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Author |
Title |
Year |
Publication |
Volume |
Times cited  |
Additional Links |
Links |
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Nihoul, G.; Leroux, C.; Cesari, C.; Van Tendeloo, G. |
Layered structures accomodating stoichiometry in M2X2O7 systems, as seen by diffraction and HREM |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Van Tendeloo, G.; Lebedev, O.I.; Verbist, K.; Abakumov, A.M.; Shpanchenko, R.V.; Antipov, E.V.; Blank, D.H.A. |
The local structure of YBCO based materials by TEM |
1999 |
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UA library record; WoS full record; |
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Zhang, M.-L.; March, N.H.; Peeters, A.; van Alsenoy, C.; Howard, I.; Lamoen, D.; Leys, F. |
Loss rate of a plasticizer in a nylon matrix calculated using macroscopic reaction-diffusion kinetics |
2003 |
Journal Of Applied Physics |
93 |
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UA library record; WoS full record; |
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Müller, E.; Kruse, P.; Gerthsen, D.; Schowalter, M.; Rosenauer, A.; Lamoen, D.; Kling, R. |
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography |
2005 |
Microscopy of Semiconducting Materials |
107 |
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UA library record; WoS full record; |
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Hervieu, M.; Michel, C.; Martin, C.; Huvé, M.; Van Tendeloo, G.; Maignan, A.; Pelloquin, D.; Goutenoire, F.; Raveau, B. |
Mécanismes de la non-stoechiométrie dans les nouveaux supraconducteurs à haute Tc |
1994 |
Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation |
4 |
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UA library record; WoS full record; |
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Seo, J.W.; Perret, J.; Fompeyrine, J.; Loquet, J.-P.; Van Tendeloo, G. |
Microstructural investigation of a La1.9Sr0.1CuO4 thin film grown by MBE under a large compressive strain |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Seo, J.W.; Perret, J.; Fompeyrine, J.; Van Tendeloo, G.; Loquet, J.-P. |
Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE |
1998 |
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UA library record; WoS full record; |
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Potapov, P.L.; Schryvers, D.; Strijckers, H.; van Roost, C. |
Microstructural mechanism of development in photothermographic materials |
2003 |
The journal of imaging science and technology |
47 |
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UA library record; WoS full record; WoS citing articles |
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Nistor, L.C.; Richard, O.; Zhao, O.; Bender, H.; Stesmans, A.; Van Tendeloo, G. |
A microstructural study of the thermal stability of atomic layer deposited Al2O3 thin films |
2003 |
Institute of physics conference series
T2 – Microscopy of semiconducting materials |
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UA library record; WoS full record; |
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Prouteau, C.; Verbist, K.; Hamet, J.F.; Mercey, B.; Hervieu, M.; Raveau, B.; Van Tendeloo, G. |
Microstructure of α-axis oriented YBCO films on SrTiO3 substrates using a new template layer La4BaCu5O13 |
1997 |
Physica: C : superconductivity |
288 |
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UA library record; WoS full record; |
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Verbist, K.; Tafuri, F.; Granozio, F.M.; Di Chiara, S.; Van Tendeloo, G. |
Microstructure of artificial [100] 45 degrees twist grain boundaries in YBa2Cu3O7-delta |
1998 |
Electron Microscopy 1998, Vol 2: Materials Science 1 |
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UA library record; WoS full record; |
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Verbist, K.; Tafuri, F.; Miletto Granozio, F.; di Chiara, S.; Van Tendeloo, G. |
Microstructure of artificial [100] 45° twist grain boundaries in YBa2Cu3O7- |
1998 |
Electron microscopy: vol. 2 |
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UA library record; WoS full record; |
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Richard, O.; Van Tendeloo, G.; Lemée, N.; le Lannic, J.; Guilloux-Viry, M.; Perrin, A. |
Microstructure of CuXMo6S8 Chevrel phase thin films on R-plane sapphire |
2000 |
Journal of electron microscopy |
49 |
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UA library record; WoS full record; WoS citing articles |
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Verbist, K.; Lebedev, O.I.; Verhoeven, M.A.J.; Winchern, R.; Rijnders, A.J.H.M.; Blank, D.H.A.; Tafuri, F.; Bender, H.; Van Tendeloo, G. |
Microstructure of YBa2Cu3O7-\delta Josephson junctions in relation to their properties |
1998 |
Superconductor science and technology |
11 |
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UA library record; WoS full record; WoS citing articles |
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Titantah, J.T.; Lamoen, D.; Schowalter, M.; Rosenauer, A. |
Modified atomic scattering amplitudes and size effects on the 002 and 220 electron structure factors of multiple Ga1-xInxAs/GaAs quantum wells |
2009 |
Journal of applied physics |
105 |
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UA library record; WoS full record |
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Van Gompel, M.; Atalay, A.Y.; Gaulke, A.; Van Bael, M.K.; D'Haen, J.; Turner, S.; Van Tendeloo, G.; Vanacken, J.; Moshchalkov, V.V.; Wagner, P. |
Morphological TEM studies and magnetoresistance analysis of sputtered Al-substituted ZnO films : the role of oxygen |
2015 |
Physica status solidi : A : applications and materials science |
212 |
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UA library record; WoS full record |
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Gasparotto, A.; Barreca, D.; Fornasiero, P.; Gombac, V.; Lebedev, O.; Maccato, C.; Montini, T.; Tondello, E.; Van Tendeloo, G.; Comini, E.; Sberveglieri, G. |
Multi-functional copper oxide nanosystems for H2 sustainable production and sensing |
2009 |
ECS transactions |
25 |
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UA library record; WoS full record; WoS citing articles |
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Frederickx, P.; Verbeeck, J.; Schryvers, D.; Helary, D.; Darque-Ceretti, E. |
Nanoparticles in lustre reconstructions |
2005 |
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UA library record; WoS full record; WoS citing articles |
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Fredrickx, P.; Schryvers, D.; Janssens, K. |
Nanoscale morphology of a piece of ruby red Kunckel glass |
2002 |
Physics and chemistry of glasses |
43 |
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UA library record; WoS full record; WoS citing articles |
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Goorden, L.; Van Tendeloo, G.; Lenaerts, S.; Deblonde, M.; et al. |
Nanotechnologie: gewikt en gewogen |
2009 |
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UA library record |
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Goorden, L.; Van Tendeloo, G.; Lenaerts, S.; Deblonde, M.; van Oudheusden, M.; et al. |
Nanotechnologie op de agenda |
2009 |
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UA library record |
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Cheng, J.P.; Zhang, X.B.; Ye, Y.; Tao, X.Y.; Liu, F.; Li, Y.; Van Tendeloo, G. |
Natural mineral-marine manganese nodule as a novel catalyst for the synthesis of carbon nanotubes |
2006 |
Journal of Wuhan University of Technology: materials science edition |
21 |
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UA library record; WoS full record; WoS citing articles |
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Maignan, A.; Lebedev, O.I.; Van Tendeloo, G.; Martin, C.; Hébert, S. |
Negative magnetoresistance in a V3+/V4+ mixed valent vanadate |
2010 |
Applied physics letters |
96 |
|
UA library record; WoS full record; WoS citing articles |
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Snoeck, E.; Van Tendeloo, G. |
Networking strategies of the microscopy community for improved utilisation of advanced instruments : (3) two European initiatives to support TEM infrastructures and promote electron microscopy over Europe, ESTEEM (20062011) and ESTEEM 2 (20122016) |
2014 |
Comptes rendus : physique |
15 |
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UA library record; WoS full record |
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Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
New intermediate defect configuration in Si studied by in situ HREM irradiation |
1997 |
Conference series of the Institute of Physics |
157 |
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UA library record; WoS full record; |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
Nucleation and growth of bainitic Ni5Al3 in B2 austenite and 3R martensite |
1994 |
Solid-solid state phase transformations |
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UA library record; WoS full record; |
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Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
Nucleation and growth of Ni5Al3 in austenite and martensite matrices |
1994 |
Electron Microscopy 1994, Vols 2a And 2b: Applications In Materials Sciences |
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UA library record; WoS full record; |
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Kee-Hyun, K.; van Daele, B.; Van Tendeloo, G.; Jong-Kyu, Y. |
Observations of intermetallic compound formation of hot dip aluminized steel |
2006 |
Aluminium alloys: part 1-2 |
519-521 |
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UA library record; WoS full record; WoS citing articles |
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Kirschhock, C.E.A.; Liang, D.; Aerts, A.; Aerts, C.A.; Kremer, S.P.B.; Jacobs, P.A.; Van Tendeloo, G.; Martens, J.A. |
On the TEM and AFM evidence of zeosil nanoslabs present during the synthesis of silicalite-1 : reply |
2004 |
Angewandte Chemie: international edition in English |
43 |
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UA library record; WoS full record; WoS citing articles |
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Grieten, E.; Caen, J.; Schryvers, D. |
Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM |
2014 |
Microscopy and microanalysis |
20 |
|
UA library record; WoS full record; WoS citing articles |
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