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  Author Title Year (down) Publication Volume Times cited Additional Links Links
De wael, A.; De Backer, A.; Jones, L.; Nellist, P.D.; Van Aert, S. Hybrid statistics-simulations based method for atom-counting from ADF STEM images 2017 Ultramicroscopy 177 8 UA library record; WoS full record; WoS citing articles pdf url doi
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