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Author Jannis, D.; van den Broek, W.; Zhang, Z.; Van Aert, S.; Verbeeck, J. pdf  doi
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  Title Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization Type A1 Journal article
  Year (down) 2025 Publication Ultramicroscopy Abbreviated Journal  
  Volume 269 Issue Pages 114084-11  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract By working out the Bethe sum rule, a boundary condition that takes the form of a linear equality is derived for the fine structure observed in ionization edges present in electron energy-loss spectra. This condition is subsequently used as a constraint in the estimation process of the elemental abundances, demonstrating starkly improved precision and accuracy and reduced sensitivity to the number of model parameters. Furthermore, the fine structure is reliably extracted from the spectra in an automated way, thus providing critical information on the sample's electronic properties that is hard or impossible to obtain otherwise. Since this approach allows dispensing with the need for user-provided input, a potential source of bias is prevented.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos WOS:001385161100001 Publication Date 2024-12-05  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991 ISBN Additional Links UA library record; WoS full record  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:211121 Serial 9435  
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