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Author | Fatermans, J.; Romolini, G.; Altantzis, T.; Hofkens, J.; Roeffaers, M.B.J.; Bals, S.; Van Aert, S. | ||||
Title | Atomic-scale detection of individual lead clusters confined in Linde Type A zeolites | Type | A1 Journal article | ||
Year | 2022 | Publication | Nanoscale | Abbreviated Journal | Nanoscale |
Volume | Issue | Pages | |||
Keywords | A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT); Applied Electrochemistry & Catalysis (ELCAT) | ||||
Abstract | Structural analysis of metal clusters confined in nanoporous materials is typically performed by X-ray-driven techniques. Although X-ray analysis has proved its strength in the characterization of metal clusters, it provides averaged structural information. Therefore, we here present an alternative workflow for bringing the characterization of confined metal clusters towards the local scale. This workflow is based on the combination of aberration-corrected transmission electron microscopy (TEM), TEM image simulations, and powder X-ray diffraction (XRD) with advanced statistical techniques. In this manner, we were able to characterize the clustering of Pb atoms in Linde Type A (LTA) zeolites with Pb loadings as low as 5 wt%. Moreover, individual Pb clusters could be directly detected. The proposed methodology thus enables a local-scale characterization of confined metal clusters in zeolites. This is important for further elucidation of the connection between the structure and the physicochemical properties of such systems. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | 000809619900001 | Publication Date | 0000-00-00 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 2040-3364 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 6.7 | Times cited | 2 | Open Access | OpenAccess |
Notes | The authors acknowledge the Research Foundation Flanders through project fundings (FWO, G026718N, G050218N, ZW15_09-G0H6316N, and W002221N) and through a PhD scholarship to G.R. (grant 11C6920N), as well as iBOF-21-085 PERSIST. T.A. and S.V.A. acknowledge funding from the University of Antwerp Research fund (BOF). J.H. acknowledges the Flemish government through long-term structural funding Methusalem (CASAS2, Meth/15/04) and the MPI as MPI fellow. M.R. acknowledges funding by the KU Leuven Research Fund (C14/19/079). S.B. and S.V.A. acknowledge funding from the European Research Council under the European Union’s Horizon 2020 research and innovation program (ERC Consolidator Grants No. 815128−REALNANO and No. 770887−PICOMETRICS). The authors thank Dr. D. Chernyshov for the collection of XRD measurements. | Approved | Most recent IF: 6.7 | ||
Call Number | EMAT @ emat @c:irua:189061 | Serial | 7076 | ||
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Author | Goris, B.; de Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, K.J.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Aert, S.; Bals, S.; Sijbers, J.; Van Tendeloo, G. | ||||
Title | Measuring lattice strain in three dimensions through electron microscopy | Type | A1 Journal article | ||
Year | 2015 | Publication | Nano letters | Abbreviated Journal | Nano Lett |
Volume | 15 | Issue | 15 | Pages | 6996-7001 |
Keywords | A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizations of nanostructures at the atomic level, a reliable determination of lattice strain is not straightforward. We therefore propose a novel model-based approach from which atomic coordinates are measured. Our findings demonstrate the importance of investigating lattice strain in 3D. | ||||
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Publisher | Place of Publication | Washington | Editor | ||
Language | Wos | 000363003100108 | Publication Date | 2015-09-04 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1530-6984;1530-6992; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 12.712 | Times cited | 87 | Open Access | OpenAccess |
Notes | Fwo; 335078 Colouratom; 267867 Plasmaquo; 312483 Esteem2; 262348 Esmi; esteem2jra4; ECASSara; (ROMEO:white; preprint:; postprint:restricted 12 months embargo; pdfversion:cannot); | Approved | Most recent IF: 12.712; 2015 IF: 13.592 | ||
Call Number | c:irua:127639 c:irua:127639 | Serial | 1965 | ||
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Author | Bals, S.; Casavola, M.; van Huis, M.A.; Van Aert, S.; Batenburg, K.J.; Van Tendeloo, G.; Vanmaekelbergh, D. | ||||
Title | Three-dimensional atomic imaging of colloidal core-shell nanocrystals | Type | A1 Journal article | ||
Year | 2011 | Publication | Nano letters | Abbreviated Journal | Nano Lett |
Volume | 11 | Issue | 8 | Pages | 3420-3424 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Colloidal coreshell semiconductor nanocrystals form an important class of optoelectronic materials, in which the exciton wave functions can be tailored by the atomic configuration of the core, the interfacial layers, and the shell. Here, we provide a trustful 3D characterization at the atomic scale of a free-standing PbSe(core)CdSe(shell) nanocrystal by combining electron microscopy and discrete tomography. Our results yield unique insights for understanding the process of cation exchange, which is widely employed in the synthesis of coreshell nanocrystals. The study that we present is generally applicable to the broad range of colloidal heteronanocrystals that currently emerge as a new class of materials with technological importance. | ||||
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Publisher | Place of Publication | Washington | Editor | ||
Language | Wos | 000293665600062 | Publication Date | 2011-07-25 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1530-6984;1530-6992; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 12.712 | Times cited | 121 | Open Access | |
Notes | Esteem 026019; Fwo | Approved | Most recent IF: 12.712; 2011 IF: 13.198 | ||
Call Number | UA @ lucian @ c:irua:91263 | Serial | 3643 | ||
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Author | Goris, B.; de Backer, A.; Van Aert, S.; Gómez-Graña, S.; Liz-Marzán, L.M.; Van Tendeloo, G.; Bals, S. | ||||
Title | Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals | Type | A1 Journal article | ||
Year | 2013 | Publication | Nano letters | Abbreviated Journal | Nano Lett |
Volume | 13 | Issue | 9 | Pages | 4236-4241 |
Keywords | A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) | ||||
Abstract | A thorough understanding of the three-dimensional (3D) atomic structure and composition of coreshell nanostructures is indispensable to obtain a deeper insight on their physical behavior. Such 3D information can be reconstructed from two-dimensional (2D) projection images using electron tomography. Recently, different electron tomography techniques have enabled the 3D characterization of a variety of nanostructures down to the atomic level. However, these methods have all focused on the investigation of nanomaterials containing only one type of chemical element. Here, we combine statistical parameter estimation theory with compressive sensing based tomography to determine the positions and atom type of each atom in heteronanostructures. The approach is applied here to investigate the interface in coreshell Au@Ag nanorods but it is of great interest in the investigation of a broad range of nanostructures. | ||||
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Publisher | Place of Publication | Washington | Editor | ||
Language | Wos | 000330158900043 | Publication Date | 2013-08-16 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1530-6984;1530-6992; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 12.712 | Times cited | 90 | Open Access | |
Notes | FWO; 246791 COUNTATOMS; 267867 PLASMAQUO; 262348 ESMI; 312483 ESTEEM2; Hercules 3; esteem2_jra4 | Approved | Most recent IF: 12.712; 2013 IF: 12.940 | ||
Call Number | UA @ lucian @ c:irua:110036 | Serial | 3650 | ||
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Author | Altantzis, T.; Lobato, I.; De Backer, A.; Béché, A.; Zhang, Y.; Basak, S.; Porcu, M.; Xu, Q.; Sánchez-Iglesias, A.; Liz-Marzán, L.M.; Van Tendeloo, G.; Van Aert, S.; Bals, S. | ||||
Title | Three-Dimensional Quantification of the Facet Evolution of Pt Nanoparticles in a Variable Gaseous Environment | Type | A1 Journal article | ||
Year | 2019 | Publication | Nano letters | Abbreviated Journal | Nano Lett |
Volume | 19 | Issue | 19 | Pages | 477-481 |
Keywords | A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) | ||||
Abstract | Pt nanoparticles play an essential role in a wide variety of catalytic reactions. The activity of the particles strongly depends on their three-dimensional (3D) structure and exposed facets, as well as on the reactive environment. High-resolution electron microscopy has often been used to characterize nanoparticle catalysts but unfortunately most observations so far have been either performed in vacuum and/or using conventional (2D) in situ microscopy. The latter however does not provide direct 3D morphological information. We have implemented a quantitative methodology to measure variations of the 3D atomic structure of nanoparticles under the flow of a selected gas. We were thereby able to quantify refaceting of Pt nanoparticles with atomic resolution during various oxidation−reduction cycles. In a H2 environment, a more faceted surface morphology of the particles was observed with {100} and {111} planes being dominant. On the other hand, in O2 the percentage of {100} and {111} facets decreased and a significant increase of higher order facets was found, resulting in a more rounded morphology. This methodology opens up new opportunities toward in situ characterization of catalytic nanoparticles because for the first time it enables one to directly measure 3D morphology variations at the atomic scale in a specific gaseous reaction environment. | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | 000455561300061 | Publication Date | 2019-01-09 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1530-6984 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 12.712 | Times cited | 82 | Open Access | OpenAccess |
Notes | This work was supported by the European Research Council (Grant 335078 COLOURATOM to S.B. and Grant 770887 PICOMETRICS to S.V.A.). The authors acknowledge funding from the European Commission Grant (EUSMI 731019 to S.B., L.M.L.-M., and Q.X. and MUMMERING 765604 to S.B. and Q.X.). The authors gratefully acknowledge funding from the Research Foundation Flanders (FWO, Belgium) through project fundings (G.0368.15N, G.0369.15N, and G.0267.18N), postdoctoral grants to T.A. and A.D.B, and an FWO [PEGASUS]2 Marie Sklodowska-Curie fellowship to Y.Z. (12U4917N). L.M.L.-M. acknowledges funding from the Spanish Ministerio de Economía y Competitividad (Grant MAT2017-86659-R). We gratefully acknowledge the support of NVIDIA Corporation with the donation of the Titan X Pascal GPU used for this research. ecas_sara Realnano 815128; sygma | Approved | Most recent IF: 12.712 | ||
Call Number | EMAT @ emat @UA @ admin @ c:irua:156390 | Serial | 5150 | ||
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Author | Bals, S.; Goris, B.; de Backer, A.; Van Aert, S.; Van Tendeloo, G. | ||||
Title | Atomic resolution electron tomography | Type | A1 Journal article | ||
Year | 2016 | Publication | MRS bulletin | Abbreviated Journal | Mrs Bull |
Volume | 41 | Issue | 41 | Pages | 525-530 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | Over the last two decades, three-dimensional (3D) imaging by transmission electron microscopy or “electron tomography” has evolved into a powerful tool to investigate a variety of nanomaterials in different fields, such as life sciences, chemistry, solid-state physics, and materials science. Most of these results were obtained with nanometer-scale resolution, but different approaches have recently pushed the resolution to the atomic level. Such information is a prerequisite to understand the specific relationship between the atomic structure and the physicochemical properties of (nano) materials. We provide an overview of the latest progress in the field of atomic-resolution electron tomography. Different imaging and reconstruction approaches are presented, and state-of-the-art results are discussed. This article demonstrates the power and importance of electron tomography with atomic-scale resolution. | ||||
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Publisher | Place of Publication | Pittsburgh, Pa | Editor | ||
Language | Wos | 000382508100012 | Publication Date | 2016-07-07 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0883-7694 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 5.199 | Times cited | 19 | Open Access | OpenAccess |
Notes | ; The authors gratefully acknowledge funding from the Research Foundation Flanders (G.0381.16N, G.036915, G.0374.13, and funding of postdoctoral grants to B.G. and A.D.B.). S.B. acknowledges the European Research Council, ERC Grant Number 335078-Colouratom. The research leading to these results received funding from the European Union Seventh Framework Program under Grant Agreements 312483 (ESTEEM2). The authors would like to thank the colleagues who have contributed to this work, including K.J. Batenburg, J. De Beenhouwer, R. Erni, M.D. Rossell, W. Van den Broek, L. Liz-Marzan, E. Carbo-Argibay, S. Gomez-Grana, P. Lievens, M. Van Bael, B. Partoens, B. Schoeters, and J. Sijbers. ; ecas_sara | Approved | Most recent IF: 5.199 | ||
Call Number | UA @ lucian @ c:irua:135690 | Serial | 4299 | ||
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Author | Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. | ||||
Title | Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy | Type | A1 Journal article | ||
Year | 2009 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | 15 | Issue | S:2 | Pages | 464-465 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
Language | Wos | 000208119100230 | Publication Date | 2009-07-27 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.891 | Times cited | 1 | Open Access | |
Notes | Approved | Most recent IF: 1.891; 2009 IF: 3.035 | |||
Call Number | UA @ lucian @ c:irua:96555UA @ admin @ c:irua:96555 | Serial | 178 | ||
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Author | Verbeeck, J.; Van Aert, S.; Zhang, L.; Haiyan, T.; Schattschneider, P.; Rosenauer, A. | ||||
Title | Computational aspects in quantitative EELS | Type | A1 Journal article | ||
Year | 2010 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | 16 | Issue | S:2 | Pages | 240-241 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
Language | Wos | Publication Date | 2010-08-26 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record | |
Impact Factor | 1.891 | Times cited | Open Access | ||
Notes | Approved | Most recent IF: 1.891; 2010 IF: 3.259 | |||
Call Number | UA @ lucian @ c:irua:96556UA @ admin @ c:irua:96556 | Serial | 454 | ||
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Author | van den Broek, W.; Van Aert, S.; van Dyck, D. | ||||
Title | Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency | Type | A1 Journal article | ||
Year | 2012 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | 18 | Issue | 2 | Pages | 336-342 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | The charge-coupled devices used in electron microscopy are coated with a scintillating crystal that gives rise to a severe modulation transfer function (MTF). Exact knowledge of the MTF is imperative for a good correspondence between image simulation and experiment. We present a practical method to measure the MTF above the Nyquist frequency from the beam blocker's shadow image. The image processing has been fully automated and the program is made public. The method is successfully tested on three cameras with various beam blocker shapes. | ||||
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Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
Language | Wos | 000302084700011 | Publication Date | 2012-02-14 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.891 | Times cited | 15 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 1.891; 2012 IF: 2.495 | ||
Call Number | UA @ lucian @ c:irua:96557 | Serial | 1297 | ||
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Author | van Dyck, D.; Van Aert, S.; den Dekker, A.J. | ||||
Title | Physical limits on atomic resolution | Type | A1 Journal article | ||
Year | 2004 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | 10 | Issue | Pages | 153-157 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
Language | Wos | 000188882100022 | Publication Date | 2004-08-11 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.891 | Times cited | 14 | Open Access | |
Notes | Approved | Most recent IF: 1.891; 2004 IF: 2.389 | |||
Call Number | UA @ lucian @ c:irua:47515 | Serial | 2616 | ||
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Author | Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G. | ||||
Title | Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy | Type | A1 Journal article | ||
Year | 2007 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | 13 | Issue | S:3 | Pages | 332-333 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
Language | Wos | Publication Date | 2008-02-13 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record | |
Impact Factor | 1.891 | Times cited | Open Access | ||
Notes | Approved | Most recent IF: 1.891; 2007 IF: 1.941 | |||
Call Number | UA @ lucian @ c:irua:96553 | Serial | 3224 | ||
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Author | Batenburg, K.J.; Bals, S.; Van Aert, S.; Roelandts, T.; Sijbers, J. | ||||
Title | Ultra-high resolution electron tomography for materials science : a roadmap | Type | A1 Journal article | ||
Year | 2011 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | 17 | Issue | S:2 | Pages | 934-935 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
Language | Wos | Publication Date | 2011-10-07 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record | |
Impact Factor | 1.891 | Times cited | Open Access | ||
Notes | Approved | Most recent IF: 1.891; 2011 IF: 3.007 | |||
Call Number | UA @ lucian @ c:irua:96554 | Serial | 3792 | ||
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Author | Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. | ||||
Title | Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM | Type | A1 Journal article | ||
Year | 2014 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | 20 | Issue | S3 | Pages | 126-127 |
Keywords | A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT) | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
Language | Wos | Publication Date | 2014-08-27 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276 | ISBN | Additional Links | UA library record | |
Impact Factor | 1.891 | Times cited | Open Access | ||
Notes | Approved | Most recent IF: 1.891; 2014 IF: 1.877 | |||
Call Number | UA @ lucian @ c:irua:136445 | Serial | 4500 | ||
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Author | Yu, C.-P.; Friedrich, T.; Jannis, D.; Van Aert, S.; Verbeeck, J. | ||||
Title | Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM | Type | A1 Journal article | ||
Year | 2022 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | Issue | Pages | 1-12 | ||
Keywords | A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) | ||||
Abstract | A real-time image reconstruction method for scanning transmission electron microscopy (STEM) is proposed. With an algorithm requiring only the center of mass of the diffraction pattern at one probe position at a time, it is able to update the resulting image each time a new probe position is visited without storing any intermediate diffraction patterns. The results show clear features at high spatial frequency, such as atomic column positions. It is also demonstrated that some common post-processing methods, such as band-pass filtering, can be directly integrated in the real-time processing flow. Compared with other reconstruction methods, the proposed method produces high-quality reconstructions with good noise robustness at extremely low memory and computational requirements. An efficient, interactive open source implementation of the concept is further presented, which is compatible with frame-based, as well as event-based camera/file types. This method provides the attractive feature of immediate feedback that microscope operators have become used to, for example, conventional high-angle annular dark field STEM imaging, allowing for rapid decision-making and fine-tuning to obtain the best possible images for beam-sensitive samples at the lowest possible dose. | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | 000792176100001 | Publication Date | 2022-04-25 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.8 | Times cited | 7 | Open Access | OpenAccess |
Notes | Bijzonder Onderzoeksfonds UGent; H2020 European Research Council, 770887 ; H2020 European Research Council, 823717 ; H2020 European Research Council, ESTEEM3 / 823717 ; H2020 European Research Council, PICOMETRICS / 770887 ; Fonds Wetenschappelijk Onderzoek, 30489208 ; Herculesstichting; esteem3reported; esteem3jra | Approved | Most recent IF: 2.8 | ||
Call Number | EMAT @ emat @c:irua:188538 | Serial | 7068 | ||
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Author | De wael, A.; De Backer, A.; Yu, C.-P.; Sentürk, D.G.; Lobato, I.; Faes, C.; Van Aert, S. | ||||
Title | Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM | Type | A1 Journal article | ||
Year | 2022 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
Volume | Issue | Pages | 1-9 | ||
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | A decade ago, a statistics-based method was introduced to count the number of atoms from annular dark-field scanning transmission electron microscopy (ADF STEM) images. In the past years, this method was successfully applied to nanocrystals of arbitrary shape, size, and composition (and its high accuracy and precision has been demonstrated). However, the counting results obtained from this statistical framework are so far presented without a visualization of the actual uncertainty about this estimate. In this paper, we present three approaches that can be used to represent counting results together with their statistical error, and discuss which approach is most suited for further use based on simulations and an experimental ADF STEM image. | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | 000854930500001 | Publication Date | 2022-09-19 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1431-9276 | ISBN | Additional Links | UA library record; WoS full record | |
Impact Factor | 2.8 | Times cited | Open Access | OpenAccess | |
Notes | This project has received funding from the European Research Council (ERC) under the European Union's Horizon 2020 research and innovation programme (Grant Agreement No. 770887 and No. 823717 ESTEEM3). The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through grants to A.D.w. and A.D.B. and projects G.0502.18N, G.0267.18N, and EOS 30489208. S.V.A. acknowledges TOP BOF funding from the University of Antwerp. The authors are grateful to L.M. Liz-Marzán (CIC biomaGUNE and Ikerbasque) for providing the samples. esteem3reported; esteem3jra | Approved | Most recent IF: 2.8 | ||
Call Number | EMAT @ emat @c:irua:190585 | Serial | 7119 | ||
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Author | Martinez, G.T.; de Backer, A.; Rosenauer, A.; Verbeeck, J.; Van Aert, S. | ||||
Title | The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images | Type | A1 Journal article | ||
Year | 2014 | Publication | Micron | Abbreviated Journal | Micron |
Volume | 63 | Issue | Pages | 57-63 | |
Keywords | A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT) | ||||
Abstract | Quantitative structural and chemical information can be obtained from high angle annular dark field scanning transmission electron microscopy (HAADF STEM) images when using statistical parameter estimation theory. In this approach, we assume an empirical parameterized imaging model for which the total scattered intensities of the atomic columns are estimated. These intensities can be related to the material structure or composition. Since the experimental probe profile is assumed to be known in the description of the imaging model, we will explore how the uncertainties in the probe profile affect the estimation of the total scattered intensities. Using multislice image simulations, we analyze this effect for Cs corrected and non-Cs corrected microscopes as a function of inaccuracies in cylindrically symmetric aberrations, such as defocus and spherical aberration of third and fifth order, and non-cylindrically symmetric aberrations, such as 2-fold and 3-fold astigmatism and coma. | ||||
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Publisher | Place of Publication | Oxford | Editor | ||
Language | Wos | 000338402500011 | Publication Date | 2014-01-02 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.98 | Times cited | 25 | Open Access | |
Notes | FWO (G.0393.11; G.0064.10; G.0374.13; G.0044.13); European Research Council under the 7th Framework Program (FP7); ERC GrantNo. 246791-COUNTATOMS and ERC Starting Grant No. 278510-VORTEX. A.R. thanks the DFG under contract number RO2057/8-1.The research leading to these results has received funding fromthe European Union 7th Framework Programme [FP7/2007-2013]under grant agreement no. 312483 (ESTEEM2).; esteem2ta ECASJO; | Approved | Most recent IF: 1.98; 2014 IF: 1.988 | ||
Call Number | UA @ lucian @ c:irua:113857UA @ admin @ c:irua:113857 | Serial | 831 | ||
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Author | Van Aert, S.; den Dekker, A.J.; van Dyck, D. | ||||
Title | How to optimize the experimental design of quantitative atomic resolution TEM experiments? | Type | A1 Journal article | ||
Year | 2004 | Publication | Micron | Abbreviated Journal | Micron |
Volume | 35 | Issue | Pages | 425-429 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | 000221721000005 | Publication Date | 2004-03-06 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.98 | Times cited | 14 | Open Access | |
Notes | Approved | Most recent IF: 1.98; 2004 IF: 1.464 | |||
Call Number | UA @ lucian @ c:irua:47514 | Serial | 1495 | ||
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Author | Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. | ||||
Title | Model-based electron microscopy : from images toward precise numbers for unknown structure parameters | Type | A1 Journal article | ||
Year | 2012 | Publication | Micron | Abbreviated Journal | Micron |
Volume | 43 | Issue | 4 | Pages | 509-515 |
Keywords | A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | Statistical parameter estimation theory is proposed as a method to quantify electron microscopy images. It aims at obtaining precise and accurate values for the unknown structure parameters including, for example, atomic column positions and types. In this theory, observations are purely considered as data planes, from which structure parameters have to be determined using a parametric model describing the images. The method enables us to measure positions of atomic columns with a precision of the order of a few picometers even though the resolution of the electron microscope is one or two orders of magnitude larger. Moreover, small differences in averaged atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark field scanning transmission electron microscopy images. Finally, it is shown how to optimize the experimental design so as to attain the highest precision. As an example, the optimization of the probe size for nanoparticle radius measurements is considered. It is also shown how to quantitatively balance signal-to-noise ratio and resolution by adjusting the probe size. | ||||
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Publisher | Place of Publication | Oxford | Editor | ||
Language | Wos | 000301702400003 | Publication Date | 2011-11-03 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.98 | Times cited | 7 | Open Access | |
Notes | Fwo | Approved | Most recent IF: 1.98; 2012 IF: 1.876 | ||
Call Number | UA @ lucian @ c:irua:94114 | Serial | 2099 | ||
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Author | Guzzinati, G.; Altantzis, T.; Batuk, M.; De Backer, A.; Lumbeeck, G.; Samaee, V.; Batuk, D.; Idrissi, H.; Hadermann, J.; Van Aert, S.; Schryvers, D.; Verbeeck, J.; Bals, S. | ||||
Title | Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp | Type | A1 Journal article | ||
Year | 2018 | Publication | Materials | Abbreviated Journal | Materials |
Volume | 11 | Issue | 11 | Pages | 1304 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | The rapid progress in materials science that enables the design of materials down to the nanoscale also demands characterization techniques able to analyze the materials down to the same scale, such as transmission electron microscopy. As Belgium’s foremost electron microscopy group, among the largest in the world, EMAT is continuously contributing to the development of TEM techniques, such as high-resolution imaging, diffraction, electron tomography, and spectroscopies, with an emphasis on quantification and reproducibility, as well as employing TEM methodology at the highest level to solve real-world materials science problems. The lab’s recent contributions are presented here together with specific case studies in order to highlight the usefulness of TEM to the advancement of materials science. | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | 000444112800041 | Publication Date | 2018-07-28 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1996-1944 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.654 | Times cited | 15 | Open Access | OpenAccess |
Notes | Fonds Wetenschappelijk Onderzoek, G.0502.18N, G.0267.18N, G.0120.12N, G.0365.15N, G.0934.17N, S.0100.18N AUHA13009 ; European Research Council, COLOURATOM 335078 ; Universiteit Antwerpen, GOA Solarpaint ; G. Guzzinati, T. Altantzis and A. De Backer have been supported by postdoctoral fellowship grants from the Research Foundation Flanders (FWO). Funding was also received from the European Research Council (starting grant no. COLOURATOM 335078), the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation programme (grant agreement no. 770887), the Research Foundation Flanders (FWO, Belgium) through project fundings (G.0502.18N, G.0267.18N, G.0120.12N, G.0365.15N, G.0934.17N, S.0100.18N, G.0401.16N) and from the University of Antwerp through GOA project Solarpaint. Funding for the TopSPIN precession system under grant AUHA13009, as well as for the Qu-Ant-EM microscope, is acknowledged from the HERCULES Foundation. H. Idrissi is mandated by the Belgian National Fund for Scientific Research (F.R.S.-FNRS). (ROMEO:green; preprint:; postprint:can ; pdfversion:can); saraecas; ECAS_Sara; | Approved | Most recent IF: 2.654 | ||
Call Number | EMAT @ emat @c:irua:153737UA @ admin @ c:irua:153737 | Serial | 5064 | ||
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Author | De Backer, A.; van den Bos, K.H.W.; Van den Broek, W.; Sijbers, J.; Van Aert, S. | ||||
Title | StatSTEM: An efficient program for accurate and precise model-based quantification of atomic resolution electron microscopy images | Type | P1 Proceeding | ||
Year | 2017 | Publication | Journal of physics : conference series T2 – Electron Microscopy and Analysis Group Conference 2017 (EMAG2017), 3-6 July 2017, Manchester, UK | Abbreviated Journal | J. Phys.: Conf. Ser. |
Volume | 902 | Issue | Pages | 012013 | |
Keywords | P1 Proceeding; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | An efficient model-based estimation algorithm is introduced in order to quantify the atomic column positions and intensities from atomic resolution (scanning) transmission electron microscopy ((S)TEM) images. This algorithm uses the least squares estimator on image segments containing individual columns fully accounting for the overlap between neighbouring columns, enabling the analysis of a large field of view. For this algorithm, the accuracy and precision with which measurements for the atomic column positions and scattering cross-sections from annular dark field (ADF) STEM images can be estimated, is investigated. The highest attainable precision is reached even for low dose images. Furthermore, advantages of the model- based approach taking into account overlap between neighbouring columns are highlighted. To provide end-users this well-established quantification method, a user friendly program, StatSTEM, is developed which is freely available under a GNU public license. | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | 000416370700013 | Publication Date | 2017-10-16 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1742-6588 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | Times cited | 1 | Open Access | OpenAccess | |
Notes | The authors acknowledge nancial support from the Research Foundation Flanders (FWO, Belgium) through project funding (G.0374.13N, G.0368.15N, G.0369.15N, WO.010.16N) and a PhD research grant to K H W van den Bos, and a postdoctoral research grant to A De Backer. The research leading to these results has received funding from the European Union Seventh Framework Programme under Grant Agreement 312483 – ESTEEM2 (Integrated Infrastructure Initiative-I3). A Rosenauer is acknowledged for providing the STEMsim program. | Approved | Most recent IF: NA | ||
Call Number | EMAT @ emat @c:irua:147188 | Serial | 4764 | ||
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Author | Teunissen, J.L.; Braeckevelt, T.; Skvortsova, I.; Guo, J.; Pradhan, B.; Debroye, E.; Roeffaers, M.B.J.; Hofkens, J.; Van Aert, S.; Bals, S.; Rogge, S.M.J.; Van Speybroeck, V. | ||||
Title | Additivity of Atomic Strain Fields as a Tool to Strain-Engineering Phase-Stabilized CsPbI3Perovskites | Type | A1 Journal Article | ||
Year | 2023 | Publication | The Journal of Physical Chemistry C | Abbreviated Journal | J. Phys. Chem. C |
Volume | 127 | Issue | 48 | Pages | 23400-23411 |
Keywords | A1 Journal Article; Electron Microscopy for Materials Science (EMAT) ; | ||||
Abstract | CsPbI3 is a promising perovskite material for photovoltaic applications in its photoactive perovskite or black phase. However, the material degrades to a photovoltaically inactive or yellow phase at room temperature. Various mitigation strategies are currently being developed to increase the lifetime of the black phase, many of which rely on inducing strains in the material that hinder the black-to-yellow phase transition. Physical insight into how these strategies exactly induce strain as well as knowledge of the spatial extent over which these strains impact the material is crucial to optimize these approaches but is still lacking. Herein, we combine machine learning potential-based molecular dynamics simulations with our in silico strain engineering approach to accurately quantify strained large-scale atomic structures on a nanosecond time scale. To this end, we first model the strain fields introduced by atomic substitutions as they form the most elementary strain sources. We demonstrate that the magnitude of the induced strain fields decays exponentially with the distance from the strain source, following a decay rate that is largely independent of the specific substitution. Second, we show that the total strain field induced by multiple strain sources can be predicted to an excellent approximation by summing the strain fields of each individual source. Finally, through a case study, we illustrate how this additive character allows us to explain how complex strain fields, induced by spatially extended strain sources, can be predicted by adequately combining the strain fields caused by local strain sources. Hence, the strain additivity proposed here can be adopted to further our insight into the complex strain behavior in perovskites and to design strain from the atomic level onward to enhance their sought-after phase stability. | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | 001116862000001 | Publication Date | 2023-12-07 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1932-7447 | ISBN | Additional Links | UA library record; WoS full record | |
Impact Factor | 3.7 | Times cited | Open Access | OpenAccess | |
Notes | This work was supported by iBOF-21-085 PERsist (Special Research Fund of Ghent University, KU Leuven Research Fund, and the Research Fund of the University of Antwerp). S.M.J.R., T.B., and B.P. acknowledge financial support from the Research Foundation-Flanders (FWO) through two postdoctoral fellow- ships [grant nos. 12T3522N (S.M.J.R.) and 1275521N (B.P.)] and an SB-FWO fellowship [grant no. 1SC1319 (T.B.)]. E.D., M.B.J.R., and J.H. acknowledge financial support from the Research Foundation-Flanders (FWO, grant nos. G.0B39.15, G.0B49.15, G098319N, S002019N, S004322N, and ZW15_09- GOH6316). J.H. acknowledges support from the Flemish government through long-term structural funding Methusalem (CASAS2, Meth/15/04) and the MPI as an MPI fellow. S.V.A. and S.B. acknowledge financial support from the Research Foundation-Flanders (FWO, grant no. G0A7723N). S.M.J.R. and V.V.S. acknowledge funding from the Research Board of Ghent University (BOF). The computational resources and services used in this work were provided by the VSC (Flemish Supercomputer Center), funded by the Research Foundation- Flanders (FWO) and the Flemish Government�department EWI.; KU Leuven, iBOF-21-085 PERsist ; Universiteit Antwerpen, iBOF-21-085 PERsist ; Universiteit Gent, iBOF-21-085 PERsist ; Vlaamse regering, CASAS2, Meth/15/04 ; Fonds Wetenschappelijk Onderzoek, G.0B39.15 G098319N G.0B49.15 1SC1319 12T3522N ZW15 09-GOH6316 G0A7723N 1275521N S004322N S002019N ; | Approved | Most recent IF: 3.7; 2023 IF: 4.536 | ||
Call Number | EMAT @ emat @c:irua:202124 | Serial | 8985 | ||
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Author | Delfino, C.L.; Hao, Y.; Martin, C.; Minoia, A.; Gopi, E.; Mali, K.S.; Van der Auweraer, M.; Geerts, Y.H.; Van Aert, S.; Lazzaroni, R.; De Feyter, S. | ||||
Title | Conformation-Dependent Monolayer and Bilayer Structures of an Alkylated TTF Derivative Revealed using STM and Molecular Modeling | Type | A1 Journal Article | ||
Year | 2023 | Publication | The Journal of Physical Chemistry C | Abbreviated Journal | J. Phys. Chem. C |
Volume | 127 | Issue | 47 | Pages | 23023-23033 |
Keywords | A1 Journal Article; Electron Microscopy for Materials Science (EMAT) ; | ||||
Abstract | In this study, the multi-layer self-assembled molecular network formation of an alkylated tetrathiafulvalene compound is studied at the liquid-solid interface between 1-phenyloctane and graphite. A combined theoretical/experimental approach associating force-field and quantum-chemical calculations with scanning tunnelling microscopy is used to determine the two-dimensional self-assembly beyond the monolayer, but also to further the understanding of the molecular adsorption conformation and its impact on the molecular packing within the assemblies at the monolayer and bilayer level. | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | 001111637100001 | Publication Date | 2023-11-30 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1932-7447 | ISBN | Additional Links | UA library record; WoS full record | |
Impact Factor | 3.7 | Times cited | Open Access | OpenAccess | |
Notes | Financial support from the Research Foundation-Flanders (FWO G081518N, G0A3220N) and KU Leuven–Internal Funds (C14/19/079) is acknowledged. This work was in part supported by FWO and F. R. S.-FNRS under the Excellence of Science EOS program (project 30489208 and 40007495). C.M. acknowledges the financial support: Grants PID2021-128761OA-C22 and CNS2022-136052 funded by MCIN/AEI/10.13039/501100011033 by the “European Union” and SBPLY/21/180501/000127 funded by JCCM and by the EU through “Fondo Europeo de Desarollo Regional” (FEDER). Research in Mons is also supported by the Belgian National Fund for Scientific Research (FRS-FNRS) within the Consortium des Équipements de Calcul Intensif – CÉCI, under Grant 2.5020.11, and by the Walloon Region (ZENOBE Tier-1 supercomputer, under grant 1117545). | Approved | Most recent IF: 3.7; 2023 IF: 4.536 | ||
Call Number | EMAT @ emat @c:irua:201671 | Serial | 8974 | ||
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Author | Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. | ||||
Title | High-resolution electron microscopy and electron tomography: resolution versus precision | Type | A1 Journal article | ||
Year | 2002 | Publication | Journal of structural biology | Abbreviated Journal | J Struct Biol |
Volume | 138 | Issue | Pages | 21-33 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
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Publisher | Place of Publication | New York | Editor | ||
Language | Wos | 000177978800003 | Publication Date | 2002-09-17 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1047-8477; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.767 | Times cited | 33 | Open Access | |
Notes | Approved | Most recent IF: 2.767; 2002 IF: 4.194 | |||
Call Number | UA @ lucian @ c:irua:47520 | Serial | 1446 | ||
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Author | Boschker, H.; Huijben, M.; Vailinois, A.; Verbeeck, J.; Van Aert, S.; Luysberg, M.; Bals, S.; Van Tendeloo, G.; Houwman, E.P.; Koster, G.; Blank, D.H.A.; Rijnders, G. | ||||
Title | Optimized fabrication of high-quality La0.67Sr0.33MnO3 thin films considering all essential characteristics | Type | A1 Journal article | ||
Year | 2011 | Publication | Journal of physics: D: applied physics | Abbreviated Journal | J Phys D Appl Phys |
Volume | 44 | Issue | 20 | Pages | 205001-205001,9 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | In this paper, an overview of the fabrication and properties of high-quality La0.67Sr0.33MnO3 (LSMO) thin films is given. A high-quality LSMO film combines a smooth surface morphology with a large magnetization and a small residual resistivity, while avoiding precipitates and surface segregation. In the literature, typically only a few of these issues are adressed. We therefore present a thorough characterization of our films, which were grown by pulsed laser deposition. The films were characterized with reflection high energy electron diffraction, atomic force microscopy, x-ray diffraction, magnetization and transport measurements, x-ray photoelectron spectroscopy and scanning transmission electron microscopy. The films have a saturation magnetization of 4.0 µB/Mn, a Curie temperature of 350 K and a residual resistivity of 60 µΩ cm. These results indicate that high-quality films, combining both large magnetization and small residual resistivity, were realized. A comparison between different samples presented in the literature shows that focussing on a single property is insufficient for the optimization of the deposition process. For high-quality films, all properties have to be adressed. For LSMO devices, the thin-film quality is crucial for the device performance. Therefore, this research is important for the application of LSMO in devices. | ||||
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Publisher | Place of Publication | London | Editor | ||
Language | Wos | 000290150900001 | Publication Date | 2011-04-29 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0022-3727;1361-6463; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.588 | Times cited | 99 | Open Access | |
Notes | This research was financially supported by the Dutch Science Foundation, by NanoNed, a nanotechnology program of the Dutch Ministry of Economic Affairs, and by the NanOxide program of the European Science Foundation. This work is supported in part by the Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering, under contract DE-AC02-76SF00515. | Approved | Most recent IF: 2.588; 2011 IF: 2.544 | ||
Call Number | UA @ lucian @ c:irua:89557UA @ admin @ c:irua:89557 | Serial | 2491 | ||
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Author | van der Stam, W.; Geuchies, J.J.; Altantzis, T.; van den Bos, K.H.W.; Meeldijk, J.D.; Van Aert, S.; Bals, S.; Vanmaekelbergh, D.; de Mello Donega, C. | ||||
Title | Highly Emissive Divalent-Ion-Doped Colloidal CsPb1–xMxBr3Perovskite Nanocrystals through Cation Exchange | Type | A1 Journal article | ||
Year | 2017 | Publication | Journal of the American Chemical Society | Abbreviated Journal | J Am Chem Soc |
Volume | 139 | Issue | 139 | Pages | 4087-4097 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | Colloidal CsPbX3 (X = Br, Cl, and I) perovskite nanocrystals (NCs) have emerged as promising phosphors and solar cell materials due to their remarkable optoelectronic properties. These properties can be tailored by not only controlling the size and shape of the NCs but also postsynthetic composition tuning through topotactic anion exchange. In contrast, property control by cation exchange is still underdeveloped for colloidal CsPbX3 NCs. Here, we present a method that allows partial cation exchange in colloidal CsPbBr3 NCs, whereby Pb2+ is exchanged for several isovalent cations, resulting in doped CsPb1−xMxBr3 NCs (M= Sn2+, Cd2+, and Zn2+; 0 < x ≤ 0.1), with preservation of the original NC shape. The size of the parent NCs is also preserved in the product NCs, apart from a small (few %) contraction of the unit cells upon incorporation of the guest cations. The partial Pb2+ for M2+ exchange leads to a blue-shift of the optical spectra, while maintaining the high photoluminescence quantum yields (>50%), sharp absorption features, and narrow emission of the parent CsPbBr3 NCs. The blue-shift in the optical spectra is attributed to the lattice contraction that accompanies the Pb2+ for M2+ cation exchange and is observed to scale linearly with the lattice contraction. This work opens up new possibilities to engineer the properties of halide perovskite NCs, which to date are demonstrated to be the only known system where cation and anion exchange reactions can be sequentially combined while preserving the original NC shape, resulting in compositionally diverse perovskite NCs. |
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Language | Wos | 000397477700027 | Publication Date | 2017-03-10 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0002-7863 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 13.858 | Times cited | 535 | Open Access | OpenAccess |
Notes | W.v.d.S. and C.d.M.D. acknowledge financial support from the division of Chemical Sciences (CW) of The Netherlands Organization for Scientific Research (NWO) under grant number ECHO.712.012.001. J.J.G. and D.V. acknowledge financial support from the Debye Graduate program. S.B. acknowledges financial support from the European Research Council (ERC Starting Grant # 335078-COLOURATOMS). K.H.W.v.d.B., S.B., S.V.A. and T.A. acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through project fundings (G.0374.13N, G.0368.15N, G.0369.15N), a Ph.D. grant to K.H.W.v.d.B, and a postdoctoral research grant to T.A. (ROMEO:white; preprint:; postprint:restricted 12 months embargo; pdfversion:cannot); ECAS_Sara | Approved | Most recent IF: 13.858 | ||
Call Number | EMAT @ emat @ c:irua:141754UA @ admin @ c:irua:141754 | Serial | 4482 | ||
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Author | Akamine, H.; Van den Bos, K.H.W.; Gauquelin, N.; Farjami, S.; Van Aert, S.; Schryvers, D.; Nishida, M. | ||||
Title | Determination of the atomic width of an APB in ordered CoPt using quantified HAADF-STEM | Type | A1 Journal article | ||
Year | 2015 | Publication | Journal of alloys and compounds | Abbreviated Journal | J Alloy Compd |
Volume | 644 | Issue | 644 | Pages | 570-574 |
Keywords | A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) | ||||
Abstract | Anti-phase boundaries (APBs) in an ordered CoPt alloy are planar defects which disturb the ordered structure in their vicinity and decrease the magnetic properties. However, it has not yet been clarified to what extend the APBs disturb the ordering. In this study, high-resolution HAADF-STEM images are statistically analysed based on the image intensities estimated by the statistical parameter estimation theory. In the procedure, averaging intensities, fitting the intensity profiles to specific functions, and assessment based on a statistical test are performed. As a result, the APBs in the stable CoPt are found to be characterised by two atomic planes, and a contrast transition range as well as the centre of an inclined APB is determined. These results show that the APBs are quite sharp and therefore may have no notable effect on the net magnetic properties due to their small volume fraction. (C) 2015 Elsevier B.V. All rights reserved. | ||||
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Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000357143900083 | Publication Date | 2015-05-07 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0925-8388; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 3.133 | Times cited | 12 | Open Access | |
Notes | FWO G036815N; G036915N; G037413N; 278510 VORTEX; Hercules; ECASJO_; | Approved | Most recent IF: 3.133; 2015 IF: 2.999 | ||
Call Number | c:irua:127008 c:irua:127008 | Serial | 675 | ||
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Author | Van Aert, S.; De Backer, A.; Martinez, G.T.; den Dekker, A.J.; Van Dyck, D.; Bals, S.; Van Tendeloo, G. | ||||
Title | Advanced electron crystallography through model-based imaging | Type | A1 Journal article | ||
Year | 2016 | Publication | IUCrJ | Abbreviated Journal | Iucrj |
Volume | 3 | Issue | 3 | Pages | 71-83 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab; Engineering Management (ENM) | ||||
Abstract | The increasing need for precise determination of the atomic arrangement of non-periodic structures in materials design and the control of nanostructures explains the growing interest in quantitative transmission electron microscopy. The aim is to extract precise and accurate numbers for unknown structure parameters including atomic positions, chemical concentrations and atomic numbers. For this purpose, statistical parameter estimation theory has been shown to provide reliable results. In this theory, observations are considered purely as data planes, from which structure parameters have to be determined using a parametric model describing the images. As such, the positions of atom columns can be measured with a precision of the order of a few picometres, even though the resolution of the electron microscope is still one or two orders of magnitude larger. Moreover, small differences in average atomic number, which cannot be distinguished visually, can be quantified using high-angle annular dark-field scanning transmission electron microscopy images. In addition, this theory allows one to measure compositional changes at interfaces, to count atoms with single-atom sensitivity, and to reconstruct atomic structures in three dimensions. This feature article brings the reader up to date, summarizing the underlying theory and highlighting some of the recent applications of quantitative model-based transmisson electron microscopy. | ||||
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Language | Wos | 000368590900010 | Publication Date | 2015-11-13 | |
Series Editor | Series Title | Abbreviated Series Title | |||
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ISSN | 2052-2525; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 5.793 | Times cited | 30 | Open Access | OpenAccess |
Notes | The authors gratefully acknowledge the Research Foundation Flanders (FWO, Belgium) for funding and for a PhD grant to ADB. The research leading to these results has received funding from the European Union 7th Framework Program (FP7/20072013) under grant agreement No. 312483 (ESTEEM2). SB and GVT acknowledge the European Research Council under the 7th Framework Program (FP7), ERC grant No. 335078 – COLOURATOMS and ERC grant No. 246791 – COUNTATOMS.; esteem2jra2; ECASSara; (ROMEO:green; preprint:; postprint:can ; pdfversion:can); | Approved | Most recent IF: 5.793 | ||
Call Number | c:irua:129589 c:irua:129589 | Serial | 3965 | ||
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Author | van Dyck, D.; Van Aert, S.; Croitoru, M. | ||||
Title | Atomic resolution electron tomography: a dream? | Type | A1 Journal article | ||
Year | 2006 | Publication | International journal of materials research | Abbreviated Journal | Int J Mater Res |
Volume | 97 | Issue | 7 | Pages | 872-879 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab | ||||
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Publisher | Place of Publication | Editor | |||
Language | Wos | 000239916700003 | Publication Date | 2013-12-09 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1862-5282;2195-8556; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 0.681 | Times cited | 6 | Open Access | |
Notes | Approved | Most recent IF: 0.681; 2006 IF: NA | |||
Call Number | UA @ lucian @ c:irua:60965 | Serial | 176 | ||
Permanent link to this record | |||||
Author | Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. | ||||
Title | High-resolution electron microscopy : from imaging toward measuring | Type | A1 Journal article | ||
Year | 2002 | Publication | IEEE transactions on instrumentation and measurement | Abbreviated Journal | Ieee T Instrum Meas |
Volume | 51 | Issue | 4 | Pages | 611-615 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | New York, N.Y. | Editor | ||
Language | Wos | 000178992000010 | Publication Date | 2003-01-03 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0018-9456; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 2.456 | Times cited | 13 | Open Access | |
Notes | Approved | Most recent IF: 2.456; 2002 IF: 0.592 | |||
Call Number | UA @ lucian @ c:irua:47521 | Serial | 1450 | ||
Permanent link to this record | |||||
Author | Bals, S.; Van Aert, S.; Van Tendeloo, G. | ||||
Title | High resolution electron tomography | Type | A1 Journal article | ||
Year | 2013 | Publication | Current opinion in solid state and materials science | Abbreviated Journal | Curr Opin Solid St M |
Volume | 17 | Issue | 3 | Pages | 107-114 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | Reaching atomic resolution in 3D has been the ultimate goal in the field of electron tomography for many years. Significant progress, both on the theoretical as well as the experimental side has recently resulted in several exciting examples demonstrating the ability to visualise atoms in 3D. In this paper, we will review the different steps that have pushed the resolution in 3D to the atomic level. A broad range of methodologies and practical examples together with their impact on materials science will be discussed. Finally, we will provide an outlook and will describe future challenges in the field of high resolution electron tomography. | ||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | London | Editor | ||
Language | Wos | 000323869800003 | Publication Date | 2013-03-30 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1359-0286; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 6.938 | Times cited | 24 | Open Access | |
Notes | Fwo; 312483 Esteem; Countatoms; | Approved | Most recent IF: 6.938; 2013 IF: 7.167 | ||
Call Number | UA @ lucian @ c:irua:109454 | Serial | 1457 | ||
Permanent link to this record |