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Title
Year
Publication
Volume
Times cited
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Ignatova, V.A.
;
Conard, T.
;
Möller, W.
;
Vandervorst, W.
;
Gijbels, R.
Depth profiling of ZrO
2
/SiO
2
/Si stacks : a TOF-SIMS and computer simulation study
2004
Applied surface science
231/232
4
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