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Author | Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P. | ||||
Title | Stress analysis with convergent beam electron diffraction around NMOS transistors | Type | P1 Proceeding | ||
Year | 2001 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | 359-360 | ||
Keywords | P1 Proceeding; Electron microscopy for materials research (EMAT); Internet Data Lab (IDLab) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Princeton University Press | Place of Publication | Princeton, N.J. | Editor | |
Language | Wos | Publication Date | 0000-00-00 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1-58949-003-7 | ISBN | Additional Links | UA library record; WoS full record; | |
Impact Factor | Times cited | Open Access | |||
Notes | Approved | Most recent IF: NA | |||
Call Number | UA @ lucian @ c:irua:95736 | Serial | 3176 | ||
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