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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Jannis, D.; Velazco, A.; Béché, A.; Verbeeck, J. Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process 2022 Ultramicroscopy 4 UA library record; WoS full record; WoS citing articles url doi
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