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Godet, M.; Vergès-Belmin, V.; Gauquelin, N.; Saheb, M.; Monnier, J.; Leroy, E.; Bourgon, J.; Verbeeck, J.; Andraud, C. Nanoscale investigation by TEM and STEM-EELS of the laser induced yellowing 2018 Micron 115 9 UA library record; WoS full record; WoS citing articles