| Laffez, P.; Retoux, R.; Boullay, P.; Zaghrioui, M.; Lacorre, P.; Van Tendeloo, G. |
Transmission electron microscopy of NdNiO3 thin films on silicon substrates |
2000 |
European physical journal: applied physics |
12 |
16 |
UA library record; WoS full record; WoS citing articles |
