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	Author	Šmit, Ž.; Janssens, K.; Proost, K.; Langus, I.
	Title	Confocal μ-XRF depth analysis of paint layers			Type	A1 Journal article
	Year	2004	Publication	Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms	Abbreviated Journal	Nucl Instrum Meth B
	Volume	219	Issue		Pages	35-40
	Keywords	A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
	Abstract	Focused narrow-band beam of the synchrotron radiation was used for in-depth analysis of historic and modern paint layers. The fluorescent radiation induced by 21 keV impact radiation was detected by a Si(Li) detector equipped with a polycapillary X-ray lens in con-focal geometry. Scanning of the sample was performed by a motorized xyz stage. Space resolution of 30 ìm was achieved. The procedure of evaluation of concentrations was based on the independent parameter method and included absorption of radiation in the outer layers and secondary fluorescence enhancement induced by hard X-rays of the same and neighboring layers.
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	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Wos	000221895800009	Publication Date	2004-02-21
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN	0168-583x	ISBN		Additional Links	UA library record; WoS full record; WoS citing articles
	Impact Factor	1.109	Times cited	69	Open Access
	Notes				Approved	Most recent IF: 1.109; 2004 IF: 0.997
	Call Number	UA @ admin @ c:irua:71386			Serial	5552
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