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Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Michel, K.H.; Nikolaev, A.V.; Verberck, B. |
Theory of crystal structures of polymerized C60-fullerite and fullerides AC60, A=K, Rb, Cs |
2001 |
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UA library record; WoS full record; |
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Injuk, J.; Janssens, K.; van Espen, P.; Van Grieken, R. |
Novel quantitative procedures for in-situ X-ray fluorescence analysis |
2001 |
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UA library record |
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Van Grieken, R.; Cardell, C.; Delalieux, F.; Eyckmans, K. |
Analytical methods to study atmospheric pollution and weathering of materials |
2001 |
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UA library record |
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Bekshaev, A.; Kontush, S.; Popov, A.; Van Grieken, R. |
Application of light beams with non-zero angular momentum in optical study of micrometer-size aerosol particles |
2001 |
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UA library record; WoS full record; WoS citing articles |
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Van Grieken, R.; Eyckmans, K. |
Geen vuiltje aan de Noordzeelucht: aërosolen kennen geen grenzen |
2001 |
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UA library record |
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Eyckmans, K.; Van Grieken, R. |
Luchtkwaliteit boven de Noordzeekust |
2001 |
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UA library record |
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Injuk, J.; Van Grieken, R.E. |
X-ray fluorescence |
2001 |
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UA library record |
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Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. |
Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate |
2000 |
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UA library record |
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Hervieu, M.; Martin, C.; Van Tendeloo, G.; Mercey, B.; Maignan, A.; Jirak, Z.; Raveau, B. |
Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties |
2000 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
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UA library record |
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Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. |
Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study |
2000 |
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UA library record; WoS full record; |
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Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Determination of the silver sulphide cluster size distribution via computer simulations |
2000 |
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UA library record; WoS full record; |
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Gijbels, R.; Adriaens, A. |
Einleitung zu den massenspektrometrischen Methoden |
2000 |
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UA library record |
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Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
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UA library record |
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Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of fullerenes and related materials |
2000 |
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UA library record |
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Herrebout, D.; Bogaerts, A.; Yan, M.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. |
An extended RF methane plasma 1D fluid model of interest in deposition of diamond-like carbon layers |
2000 |
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UA library record |
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Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Functioning of thiocyanate ions during sulphur and sulphur-plus-gold Sensitization |
2000 |
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UA library record; WoS full record; |
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Bogaerts, A. |
Glow discharge mass spectrometry, methods |
2000 |
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UA library record |
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Giorgio, S.; Henry, C.R.; Pauwels, B.; Van Tendeloo, G. |
Gold particles supported on TiO2 |
2000 |
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UA library record |
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Kuhn, L.T.; Vanhoutte, F.; Cannaerts, M.; Neukermans, S.; Verschoren, G.; Bouwen, W.; van Haesendonck, C.; Lievens, P.; Silverans, R.E.; Pauwels, B.; Van Tendeloo, G. |
Granular films assembled of CoN, CrM and mixtures of CoN and CrM clusters: structure and electron transport properties |
2000 |
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UA library record |
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Van Tendeloo, G.; Krekels, T. |
Identification of new superconducting compounds by electron microscopy |
2000 |
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UA library record |
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Schuddinck, W.; Van Tendeloo, G.; Martin, C.; Hervieu, M.; Raveau, B. |
Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3 |
2000 |
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UA library record |
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Bogaerts, A.; Gijbels, R. |
Modeling network for argon glow discharges: the output cannot be better than the input |
2000 |
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1 |
UA library record; WoS full record; WoS citing articles |
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Jochum, K.P.; Gijbels, R.; Adriaens, A. |
Multielementmassenspektrometrie (MMS) |
2000 |
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UA library record |
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Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
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UA library record; WoS full record; |
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Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S. |
Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM |
2000 |
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UA library record |
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Hadermann, J.; Abakumov, A.M.; Lebedev, O.I.; Antipov, E.V.; Van Tendeloo, G. |
Structural changes in fluorinated T{'} and T* phases |
2000 |
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UA library record |
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Pauwels, B.; Van Tendeloo, G.; Bouwen, W.; Kuhn, L.T.; Lievens, P. |
Structural properties of Au clusters on MgO |
2000 |
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UA library record |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Study of oxynitrides with dual beam TOF-SIMS |
2000 |
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UA library record |
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Van Tendeloo, G.; Pauwels, B.; Geuens, P.; Lebedev, O. |
TEM of nanostructured materials |
2000 |
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31 |
UA library record; WoS full record; WoS citing articles |
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