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Author |
Lei, C.H.; Van Tendeloo, G.; Siegert, M.; Schubert, J. |
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Title |
Microstructural investigation of BaTiO3 thin films deposited on (001) MgO |
Type |
A1 Journal article |
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Year  |
2002 |
Publication |
Journal of materials research |
Abbreviated Journal |
J Mater Res |
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Volume |
17 |
Issue |
8 |
Pages |
1923-1931 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Abstract |
The microstructure of BaTiO3 thin films, epitaxially deposited on (001) MgO by pulsed laser ablation, has been investigated by transmission electron microscopy. The films are always c-axis-orientated, but dislocations, {111} stacking faults, and antiphase boundaries are frequently observed. Conventional TEM and high-resolution microscopy allow one to deduce the Burgers vectors of dislocations as b(1) = <100> or b(2) = <110>, both being perfect dislocations. Most extrinsic stacking faults are ending at 1/3<112> or 1/3<111> partial dislocations; the displacement vector of the antiphase boundaries is 1/2<101>. Studying the interfacial structure by means of zone images taken along [100] and [110] shows that the misfit is mainly released by dislocations with Burgers vectors of 1/2<110> and 1/2<101>. |
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Publisher |
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Place of Publication |
New York, N.Y. |
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Wos |
000177208800010 |
Publication Date |
2008-03-06 |
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Edition |
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ISSN |
0884-2914;2044-5326; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.673 |
Times cited |
8 |
Open Access |
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Notes |
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Approved |
Most recent IF: 1.673; 2002 IF: 1.530 |
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Call Number |
UA @ lucian @ c:irua:103343 |
Serial |
2044 |
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| Permanent link to this record |
