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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G. The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures 2001 Materials science in semiconductor processing 4 6 UA library record; WoS full record; WoS citing articles pdf doi
Stuer, C.; van Landuyt, J.; Bender, H.; de Wolf, I.; Rooyackers, R.; Badenes, G. Investigation by convergent beam electron diffraction of the stress around shallow trench isolation structures 2001 Journal of the electrochemical society 148 13 UA library record; WoS full record; WoS citing articles pdf doi
Hens, S.; Stuer, C.; Bender, H.; Loo, R.; van Landuyt, J. Quantitative EFTEM study of germanium quantum dots 2001 UA library record; WoS full record;
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K. Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation 2001 Institute of physics conference series UA library record; WoS full record;
Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G. Morphology and defects in shallow trench isolation structures 1999 Conference series of the Institute of Physics 164 1 UA library record; WoS full record; WoS citing articles
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