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  Author (up) Title Year Publication Volume Times cited Additional Links Links
Fang, P.a.; Gu, H.; Wang, P.l.; Van Landuyt, J.; Vleugels, J.; Van der Biest, O.; Effect of powder coating on stabilizer distribution in CeO2-stabilized ZrO2 ceramics 2005 Journal of the American Ceramic Society 88 11 UA library record; WoS full record; WoS citing articles doi
Vanhellemont, J.; Maes, H.E.; Schaekers, M.; Armigliato, A.; Cerva, H.; Cullis, A.; de Sande, J.; Dinges, H.; Hallais, J.; Nayar, V.; Pickering, C.; Stehlé, J.L.; Van Landuyt, J.; Walker, C.; Werner, H.; Salieri, P.; Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry 1993 Applied surface science T2 – SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63 13 UA library record; WoS full record; WoS citing articles pdf doi
Ahenach, J.; Cool, P.; Vansant, E.F.; Lebedev, O.; van Landuyt, J. Influence of water on the pillaring of montmorillonite with aminopropyltriethoxysilane 1999 Physical chemistry, chemical physics 1 10 UA library record; WoS full record; WoS citing articles doi
Amelinckx, S.; Bernaerts, D.; Van Tendeloo, G.; van Landuyt, J.; Lucas, A.A.; Mathot, M.; Lambin, P. The morphology, structure and texture of carbon nanotubes: an electron microscopy study 1995 UA library record
Amelinckx, S.; Bernaerts, D.; Zhang, X.B.; Van Tendeloo, G.; van Landuyt, J. A structure model and growth mechanism for multishell carbon nanotubes 1995 Science 267 169 UA library record; WoS full record; WoS citing articles pdf doi
Amelinckx, S.; Luyten, W.; Krekels, T.; Van Tendeloo, G.; van Landuyt, J. Conical, helically woud, graphite whiskers: a limliting member of the “fullerenes”? 1992 Journal of crystal growth 121 43 UA library record; WoS full record; WoS citing articles doi
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. Electron microscopy: principles and fundamentals 1997 UA library record
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. Handbook of microscopy: applications in materials science, solid-state physics and chemistry 1997 UA library record
Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. The study of high Tc-superconducting materials by electron microscopy and electron diffraction 1991 Superconductor science and technology T2 – SATELLITE CONF TO THE 19TH INTERNATIONAL CONF ON LOW TEMPERATURE PHYSICS : HIGH TEMPERATURE SUPERCONDUCTIVITY, AUG 13-15, 1990, QUEENS COLL, CAMBRIDGE, ENGLAND 4 2 UA library record; WoS full record; WoS citing articles pdf doi
Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. Electron microscopy of carbon nanotubes and related structures 1997 The journal of physics and chemistry of solids 58 12 UA library record; WoS full record; WoS citing articles doi
Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. Microstructure and formation mechanisms of cylindrical and conical scrolls of the misfit layer compounds PbNbnS2n+1 1997 Journal of crystal growth 172 23 UA library record; WoS full record; WoS citing articles
Bernaerts, D.; Amelinckx, S.; Zhang, X.B.; Van Tendeloo, G.; van Landuyt, J. Structural aspects of carbon nanotubes 1995 UA library record
Bernaerts, D.; op de Beeck, M.; Amelinckx, S.; van Landuyt, J.; Van Tendeloo, G. The chirality of carbon nanotubules determined by dark-field electron microscopy 1996 Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 74 20 UA library record; WoS full record; WoS citing articles pdf doi
Bernaerts, D.; Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J.; Ivanov, V.; Nagy, J.B. Electron microscopy study of coiled carbon tubules 1995 Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 71 72 UA library record; WoS full record; WoS citing articles pdf doi
Bernaerts, D.; Zhang, X.B.; Zhang, X.F.; Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. HREM study of Rb6C60 and helical carbon nanotubules 1994 Icem 13 UA library record
Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C. EM study of sensitisation of silver halide grains 1994 Icem 13 UA library record; WoS full record;
Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals 1996 The journal of imaging science and technology 40 4 UA library record; WoS full record; WoS citing articles
Cassiers, K.; van der Voort, P.; Linssen, T.; Vansant, E.F.; Lebedev, O.; van Landuyt, J. A counterion-catalyzed (S0H+)(X-I+) pathway toward heat- and steam-stable mesostructured silica assembled from amines in acidic conditions 2003 The journal of physical chemistry : B : condensed matter, materials, surfaces, interfaces and biophysical 107 9 UA library record; WoS full record; WoS citing articles doi
Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J. Modification of the multislice method for calculating coherent STEM images 1995 Physica status solidi: A: applied research 150 5 UA library record; WoS full record; WoS citing articles pdf doi
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging 1997 Ultramicroscopy 69 11 UA library record; WoS full record; WoS citing articles
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M. Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays 1999 Applied physics letters 75 481 UA library record; WoS full record; WoS citing articles pdf doi
de Gryse, O.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Vanhellemont, J.; Claeys, C.; Simoen, E. Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM 2001 Physica: B : condensed matter T2 – 21st International Conference on Defects in Semiconductors, JUL 16-20, 2001, GIESSEN, GERMANY 308 3 UA library record; WoS full record; WoS citing articles pdf doi
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers 1999 Microelectronic engineering 45 UA library record; WoS full record doi
de Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon 1999 The review of scientific instruments 70 5 UA library record; WoS full record; WoS citing articles doi
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy 2002 UA library record; WoS full record;
de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C. Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy 2004 Journal of the electrochemical society 151 13 UA library record; WoS full record; WoS citing articles pdf doi
de Gryse, O.; Vanhellemont, J.; Clauws, P.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. A novel approach to analyse FTIR spectra of precipitates in boron-doped silicon 2003 Physica: B : condensed matter T2 – 22nd International Conference on Defects in Semiconductors (ICDS-22), JUL 28-AUG 01, 2003, UNIV AARHUS, AARHUS, DENMARK 340 4 UA library record; WoS full record; WoS citing articles doi
De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J. Dynamical electron diffraction in substitutionally disordered column structures 1995 Ultramicroscopy 60 14 UA library record; WoS full record; WoS citing articles pdf doi
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. Direct observation of clusters in some FCC alloys by HREM 1994 Icem 13 UA library record; WoS full record;
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J. How to interpret short-range order HREM images 1996 UA library record
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