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Author Guttmann, P.; Bittencourt, C.; Rehbein, S.; Umek, P.; Ke, X.; Van Tendeloo, G.; Ewels, C.P.; Schneider, G.
Title Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM Type A1 Journal article
Year (down) 2012 Publication Nature photonics Abbreviated Journal Nat Photonics
Volume 6 Issue 1 Pages 25-29
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Near-edge X-ray absorption spectroscopy (NEXAFS)1 is an essential analytical tool in material science. Combining NEXAFS with scanning transmission X-ray microscopy (STXM) adds spatial resolution and the possibility to study individual nanostructures2, 3. Here, we describe a full-field transmission X-ray microscope (TXM) that generates high-resolution, large-area NEXAFS data with a collection rate two orders of magnitude faster than is possible with STXM. The TXM optical design combines a spectral resolution of E/ΔE = 1 × 104 with a spatial resolution of 25 nm in a field of view of 1520 µm and a data acquisition time of ~1 s. As an example, we present image stacks and polarization-dependent NEXAFS spectra from individual anisotropic sodium and protonated titanate nanoribbons. Our NEXAFS-TXM technique has the advantage that one image stack visualizes a large number of nanostructures and therefore already contains statistical information. This new high-resolution NEXAFS-TXM technique opens the way to advanced nanoscale science studies.
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Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000298416200011 Publication Date 2011-11-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1749-4885;1749-4893; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 37.852 Times cited 76 Open Access
Notes Approved Most recent IF: 37.852; 2012 IF: 27.254
Call Number UA @ lucian @ c:irua:94198 Serial 2272
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