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  Author Title Year (down) Publication Volume Times cited Additional Links Links
De wael, A.; De Backer, A.; Lobato, I.; Van Aert, S. Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt 2021 Ultramicroscopy UA library record; WoS full record; WoS citing articles pdf url doi
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