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Author
Title
Year
Publication
Volume
Times cited
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Moors, K.
;
Sorée, B.
;
Magnus, W.
Modeling and tackling resistivity scaling in metal nanowires
2015
International Conference on Simulation of Semiconductor Processes and Devices : [proceedings] T2 – International Conference on Simulation of Semiconductor Processes and, Devices (SISPAD), SEP 09-11, 2015, Washington, DC
UA library record
;
WoS full record
