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  Author Title Year (down) Publication Volume Times cited Additional Links Links
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks 2003 Applied surface science 203 15 UA library record; WoS full record; WoS citing articles doi
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. Study of oxynitrides with dual beam TOF-SIMS 2000 UA library record
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. SIMS analysis of oxynitrides: evidence for nitrogen diffusion induced by oxygen flooding 2000 Surface and interface analysis 29 4 UA library record; WoS full record; WoS citing articles doi
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