| |
Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
|
Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. |
Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate |
2000 |
|
|
|
UA library record |
|
|
|
Hervieu, M.; Martin, C.; Van Tendeloo, G.; Mercey, B.; Maignan, A.; Jirak, Z.; Raveau, B. |
Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties |
2000 |
|
|
|
UA library record |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
|
|
|
UA library record |
|
|
|
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. |
Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
|
Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Determination of the silver sulphide cluster size distribution via computer simulations |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
|
Gijbels, R.; Adriaens, A. |
Einleitung zu den massenspektrometrischen Methoden |
2000 |
|
|
|
UA library record |
|
|
|
Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
|
|
UA library record |
|
|
|
Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of fullerenes and related materials |
2000 |
|
|
|
UA library record |
|
|
|
Herrebout, D.; Bogaerts, A.; Yan, M.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. |
An extended RF methane plasma 1D fluid model of interest in deposition of diamond-like carbon layers |
2000 |
|
|
|
UA library record |
|
|
|
Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Functioning of thiocyanate ions during sulphur and sulphur-plus-gold Sensitization |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
|
Bogaerts, A. |
Glow discharge mass spectrometry, methods |
2000 |
|
|
|
UA library record |
|
|
|
Giorgio, S.; Henry, C.R.; Pauwels, B.; Van Tendeloo, G. |
Gold particles supported on TiO2 |
2000 |
|
|
|
UA library record |
|
|
|
Kuhn, L.T.; Vanhoutte, F.; Cannaerts, M.; Neukermans, S.; Verschoren, G.; Bouwen, W.; van Haesendonck, C.; Lievens, P.; Silverans, R.E.; Pauwels, B.; Van Tendeloo, G. |
Granular films assembled of CoN, CrM and mixtures of CoN and CrM clusters: structure and electron transport properties |
2000 |
|
|
|
UA library record |
|
|
|
Van Tendeloo, G.; Krekels, T. |
Identification of new superconducting compounds by electron microscopy |
2000 |
|
|
|
UA library record |
|
|
|
Schuddinck, W.; Van Tendeloo, G.; Martin, C.; Hervieu, M.; Raveau, B. |
Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3 |
2000 |
|
|
|
UA library record |
|
|
|
Bogaerts, A.; Gijbels, R. |
Modeling network for argon glow discharges: the output cannot be better than the input |
2000 |
|
|
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jochum, K.P.; Gijbels, R.; Adriaens, A. |
Multielementmassenspektrometrie (MMS) |
2000 |
|
|
|
UA library record |
|
|
|
Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
|
Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S. |
Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM |
2000 |
|
|
|
UA library record |
|
|
|
Hadermann, J.; Abakumov, A.M.; Lebedev, O.I.; Antipov, E.V.; Van Tendeloo, G. |
Structural changes in fluorinated T{'} and T* phases |
2000 |
|
|
|
UA library record |
|
|
|
Pauwels, B.; Van Tendeloo, G.; Bouwen, W.; Kuhn, L.T.; Lievens, P. |
Structural properties of Au clusters on MgO |
2000 |
|
|
|
UA library record |
|
|
|
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Study of oxynitrides with dual beam TOF-SIMS |
2000 |
|
|
|
UA library record |
|
|
|
Van Tendeloo, G.; Pauwels, B.; Geuens, P.; Lebedev, O. |
TEM of nanostructured materials |
2000 |
|
|
31 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Lenaerts, J.; Verlinden, G.; Gijbels, R.; Geuens, I.; Callant, P. |
The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS) |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
|
Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C. |
The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
|
Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates |
2000 |
|
|
|
UA library record |
|
|
|
de Witte, H.; Conard, T.; Sporken, R.; Gouttebaron, R.; Magnee, R.; Vandervorst, W.; Caudano, R.; Gijbels, R. |
XPS study of ion induced oxidation of silicon with and without oxygen flooding |
2000 |
|
|
|
UA library record |
|
|
|
Aerts, A.; Janssens, K.; Velde, B.; Adams, F.; Wouters, H. |
Analysis of the composition of glass objects from Qumran, Israel and the comparison with other Roman glass from western Europe |
2000 |
|
|
|
UA library record |
|
|
|
Janssens, K.; Adams, F. |
Applications in art and archaeology |
2000 |
|
|
|
UA library record |
|
|
|
Janssens, K. |
Comparison with other microanalytical techniques |
2000 |
|
|
|
UA library record |
|
