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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links  |
|
|
Bals, S.; Van Tendeloo, G.; Kisielowski, C. |
A new approach for electron tomography: annular dark-field transmission electron microscopy |
2006 |
Advanced materials |
18 |
53 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Nicolas-Boluda, A.; Yang, Z.; Dobryden, I.; Carn, F.; Winckelmans, N.; Pechoux, C.; Bonville, P.; Bals, S.; Claesson, P.M.; Gazeau, F.; Pileni, M.P. |
Intracellular fate of hydrophobic nanocrystal self-assemblies in tumor cells |
2020 |
Advanced Functional Materials |
30 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Huijben, M.; Koster, G.; Kruize, M.K.; Wenderich, S.; Verbeeck, J.; Bals, S.; Slooten, E.; Shi, B.; Molegraaf, H.J.A.; Kleibeuker, J.E.; Van Aert, S.; Goedkoop, J.B.; Brinkman, A.; Blank, D.H.A.; Golden, M.S.; Van Tendeloo, G.; Hilgenkamp, H.; Rijnders, G.; |
Defect engineering in oxide heterostructures by enhanced oxygen surface exchange |
2013 |
Advanced functional materials |
23 |
87 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S. |
Investigating lattice strain in Au nanodecahedrons |
2016 |
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UA library record |
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|
Salluzzo, M.; Aruta, C.; Maggio-Aprile, I.; Fischer, Ø.; Bals, S.; Zegenhagen, J. |
Growth of R1+xBa2-xCu3O7-\delta epitaxial films investigated by in situ scanning tunneling microscopy |
2001 |
Physica status solidi: A: applied research |
186 |
17 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
DART explained: how to carry out a discrete tomography reconstruction |
2008 |
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UA library record |
|
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Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. |
Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals |
2008 |
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|
UA library record |
|
|
|
Bals, S.; Stes, A.; Celis, V. |
Klassieke toetsing in de praktijk |
2009 |
|
|
|
UA library record |
|
|
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Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. |
Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples |
2014 |
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|
UA library record |
|
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Bals, S.; Kisielowski, C.; Croitoru, M.; Van Tendeloo, G. |
Tomography using annular dark field imaging in TEM |
2005 |
Microscopy and microanalysis |
11 |
|
UA library record |
|
