NANOlab Center of Excellence literature database -- Query Results

<< 1 >>

List View

Author	Title	Year	Publication	Volume	Times cited	Additional Links
Schulze, A.; Hantschel, T.; Dathe, A.; Eyben, P.; Ke, X.; Vandervorst, W.	Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects	2012	Nanotechnology	23	29	UA library record; WoS full record; WoS citing articles
Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P.	Stress analysis with convergent beam electron diffraction around NMOS transistors	2001				UA library record; WoS full record;