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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Jehanathan, N.; Lebedev, O.; Gélard, I.; Dubourdieu, C.; Van Tendeloo, G. Structure and defect characterization of multiferroic <tex>ReMnO$3 films and multilayers by TEM 2010 Nanotechnology 21 15 UA library record; WoS full record; WoS citing articles pdf doi
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