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  Author (up) Title Year Publication Volume Times cited Additional Links Links
Vasiliev, A.L.; Stepantsov, E.A.; Ivanov, Z.G.; Verbist, K.; Van Tendeloo, G.; Olsson, E. The microstructure and interfaces of intermediate layers in sapphire bicrystals 1997 Applied surface science 119 2 UA library record; WoS full record; WoS citing articles
Vasiliev, A.L.; Van Tendeloo, G.; Amelinckx, S.; Boikov, Y.; Olsson, E.; Ivanov, Z. Structural aspect of YBa2Cu3O7-x films on Sis with complex barrier layers 1995 Physica: C : superconductivity 244 28 UA library record; WoS full record; WoS citing articles doi
Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, S. Microstructure of YBa2Cu3O7-x films on buffered Si for microelectronic applications 1997 Superconductor science and technology 10 2 UA library record; WoS full record; WoS citing articles
Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, Z.; Claeson, T.; Kiselev, N.A. Structural aspects of the combination of Si and YBa2Cu3O7-x 1995 Institute of physics conference series 146 UA library record; WoS full record;
Vasiliev, R.B.; Babynina, A.V.; Maslova, O.A.; Rumyantseva, M.N.; Ryabova, L.I.; Dobrovolsky, A.A.; Drozdov, K.A.; Khokhlov, D.R.; Abakumov, A.M.; Gaskov, A.M. Photoconductivity of nanocrystalline SnO2 sensitized with colloidal CdSe quantum dots 2013 Journal of materials chemistry C : materials for optical and electronic devices 1 13 UA library record; WoS full record; WoS citing articles doi
Vassiliev, S.Y.; Laurinavichute, V.K.; Abakumov, A.M.; Govorov, V.A.; Bendovskii, E.B.; Turner, S.; Filatov, A.Y.; Tarasovskii, V.P.; Borzenko, A.G.; Alekseeva, A.M.; Antipov, E.V. Microstructural aspects of the degradation behavior of SnO2-based anodes for aluminum electrolysis 2010 Journal of the electrochemical society 157 3 UA library record; WoS full record; WoS citing articles pdf doi
Vast, L.; Carpentier, L.; Lallemand, F.; Colomer, J.-F.; Van Tendeloo, G.; Fonseca, A.; Nagy, J.B.; Mekhalif, Z.; Delhalle, J. Multiwalled carbon nanotubes functionalized with 7-octenyltrichlorosilane and n-octyltrichlorosilane: dispersion in Sylgard®184 silicone and Youngs modulus 2009 Journal of materials science 44 16 UA library record; WoS full record; WoS citing articles pdf doi
Vatanparast, M.; Egoavil, R.; Reenaas, T.W.; Verbeeck, J.; Holmestad, R.; Vullum, P.E. Bandgap measurement of high refractive index materials by off-axis EELS 2017 Ultramicroscopy 182 3 UA library record; WoS full record; WoS citing articles pdf doi
Vávra, O.; Gaži, S.; Golubović, D.S.; Vávra, I.; Dérer, J.; Verbeeck, J.; Van Tendeloo, G.; Moshchalkov, V.V. 0 and π phase Josephson coupling through an insulating barrier with magnetic impurities 2006 Physical review : B : condensed matter and materials physics 74 27 UA library record; WoS full record; WoS citing articles doi
Vega Ibañez, F.; Béché, A.; Verbeeck, J. Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)? 2022 Microscopy and microanalysis 3 UA library record; WoS full record; WoS citing articles url doi
Vega-Paredes, M.; Aymerich-Armengol, R.; Arenas Esteban, D.; Marti-Sanchez, S.; Bals, S.; Scheu, C.; Manjon, A.G. Electrochemical stability of rhodium-platinum core-shell nanoparticles : an identical location scanning transmission electron microscopy study 2023 ACS nano 17 2 UA library record; WoS full record; WoS citing articles url doi
Veith, G.M.; Lobanov, M.V.; Emge, T.J.; Greenblatt, M.; Croft, M.; Stowasser, F.; Hadermann, J.; Van Tendeloo, G. Synthesis and charactreization of the new Ln(2)FeMoO(7) (Ln = Y, Dy, Ho) compounds 2004 Journal of materials chemistry 14 17 UA library record; WoS full record; WoS citing articles pdf doi
Velazco Torrejón, A. Alternative scan strategies for high resolution STEM imaging 2021 UA library record url
Velazco, A.; Béché, A.; Jannis, D.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings 2022 Ultramicroscopy 232 18 UA library record; WoS full record; WoS citing articles url doi
Velazco, A.; Nord, M.; Béché, A.; Verbeeck, J. Evaluation of different rectangular scan strategies for STEM imaging 2020 Ultramicroscopy 13 UA library record; WoS full record; WoS citing articles url doi
Venturi, F.; Calizzi, M.; Bals, S.; Perkisas, T.; Pasquini, L. Self-assembly of gas-phase synthesized magnesium nanoparticles on room temperature substrates 2015 Materials research express 2 14 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J. Interpretation of “Energy-filtered electron-diffracted beam holography” by R.A. Herring 2006 Ultramicroscopy 106 8 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Bals, S.; Lamoen, D.; Luysberg, M.; Huijben, M.; Rijnders, G.; Brinkman, A.; Hilgenkamp, H.; Blank, D.H.A.; Van Tendeloo, G. Electronic reconstruction at n-type SrTiO3/LaAlO3 interfaces 2010 Physical review : B : condensed matter and materials physics 81 25 UA library record; WoS full record; WoS citing articles url doi
Verbeeck, J.; Béché, A.; Müller-Caspary, K.; Guzzinati, G.; Luong, M.A.; Den Hertog, M. Demonstration of a 2 × 2 programmable phase plate for electrons 2018 Ultramicroscopy 190 73 UA library record; WoS full record; WoS citing articles pdf url doi
Verbeeck, J.; Béché, A.; van den Broek, W. A holographic method to measure the source size broadening in STEM 2012 Ultramicroscopy 120 29 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Bertoni, G. Deconvolution of core electron energy loss spectra 2009 Ultramicroscopy 109 13 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Bertoni, G. Model-based quantification of EELS: is standardless quantification possible? 2008 Microchimica acta 161 5 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Bertoni, G. Model-based quantification of EELS spectra: treating the effect of correlated noise 2008 Ultramicroscopy 108 16 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Bertoni, G.; Lichte, H. A holographic biprism as a perfect energy filter? 2011 Ultramicroscopy 111 13 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Bertoni, G.; Schattschneider, P. The Fresnel effect of a defocused biprism on the fringes in inelastic holography 2008 Ultramicroscopy T2 – 16th International Microscopy Congress, SEP 03-08, 2006, Sapporo, JAPAN 108 15 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Guzzinati, G.; Clark, L.; Juchtmans, R.; Van Boxem, R.; Tian, H.; Béché, A.; Lubk, A.; Van Tendeloo, G. Shaping electron beams for the generation of innovative measurements in the (S)TEM 2014 Comptes rendus : physique 15 22 UA library record; WoS full record; WoS citing articles pdf url doi
Verbeeck, J.; Hébert; Rubino, S.; Novák, P.; Rusz, J.; Houdellier, F.; Gatel, C.; Schattschneider, P. Optimal aperture sizes and positions for EMCD experiments 2008 Ultramicroscopy 108 27 UA library record; WoS full record; WoS citing articles doi
Verbeeck, J.; Lebedev, O.I.; Van Tendeloo, G.; Cagnon, L.; Bougerol, C.; Tourillon, T. Fe and Co nanowires and nanotubes synthesized by template electrodeposition: a HRTEM and EELS study 2003 Journal of the electrochemical society 150 41 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Lebedev, O.I.; Van Tendeloo, G.; Mercey, B. SrTiO3(100)/(LaMnO3)m(SrMnO3)n layered heterostructures: a combined EELS and TEM study 2002 Physical review : B : condensed matter and materials physics 66 32 UA library record; WoS full record; WoS citing articles url doi
Verbeeck, J.; Lebedev, O.I.; Van Tendeloo, G.; Silcox, J.; Mercey, B.; Hervieu, M.; Haghiri-Gosnet, A.M. Electron energy-loss spectroscopy study of a (LaMnO3)8(SrMnO3)4 heterostructure 2001 Applied physics letters 79 19 UA library record; WoS full record; WoS citing articles pdf doi
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