @ lucian @ c:irua:112733UA @ admin @ c:irua:112733 |
Serial |
1944 |
Permanent link to this record |
|
|
|
|
Author |
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. |
|
Title |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework |
Type |
A1 Journal article |
|
Year |
2005 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
Volume |
104 |
Issue |
2 |
Pages |
83-106 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
Abstract |
|
|
Address |
|
|
Corporate Author |
|
Thesis |
|
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
|
Language |
|
Wos |
000230526400001 |
Publication Date |
2005-04-09 |
|
Series Editor |
|
Series Title |
|
Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.843 |
Times cited |
70 |
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: 2.843; 2005 IF: 2.490 |
|
Call Number |
UA @ lucian @ c:irua:57229 |
Serial |
1959 |
Permanent link to this record |
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|
|
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Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. |
|
Title |
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example |
Type |
A1 Journal article |
|
Year |
2005 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
Volume |
104 |
Issue |
2 |
Pages |
107-125 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
Abstract |
|
|
Address |
|
|
Corporate Author |
|
Thesis |
|
|
Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
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Language |
|
Wos |
000230526400002 |
Publication Date |
2005-04-08 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
|
|
Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.843 |
Times cited |
37 |
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: 2.843; 2005 IF: 2.490 |
|
Call Number |
UA @ lucian @ c:irua:57131 |
Serial |
1960 |
Permanent link to this record |
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|
|
|
Author |
Goris, B.; de Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, K.J.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Aert, S.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
|
Title |
Measuring lattice strain in three dimensions through electron microscopy |
Type |
A1 Journal article |
|
Year |
2015 |
Publication |
Nano letters |
Abbreviated Journal |
Nano Lett |
|
Volume |
15 |
Issue |
15 |
Pages |
6996-7001 |
|
Keywords |
A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT); Vision lab |
|
Abstract |
The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizations of nanostructures at the atomic level, a reliable determination of lattice strain is not straightforward. We therefore propose a novel model-based approach from which atomic coordinates are measured. Our findings demonstrate the importance of investigating lattice strain in 3D. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
Washington |
Editor |
|
|
Language |
|
Wos |
000363003100108 |
Publication Date |
2015-09-04 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
1530-6984;1530-6992; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
12.712 |
Times cited |
87 |
Open Access |
OpenAccess |
|
Notes |
Fwo; 335078 Colouratom; 267867 Plasmaquo; 312483 Esteem2; 262348 Esmi; esteem2jra4; ECASSara; (ROMEO:white; preprint:; postprint:restricted 12 months embargo; pdfversion:cannot); |
Approved |
Most recent IF: 12.712; 2015 IF: 13.592 |
|
Call Number |
c:irua:127639 c:irua:127639 |
Serial |
1965 |
Permanent link to this record |
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Author |
Van Aert, S. |
|
Title |
Meer zien met onzichtbaar licht |
Type |
A2 Journal article |
|
Year |
2007 |
Publication |
Karakter : tijdschrift van wetenschap |
Abbreviated Journal |
|
|
Volume |
18 |
Issue |
|
Pages |
19-21 |
|
Keywords |
A2 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
|
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Address |
|
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Corporate Author |
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Thesis |
|
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Publisher |
|
Place of Publication |
Leuven |
Editor |
|
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Language |
|
Wos |
|
Publication Date |
0000-00-00 |
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Series Editor |
|
Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
|
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
1379-0390 |
ISBN |
|
Additional Links |
UA library record |
|
Impact Factor |
|
Times cited |
|
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: NA |
|
Call Number |
UA @ lucian @ c:irua:68658 |
Serial |
1982 |
Permanent link to this record |
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|
|
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Author |
Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. |
|
Title |
A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM |
Type |
A1 Journal article |
|
Year |
2014 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
Volume |
141 |
Issue |
|
Pages |
22-31 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
Abstract |
The conventional approach to object reconstruction through electron tomography is to reduce the three-dimensional problem to a series of independent two-dimensional slice-by-slice reconstructions. However, at atomic resolution the image of a single atom extends over many such slices and incorporating this image as prior knowledge in tomography or depth sectioning therefore requires a fully three-dimensional treatment. Unfortunately, the size of the three-dimensional projection operator scales highly unfavorably with object size and readily exceeds the available computer memory. In this paper, it is shown that for incoherent image formation the memory requirement can be reduced to the fundamental lower limit of the object size, both for tomography and depth sectioning. Furthermore, it is shown through multislice calculations that high angle annular dark field scanning transmission electron microscopy can be sufficiently incoherent for the reconstruction of single element nanocrystals, but that dynamical diffraction effects can cause classification problems if more than one element is present. (C) 2014 Elsevier B.V. All rights reserved. |
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Address |
|
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
|
Language |
|
Wos |
000335766600004 |
Publication Date |
2014-03-22 |
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Series Editor |
|
Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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|
Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.843 |
Times cited |
6 |
Open Access |
|
|
Notes |
ResearchFoundationFlanders(FWO;G.0393.11; G.0064.10;andG.0374.13); European Union Seventh Frame- workProgramme [FP7/2007-2013]under Grant agreement no. 312483 (ESTEEM2).; esteem2jra2; esteem2jra4 |
Approved |
Most recent IF: 2.843; 2014 IF: 2.436 |
|
Call Number |
UA @ lucian @ c:irua:117650 |
Serial |
1992 |
Permanent link to this record |
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|
|
|
Author |
Wang, A.; Chen, F.R.; Van Aert, S.; van Dyck, D. |
|
Title |
A method to determine the local surface profile from reconstructed exit waves |
Type |
A1 Journal article |
|
Year |
2011 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
Volume |
111 |
Issue |
8 |
Pages |
1352-1359 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
Abstract |
Reconstructed exit waves are useful to quantify unknown structure parameters such as the position and composition of the atom columns at atomic scale. Existing techniques provide a complex wave in a flat plane which is close to the plane where the electrons leave the atom columns. However, due to local deviation in the flatness of the exit surface, there will be an offset between the plane of reconstruction and the actual exit of a specific atom column. Using the channelling theory, it has been shown that this defocus offset can in principle be determined atom column-by-atom column. As such, the surface roughness could be quantified at atomic scale. However, the outcome strongly depends on the initial plane of reconstruction especially in a crystalline structure. If this plane is further away from the true exit, the waves of the atom columns become delocalized and interfere mutually which strongly complicates the interpretation of the exit wave in terms of the local structure. In this paper, we will study the delocalization with defocus using the channelling theory in a more systematic way. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
|
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Language |
|
Wos |
000300461100049 |
Publication Date |
2011-05-03 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
|
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.843 |
Times cited |
3 |
Open Access |
|
|
Notes |
Fwo |
Approved |
Most recent IF: 2.843; 2011 IF: 2.471 |
|
Call Number |
UA @ lucian @ c:irua:88941 |
Serial |
2017 |
Permanent link to this record |
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|
|
|
Author |
van den Broek, W.; Van Aert, S.; van Dyck, D. |
|
Title |
A model based atomic resolution tomographic algorithm |
Type |
A1 Journal article |
|
Year |
2009 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
Volume |
109 |
Issue |
12 |
Pages |
1485-1490 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
|
Abstract |
Tomography with high angular annular dark field scanning transmission electron microscopy at atomic resolution can be greatly improved if one is able to take advantage of prior knowledge. In this paper we present a reconstruction technique that explicitly takes into account the microscope parameters and the atomic nature of the projected object. This results in a more accurate estimate of the atomic positions and in a good resistance to noise. The reconstruction is a maximum likelihood estimator of the object. Moreover, the limits to the precision have been explored, allowing for a prediction of the amount of expected noise in the reconstruction for a certain experimental setup. We believe that the proposed reconstruction technique can be generalized to other tomographic experiments. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
|
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Language |
|
Wos |
000271840200010 |
Publication Date |
2009-08-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
|
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.843 |
Times cited |
17 |
Open Access |
|
|
Notes |
|
Approved |
Most recent IF: 2.843; 2009 IF: 2.067 |
|
Call Number |
UA @ lucian @ c:irua:78588 |
Serial |
2097 |
Permanent link to this record |
|
|
|
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Author |
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. |
|
Title |
Model-based electron microscopy : from images toward precise numbers for unknown structure parameters |
Type |
A1 Journal article |
|
Year |
2012 |
Publication |
Micron |
Abbreviated Journal |
Micron |
|
Volume |
43 |
Issue |
4 |
Pages |
509-515 |
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Keywords |
A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT); Vision lab |
|
Abstract |
Statistical parameter estimation theory is proposed as a method to quantify electron microscopy images. It aims at obtaining precise and accurate values for the unknown structure parameters including, for example, atomic column positions and types. In this theory, observations are purely considered as data planes, from which structure parameters have to be determined using a parametric model describing the images. The method enables us to measure positions of atomic columns with a precision of the order of a few picometers even though the resolution of the electron microscope is one or two orders of magnitude larger. Moreover, small differences in averaged atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark field scanning transmission electron microscopy images. Finally, it is shown how to optimize the experimental design so as to attain the highest precision. As an example, the optimization of the probe size for nanoparticle radius measurements is considered. It is also shown how to quantitatively balance signal-to-noise ratio and resolution by adjusting the probe size. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Oxford |
Editor |
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Language |
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Wos |
000301702400003 |
Publication Date |
2011-11-03 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0968-4328; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
1.98 |
Times cited |
7 |
Open Access |
|
|
Notes |
Fwo |
Approved |
Most recent IF: 1.98; 2012 IF: 1.876 |
|
Call Number |
UA @ lucian @ c:irua:94114 |
Serial |
2099 |
Permanent link to this record |
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|
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Author |
Verbeeck, J.; Van Aert, S. |
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Title |
Model based quantification of EELS spectra |
Type |
A1 Journal article |
|
Year |
2004 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
Volume |
101 |
Issue |
2/4 |
Pages |
207-224 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
Abstract |
Recent advances in model based quantification of electron energy loss spectra (EELS) are reported. The maximum likelihood method for the estimation of physical parameters describing an EELS spectrum, the validation of the model used in this estimation procedure, and the computation of the attainable precision, that is, the theoretical lower bound on the variance of these estimates, are discussed. Experimental examples on An and GaAs samples show the power of the maximum likelihood method and show that the theoretical prediction of the attainable precision can be closely approached even for spectra with overlapping edges where conventional EELS quantification fails. To provide end-users with a low threshold alternative to conventional quantification, a user friendly program was developed which is freely available under a GNU public license. (C) 2004 Elsevier B.V. All rights reserved. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
|
Place of Publication |
Amsterdam |
Editor |
|
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Language |
|
Wos |
000224046100016 |
Publication Date |
2004-07-23 |
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Series Editor |
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Series Title |
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Abbreviated Series Title ![sorted by Abbreviated Series Title field, ascending order (up)](img/sort_asc.gif) |
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Series Volume |
|
Series Issue |
|
Edition |
|
|
ISSN |
0304-3991; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
|
Impact Factor |
2.843 |
Times cited |
147 |
Open Access |
|
|
Notes |
Fwo; Iuap P5/01 |
Approved |
Most recent IF: 2.843; 2004 IF: 2.215 |
|
Call Number |
UA @ lucian @ c:irua:57130UA @ admin @ c:irua:57130 |
Serial |
2101 |
Permanent link to this record |
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|
|
|
Author |
Verbeeck, J.; Van Aert, S.; Bertoni, G. |
|
Title |
Model-based quantification of EELS spectra: including the fine structure |
Type |
A1 Journal article |
|
Year |
2006 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
|
Volume |
106 |
Issue |
11-12 |
Pages |
976-980 |
|
Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
|
Abstract |
An extension to model-based electron energy loss spectroscopy (EELS) quantification is reported to improve the possibility of modelling fine structure changes in electron energy loss spectra. An equalisation function is used in the energy loss near edge structure (ELNES) region to model the differences between a single atom differential cross section and the cross section for an atom in a crystal. The equalisation function can be shown to approximate the relative density of unoccupied states for the given excitation edge. On a set of 200 experimental h-BN spectra, this technique leads to statistically acceptable models resulting into unbiased estimates of relative concentrations and making the estimated precisions come very close to the Cramer-Rao lower bound (CRLB). The method greatly expands the useability of model-based EELS quantification to spectra with pronounced fine structure. Another benefit of this model is that one also gets an estimate of the unoccupied density of states for a given excitation edge, without having to do background removal and deconvolution, making the outcome intrinsically more reliable and less noisy. (c) 2006 Elsevier B.V. All rights reserved. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
|
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Language |
|
Wos |
000241592900004 |
Publication Date |
2006-07-04 |
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Series Editor |
|
Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0304-3991; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.843 |
Times cited |
38 |
Open Access |
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Notes |
Goa; Fwo Iap-V |
Approved |
Most recent IF: 2.843; 2006 IF: 1.706 |
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Call Number |
UA @ lucian @ c:irua:61379UA @ admin @ c:irua:61379 |
Serial |
2102 |
Permanent link to this record |
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Author |
van den Broek, W.; Van Aert, S.; van Dyck, D. |
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Title |
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy |
Type |
A1 Journal article |
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Year |
2010 |
Publication |
Ultramicroscopy |
Abbreviated Journal |
Ultramicroscopy |
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Volume |
110 |
Issue |
5 |
Pages |
548-554 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract |
Depth sectioning in high angular annular dark field scanning transmission electron microscopy is considered a candidate for three-dimensional characterization on the atomic scale. However at present the depth resolution is still far from the atomic level, due to strong limitations in the opening angle of the beam. In this paper we introduce a new, parameter based tomographic reconstruction algorithm that allows to make maximal use of the prior knowledge about the constituent atom types and the microscope settings, so as to retrieve the atomic positions and push the resolution to the atomic level in all three dimensions. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Amsterdam |
Editor |
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Language |
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Wos |
000279065700022 |
Publication Date |
2009-09-21 |
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Series Editor |
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Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0304-3991; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.843 |
Times cited |
16 |
Open Access |
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Notes |
Fwo |
Approved |
Most recent IF: 2.843; 2010 IF: 2.063 |
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Call Number |
UA @ lucian @ c:irua:83690 |
Serial |
2104 |
Permanent link to this record |
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Author |
Schryvers, D.; Shi, H.; Martinez, G.T.; Van Aert, S.; Frenzel, J.; Van Humbeeck, J. |
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Title |
Nano- and microcrystal investigations of precipitates, interfaces and strain fields in Ni-Ti-Nb by various TEM techniques |
Type |
P1 Proceeding |
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Year |
2013 |
Publication |
Materials science forum
T2 – 9th European Symposium on Martensitic Transformations (ESOMAT 2012), SEP 09-16, 2012, St Petersburg, RUSSIA |
Abbreviated Journal |
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Volume |
738/739 |
Issue |
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Pages |
65-71 |
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Keywords |
P1 Proceeding; Electron microscopy for materials research (EMAT) |
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Abstract |
In the present contribution several advanced electron microscopy techniques are employed in order to describe chemical and structural features of the nano- and microstructure of a Ni45.5Ti45.5Nb9 alloy. A line-up of Nb-rich nano-precipitates is found in the Ni-Ti-rich austenite of as-cast material. Concentration changes of the matrix after annealing are correlated with changes in the transformation temperatures. The formation of rows and plates of larger Nb-rich precipitates and particles is described. The interaction of a twinned martensite plate with a Nb-rich nano-precipitate is discussed and the substitution of Nb atoms on the Ti-sublattice in the matrix is confirmed. |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
Lausanne |
Editor |
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Language |
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Wos |
000316089000011 |
Publication Date |
2013-03-11 |
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Series Editor |
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Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
1662-9752; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
2 |
Open Access |
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Notes |
Fwo |
Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:104692 |
Serial |
2247 |
Permanent link to this record |
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Author |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
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Title |
The notion of resolution |
Type |
H3 Book chapter |
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Year |
2008 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1228-1265 |
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Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:68656 |
Serial |
2370 |
Permanent link to this record |
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Author |
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. |
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Title |
The notion of resolution |
Type |
H3 Book chapter |
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Year |
2007 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1228-1265 |
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Keywords |
H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:68657 |
Serial |
2371 |
Permanent link to this record |
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Author |
van Dyck, D.; Van Aert, S.; Croitoru, M.D. |
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Title |
Obstacles on the road towards atomic resolution tomography |
Type |
A3 Journal article |
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Year |
2005 |
Publication |
Microscoy and microanalysis |
Abbreviated Journal |
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Volume |
11 |
Issue |
S2 |
Pages |
238-239 |
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Keywords |
A3 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab |
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Abstract |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Wos |
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Publication Date |
0000-00-00 |
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Series Editor |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
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Call Number |
UA @ lucian @ c:irua:57129 |
Serial |
2426 |
Permanent link to this record |