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Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices”. Marmorkos IK, Schweigert VA, Peeters FM, Lok JGS, , 2769 (1996)
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Cation ordering in Tl- and Hg-based superconducting materials”. Van Tendeloo G, De Meulenaere P, Hervieu M, Letouze F, Martin C, (1996)
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Charged-impurity correlations in a δ-doped quantum barrier”. Koenraad PM, Shi JM, van de Stadt AFW, Smets A, Perenboom JAAJ, Peeters FM, Devreese JT, Wolter JH, , 2351 (1996)
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Charged-impurity correlations in Si ?-doped GaAs”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, , 2351 (1996)
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Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques”. Oleshko VP, Gijbels R, Jacob W, , 46 (1996)
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Effects of DX centers on electronic structure of a ?-doped quantum barrier”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, , 2355 (1996)
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Effects of the DX centers on electronic structure of a δ-doped quantum barrier”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, , 2355 (1996)
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How to interpret short-range order HREM images”. De Meulenaere P, Van Tendeloo G, van Landuyt J, (1996)
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HREM study of short-range order in Cu-Pd alloys”. Rodewald M, Rodewald K, De Meulenaere P, Van Tendeloo G, (1996)
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Bogaerts A (1996) Mathematical modeling of a direct current glow discharge in argon. Universitaire Instelling Antwerpen, Antwerpen
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Melting of a quantum Wigner crystal in bi-layer structures”. Goldoni G, Peeters FM, , 2451 (1996)
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Orientation fluctuations, diffuse scattering and orientational order in solid C60”. Michel KH, Copley JRD World Scientific, Singapore, page 381 (1996).
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Tavernier S, op de Beeck W, Ghekiere J-P, Van Tendeloo G (1996) Positively charged toner for use in electrostatography : US5532097 : 07/02/1996
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Precision magnetometry on a submicron scale”. Geim AK, Lok JGS, Maan JC, Dubonos SV, Li XQ, Peeters FM, Nazarov YV, , 3311 (1996)
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Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe”. Janssens G, Geuens I, de Keyzer R, van Espen P, Gijbels R, Hubin A, Terryn H, Vereecken J Wiley, Chichester, page 161 (1996).
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Recent trends in solids mass spectrometry, with special emphasis on glow discharge mass spectrometry”. Gijbels R, Bogaerts A, , 71 (1996)
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Scanning microanalysis”. Oleshko V, Gijbels R Vch, Weinheim, page 661 (1996).
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TEM characterization of structural defects”. Van Tendeloo G Plenum Press, New York, page 473 (1996).
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X-ray microanalysis: a new tool for environmental analysis”. Adams F, Janssens K page 183 (1996).
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Analisis cuantitativo sin estandares de particulas individuales mediante microsonda de electrones”. Trincavelli JC, Van Grieken R page 273 (1996).
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Atmospheric aerosols and deposition near historic buildings: chemistry, sources, interrelationships and relevance”. Van Grieken R, Torfs K, (1996)
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Atmospheric inputs of heavy metals into the North Sea”. Injuk J, Van Grieken R, (1996)
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Chemical characterisation, source identification and quantification of the input of atmospheric particulate matter into the North Sea”. van Malderen H, de Bock L, Hoornaert S, Injuk J, Van Grieken R page 103 (1996).
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Effects of marine spray and air pollution on monuments in the Mediterranean coastal environment”. Torfs K, Van Grieken R page 170 (1996).
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Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level”. Hoornaert S, Treiger B, Van Grieken R, Valkovic V page 29 (1996).
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Single particle characterisation of inorganic North Sea suspensions”. Jambers W, Van Grieken R, (1996)
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Study of environmental effects on deterioration of monuments: case study the cathedral of Bari, Italy”. Zezza F, Torfs K, Van Grieken R, García Pascua N, Macri F, (1996)
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Study of individual particle types and heavy metal deposition for North Sea aerosols using micro- and trace analysis techniques”. Injuk J, de Bock L, van Malderen H, Van Grieken R, (1996)
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Studying the composition of atmospheric aerosols through the joint application of hierarchical, non-hierarchical and fuzzy clustering to EPXMA data sets”. Treiger B, Bondarenko I, van Malderen H, Van Grieken R, (1996)
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Use of grazing emission XRF spectrometry for silicon wafer surface contamination measurements”. de Gendt S, Kenis K, Mertens PW, Heyns MM, Claes M, Van Grieken RE, Bailleul A, Knotter M, de Bokx PK, (1996)
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