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Guttmann, P.; Bittencourt, C.; Rehbein, S.; Umek, P.; Ke, X.; Van Tendeloo, G.; Ewels, C.P.; Schneider, G. Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM 2012 Nature photonics 6 76 UA library record; WoS full record; WoS citing articles