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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Verbeeck, J.; Bertoni, G. Model-based quantification of EELS spectra: treating the effect of correlated noise 2008 Ultramicroscopy 108 16 UA library record; WoS full record; WoS citing articles pdf doi
Potapov, P.L.; Verbeeck, J.; Schattschneider, P.; Lichte, H.; van Dyck, D. Inelastic electron holography as a variant of the Feynman thought experiment 2007 Ultramicroscopy 107 13 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. Electron channelling based crystallography 2007 Ultramicroscopy 107 32 UA library record; WoS full record; WoS citing articles doi
Potapov, P.; Lichte, H.; Verbeeck, J.; van Dyck, D. Experiments on inelastic electron holography 2006 Ultramicroscopy 106 28 UA library record; WoS full record; WoS citing articles doi
Verbeeck, J.; Van Aert, S.; Bertoni, G. Model-based quantification of EELS spectra: including the fine structure 2006 Ultramicroscopy 106 38 UA library record; WoS full record; WoS citing articles pdf doi
Radtke, G.; Botton, G.A.; Verbeeck, J. Electron inelastic, scattering and anisotropy: the two-dimensional point of view 2006 Ultramicroscopy 106 5 UA library record; WoS full record; WoS citing articles pdf doi
Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J. An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images 2006 Ultramicroscopy 106 18 UA library record; WoS full record; WoS citing articles pdf doi
Bertoni, G.; Beyers, E.; Verbeeck, J.; Mertens, M.; Cool, P.; Vansant, E.F.; Van Tendeloo, G. Quantification of crystalline and amorphous content in porous TiO2 samples from electron energy loss spectroscopy 2006 Ultramicroscopy 106 83 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J. Interpretation of “Energy-filtered electron-diffracted beam holography” by R.A. Herring 2006 Ultramicroscopy 106 8 UA library record; WoS full record; WoS citing articles pdf doi
van den Broek, W.; Verbeeck, J.; de Backer, S.; Scheunders, P.; Schryvers, D. Acquisition of the EELS data cube by tomographic reconstruction 2006 Ultramicroscopy 106 6 UA library record; WoS full record; WoS citing articles pdf doi
Kruse, P.; Schowalter, M.; Lamoen, D.; Rosenauer, A.; Gerthsen, D. Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography 2006 Ultramicroscopy 106 50 UA library record; WoS full record; WoS citing articles doi
Bals, S.; Kilaas, R.; Kisielowski, C. Nonlinear imaging using annular dark field TEM 2005 Ultramicroscopy 104 15 UA library record; WoS full record; WoS citing articles pdf doi
den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework 2005 Ultramicroscopy 104 70 UA library record; WoS full record; WoS citing articles pdf doi
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example 2005 Ultramicroscopy 104 37 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; van Dyck, D.; Lichte, H.; Potapov, P.; Schattschneider, P. Plasmon holographic experiments: theoretical framework 2005 Ultramicroscopy 102 43 UA library record; WoS full record; WoS citing articles pdf doi
Verbeeck, J.; Van Aert, S. Model based quantification of EELS spectra 2004 Ultramicroscopy 101 147 UA library record; WoS full record; WoS citing articles pdf doi
Potapov, P.L.; Schryvers, D. Measuring the absolute position of EELS ionisation edges in a TEM 2004 Ultramicroscopy 99 29 UA library record; WoS full record; WoS citing articles doi
van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? 2003 Ultramicroscopy 98 26 UA library record; WoS full record; WoS citing articles doi
Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. Optimal experimental design of STEM measurement of atom column positions 2002 Ultramicroscopy 90 35 UA library record; WoS full record; WoS citing articles doi
den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. Does a monochromator improve the precision in quantitative HRTEM? 2001 Ultramicroscopy 89 22 UA library record; WoS full record; WoS citing articles doi
Chen, J.H.; van Dyck, D.; op de Beeck, M.; van Landuyt, J. Computational comparisons between the conventional multislice method and the third-order multislice method for calculating high-energy electron diffraction and imaging 1997 Ultramicroscopy 69 11 UA library record; WoS full record; WoS citing articles
De Meulenaere, P.; Van Tendeloo, G.; van Landuyt, J.; van Dyck, D. On the interpretation of HREM images of partially ordered alloys 1995 Ultramicroscopy 60 20 UA library record; WoS full record; WoS citing articles pdf doi
De Meulenaere, P.; van Dyck, D.; Van Tendeloo, G.; van Landuyt, J. Dynamical electron diffraction in substitutionally disordered column structures 1995 Ultramicroscopy 60 14 UA library record; WoS full record; WoS citing articles pdf doi
Zhang, X.F.; Zhang, X.B.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.; Werner, H. A simple preparation method for air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60 1994 Ultramicroscopy 55 2 UA library record; WoS full record; WoS citing articles pdf doi
Zhang, X.B.; Zhang, X.F.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J. The reciprocal space of carbon tubes: a detailed interpretation of the electron diffraction effects 1994 Ultramicroscopy 54 59 UA library record; WoS full record; WoS citing articles doi
Van Tendeloo, G.; Amelinckx, S.; Muto, S.; Verheijen, M.A.; van Loosdrecht, P.H.M.; Meijer, G. Structures and phase transitions in C60 and C70 fullerites 1993 Ultramicroscopy 51 17 UA library record; WoS full record; WoS citing articles doi
Luyten, W.; Krekels, T.; Amelinckx, S.; Van Tendeloo, G.; van Dyck, D.; van Landuyt, J. Electron diffraction effects of conical, helically wound, graphite whiskers 1993 Ultramicroscopy 49 14 UA library record; WoS full record; WoS citing articles doi
Amelinckx, S.; Milat, O.; Van Tendeloo, G. Selective imaging of sublattices in complex structures 1993 Ultramicroscopy 51 8 UA library record; WoS full record; WoS citing articles doi
Fanidis, C.; van Dyck, D.; van Landuyt, J. Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases 1993 Ultramicroscopy 48 6 UA library record; WoS full record; WoS citing articles
Milat, O.; Van Tendeloo, G.; Amelinckx, S. Selective imaging of the “substructures” in incommensurately modulated intergrowth crystal structures 1992 Ultramicroscopy 41 5 UA library record; WoS full record; WoS citing articles doi
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