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Author
Title
Year
Publication
Volume
Times cited
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Hoornaert, S.
;
Treiger, B.
;
Valkovic, V.
;
Van Grieken, R.
Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level
1998
Microchimica acta
128
UA library record
;
WoS full record
;
WoS citing articles
Hoornaert, S.
;
Treiger, B.
;
Van Grieken, R.
;
Valkovic, V.
Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level
1996
UA library record
