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Author |
Title |
Year |
Publication |
Volume |
Times cited  |
Additional Links |
Links |
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Taylor, P.R.; Martin, J.M.L.; François, J.P.; Gijbels, R. |
An ab initio study of the C3+ cation using multireference methods |
1991 |
The journal of chemical physics |
95 |
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UA library record |
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Vandelannoote, R.; Blommaert, W.; van Grieken, R.; Gijbels, R. |
L'analyse des eaux géothermales par spectrométrie de masse à étincelles |
1979 |
Spectra 2000: la revue de l'instrumentation |
53 |
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UA library record |
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Veldeman, E.; Van 't dack, L.; Gijbels, R.; Campbell, M.; Vanhaecke, F.; Vanhoe, H.; Vandecasteele, C. |
Analysis of thermal waters by ICP-MS |
1991 |
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UA library record |
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Gijbels, R.; van Grieken, R. |
Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees) |
1977 |
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UA library record |
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Gijbels, R.; van Grieken, R.; Blommaert, W.; Van 't dack, L.; van Espen, P.; Nullens, H.; Saelens, R. |
Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges) |
1983 |
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UA library record |
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Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. |
Application of neural networks in image analysis: the classification of geometrical shapes |
1993 |
CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology |
10 |
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UA library record |
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Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. |
Application of trace element analysis to geothermal waters |
1977 |
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UA library record |
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Gijbels, R.; Oksenoid, K.G. |
Atomic mass spectrometry |
1995 |
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UA library record |
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Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. |
Characterization of complex silver halide photographic systems by means of analytical electron microscopy |
1994 |
Microbeam analysis |
3 |
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UA library record |
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
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UA library record |
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Gijbels, R. |
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals |
1991 |
Acta technica Belgica: metallurgie |
30 |
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UA library record |
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
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UA library record |
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Oleshko, V.P.; Gijbels, R.; Jacob, W. |
Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques |
1996 |
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UA library record |
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Pentcheva, E.N.; Petrov, P.S.; Veldeman, E.; Van 't dack, L.; Gijbels, R. |
Comportement hydrogéochimique des éléments traces au cours de l'interaction eau – roche en milieu alcalin |
1990 |
Doklady Bolgarskoi Akademii Nauk |
43 |
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UA library record |
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Pentcheva, E.; Van 't dack, L.; Veldeman, E.; Gijbels, R. |
Corrélations chimiques-géothermométriques des paramètres microchimiques des hydrothermes profonds |
1996 |
Comptes rendus de l'Académie bulgare des sciences |
49 |
|
UA library record |
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Shimizu, K.; Habazaki, H.; Bender, H.; Gijbels, R. |
The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES |
2004 |
Engineering materials |
52 |
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UA library record |
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van Straaten, M.; Butaye, L.; Gijbels, R. |
Depth profiling of coated steel wires by GDMS |
1992 |
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UA library record |
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Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
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UA library record |
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Geuens, I.; Gijbels, R.; Jacob, W. |
Depth profiling of silver halide microcrystals |
1991 |
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UA library record |
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van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
Determination of oxygen, silicon, phosphorus and copper in iron and steel by 14 MeV neutron activation analysis |
1971 |
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UA library record |
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Gijbels, R. |
Development of a Fourier transform laser microprobe mass spectrometer with external ion source |
1993 |
ICR/Ion trap newsletter |
30 |
|
UA library record |
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Gijbels, R.; Adriaens, A. |
Einleitung zu den massenspektrometrischen Methoden |
2000 |
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UA library record |
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Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
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UA library record |
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Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
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UA library record |
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Van 't dack, L.; Blommaert, W.; Vandelannoote, R.; Gijbels, R.; van Grieken, R. |
Equilibrium constants for trace elements in natural waters |
1983 |
Reviews in analytical chemistry |
7 |
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UA library record |
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Pentcheva, E.N.; Petrov, P.S.; Van 't dack, L.; Gijbels, R. |
Études génétiques du système “eau thermale – gaz – roche” sous l'influence de phénomènes volcaniques récents |
1995 |
Doklady Bolgarskoi Akademii Nauk |
48 |
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UA library record |
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van Roy, W.; van Vaeck, L.; Gijbels, R. |
Evaluation of the laser microprobe with time-of-flight mass spectrometer for organic surface and micro-analysis |
1992 |
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UA library record |
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Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and mechanism of formation of photographic sensitivity |
1998 |
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UA library record |
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Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and photographic sensitivity |
2000 |
Zhurnal nauchnoj prikladnoj fotografii i kinematografii |
45 |
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UA library record |
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