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  Author Title Year Publication Volume Times cited Additional Links
Van Aert, S. Meer zien met onzichtbaar licht 2007 Karakter : tijdschrift van wetenschap 18 UA library record
Schryvers, D.; Shi, H.; Martinez, G.T.; Van Aert, S.; Frenzel, J.; Van Humbeeck, J. Nano- and microcrystal investigations of precipitates, interfaces and strain fields in Ni-Ti-Nb by various TEM techniques 2013 Materials science forum T2 – 9th European Symposium on Martensitic Transformations (ESOMAT 2012), SEP 09-16, 2012, St Petersburg, RUSSIA 738/739 2 UA library record; WoS full record; WoS citing articles
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2008 UA library record
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. The notion of resolution 2007 UA library record
van Dyck, D.; Van Aert, S.; Croitoru, M.D. Obstacles on the road towards atomic resolution tomography 2005 Microscoy and microanalysis 11 UA library record
Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J. Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis 2003 Institute of physics conference series UA library record; WoS full record;
Jones, L.; Yang, H.; Pennycook, T.J.; Marshall, M.S.J.; Van Aert, S.; Browning, N.D.; Castell, M.R.; Nellist, P.D. Smart Align : a new tool for robust non-rigid registration of scanning microscope data 2015 Advanced Structural and Chemical Imaging 1 131 UA library record; WoS full record; WoS citing articles
Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D. Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction 2005 Microscopy and microanalysis 11 UA library record
Van Aert, S. Statistical parameter estimation theory : a tool for quantitative electron microscopy 2012 UA library record
Batenburg, J.; Van Aert, S. Three-dimensional reconstruction of a nanoparticle at atomic resolution 2011 ERCIM news 86 UA library record
De Backer, A.; De Wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits? 2015 Journal of physics : conference series 644 UA library record; WoS full record
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. High resolution electron microscopy from imaging towards measuring 2001 ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 UA library record
de Backer, A.; De wael, A.; Gonnissen, J.; Martinez, G.T.; Béché, A.; MacArthur, K.E.; Jones, L.; Nellist, P.D.; Van Aert, S. Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting : what are the limits? 2015 Journal of physics : conference series 644 UA library record
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data 2008 UA library record
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. Atom column detection 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Atom counting 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Efficient fitting algorithm 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. General conclusions and future perspectives 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. Image-quality evaluation and model selection with maximum a posteriori probability 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Introduction 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Optimal experiment design for nanoparticle atom counting from ADF STEM images 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. Statistical parameter estimation theory : principles and simulation studies 2021 Advances in imaging and electron physics T2 – Advances in imaging and electron physics UA library record
De Backer, A.; Bals, S.; Van Aert, S. A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection 2023 Ultramicroscopy 3 UA library record; WoS full record; WoS citing articles
Zhang, Z.; Lobato, I.; De Backer, A.; Van Aert, S.; Nellist, P. Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions 2023 Ultramicroscopy 246 UA library record; WoS full record; WoS citing articles
Jain, N.; Hao, Y.; Parekh, U.; Kaltenegger, M.; Pedrazo-Tardajos, A.; Lazzaroni, R.; Resel, R.; Geerts, Y.H.; Bals, S.; Van Aert, S. Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals 2023 Micron 169 1 UA library record; WoS full record; WoS citing articles
Samal, D.; Gauquelin, N.; Takamura, Y.; Lobato, I.; Arenholz, E.; Van Aert, S.; Huijben, M.; Zhong, Z.; Verbeeck, J.; Van Tendeloo, G.; Koster, G. Unusual structural rearrangement and superconductivity in infinite layer cuprate superlattices 2023 Physical review materials 7 UA library record; WoS full record
Cioni, M.; Delle Piane, M.; Polino, D.; Rapetti, D.; Crippa, M.; Arslan Irmak, E.; Van Aert, S.; Bals, S.; Pavan, G.M. Sampling real-time atomic dynamics in metal nanoparticles by combining experiments, simulations, and machine learning 2024 Advanced Science UA library record; WoS full record
Arisnabarreta, N.; Hao, Y.; Jin, E.; Salame, A.; Muellen, K.; Robert, M.; Lazzaroni, R.; Van Aert, S.; Mali, K.S.; De Feyter, S. Single-layered imine-linked porphyrin-based two-dimensional covalent organic frameworks targeting CO₂ reduction 2024 Advanced energy materials UA library record; WoS full record
Ni, S.; Houwman, E.; Gauquelin, N.; Chezganov, D.; Van Aert, S.; Verbeeck, J.; Rijnders, G.; Koster, G. Stabilizing perovskite Pb(Mg0.33Nb0.67)O3-PbTiO3 thin films by fast deposition and tensile mismatched growth template 2024 ACS applied materials and interfaces 16 UA library record; WoS full record
Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S. Investigating lattice strain in Au nanodecahedrons 2016 UA library record
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