| |
Author |
Title |
Year |
Publication |
Volume  |
Times cited |
Additional Links |
Links |
|
|
Biermans, E.; Molina, L.; Batenburg, K.J.; Bals, S.; Van Tendeloo, G. |
Measuring porosity at the nanoscale by quantitative electron tomography |
2010 |
Nano letters |
10 |
79 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
DART explained: how to carry out a discrete tomography reconstruction |
2008 |
|
|
|
UA library record |
|
|
|
Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. |
Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples |
2014 |
|
|
|
UA library record |
|
