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	Author	Vanderborght, B.; Van Grieken, R.
	Title	Spark-source mass-spectrometric sensitivity factors for elements in a graphite matrix			Type	A1 Journal article
	Year	1979	Publication	Talanta : the international journal of pure and applied analytical chemistry	Abbreviated Journal
	Volume	26	Issue	6	Pages	461-465
	Keywords	A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
	Abstract	Relative sensitivity factors for determination of 41 elements by spark-source mass-spectrometry have been measured. The samples were pressed into graphite electrodes and ionized with a radiofrequency spark. The mass spectra were recorded on a photoplate and the resulting data processed by a computer. Indium was used as standard and the relative sensitivity factors for both singly- and doubly-charged ions were determined with reference to the singly-charged indium ion, with an overall error of 30%. The mean analysis precision was 16%.
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	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Wos	A1979GX58000005	Publication Date	2002-07-25
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0039-9140; 1873-3573	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor		Times cited		Open Access
	Notes				Approved	no
	Call Number	UA @ admin @ c:irua:113630			Serial	8563
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