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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Ding, L.; Raskin, J.-P.; Lumbeeck, G.; Schryvers, D.; Idrissi, H. TEM investigation of the role of the polycrystalline-silicon film/substrate interface in high quality radio frequency silicon substrates 2020 Materials Characterization 161 UA library record; WoS full record; WoS citing articles pdf url doi
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