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“A new model for the (2x1) reconstructed CoSi2-Si(100) interface”. Buschmann V, Fedina L, Rodewald M, Van Tendeloo G, Philosophical magazine letters 77, 147 (1998). http://doi.org/10.1080/095008398178589
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.941
Times cited: 10
DOI: 10.1080/095008398178589
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“Barium-based manganites Ln1-xBaxMnO3 with Ln = {Pr, La}: phase transitions and magnetoresistance properties”. Barnabé, A, Millange F, Maignan A, Hervieu M, Raveau B, Van Tendeloo G, Laffez P, Chem. mater. 10, 252 (1998). http://doi.org/10.1021/cm9704084
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 9.466
Times cited: 48
DOI: 10.1021/cm9704084
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“Reduced dimensionality in different forms of carbon”. Van Tendeloo G, Bernaerts D, Amelinckx S, Carbon 36, 487 (1998). http://doi.org/10.1016/S0008-6223(98)00050-5
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 6.337
Times cited: 4
DOI: 10.1016/S0008-6223(98)00050-5
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“Hetero-epitaxial growth of CoSi2 thin films on Si(100) : template effects and epitaxial orientations”. Buschmann V, Rodewald M, Fuess H, Van Tendeloo G, Schaffer C, Journal of crystal growth 191, 430 (1998). http://doi.org/10.1016/S0022-0248(98)00167-5
Abstract: This HREM investigation focuses on the influence of point defects on the final epitaxial relation and atomic interface configuration in a CoSi2/Si(1 0 0) heterostructure. A two-step SPE-MBE grown CoSi2/Si(1 0 0) system is used and, by altering the number of deposited Co monolayers in the template layer, the point defect behavior is studied. We propose a film growth model in which the knowledge about the reconstructed (2 x 1) : Si(1 0 0) surface, the point defect behavior in the presence of an interface, especially a silicide interface, the migration of point defects through a lattice by formation of [1 0 0]-split interstitial (dumbbell) atomic configurations, and a new type of extended defect configurations in diamond type materials will all amalgamate. (C) 1998 Published by Elsevier Science B.V. All rights reserved.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.751
Times cited: 6
DOI: 10.1016/S0022-0248(98)00167-5
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“Synthesis and structure of Ln4Re6-xO19 (Ln=Ce, Pr, Nd) complex oxides”. Bramnik KG, Abakumov AM, Shpanchenko RV, Antipov EV, Van Tendeloo G, Journal of alloys and compounds 278, 98 (1998). http://doi.org/10.1016/S0925-8388(98)00252-7
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.133
Times cited: 8
DOI: 10.1016/S0925-8388(98)00252-7
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“Effects of fluorination on the structure and superconducting properties of Y2Ba4Cu7O14+ phases”. Abakumov A, Rozova M, Shpanchenko R, Kovba M, Putilin S, Antipov E, Lebedev O, Van Tendeloo G, Kopnin E, Karpinski J, Physica: C : superconductivity 301, 155 (1998). http://doi.org/10.1016/S0921-4534(98)00108-7
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.404
Times cited: 9
DOI: 10.1016/S0921-4534(98)00108-7
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“Microstructure of artificial [100] 45°, twist grain boundaries in YBa2Cu3O7-”. Verbist K, Tafuri F, Miletto Granozio F, di Chiara S, Van Tendeloo G, Electron microscopy: vol. 2 , 593 (1998)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
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“Microstructure of artificial [100] 45 degrees twist grain boundaries in YBa2Cu3O7-delta”. Verbist K, Tafuri F, Granozio FM, Di Chiara S, Van Tendeloo G, Electron Microscopy 1998, Vol 2: Materials Science 1 , 593 (1998)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
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“Fine structure of CMR perovskites by HREM and CBEM”. Van Tendeloo G, Richard O, Schuddinck W, Hervieu M, Electron microscopy: vol. 1 , 383 (1998)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
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“Reduced dimensionality in different forms of carbon”. Van Tendeloo G, Bernaerts D, Amelinckx S, Fullerenes and carbon based materials , 487 (1998)
Abstract: Several TEM techniques are used to characterise the local structure of low dimensional forms of carbon. HREM is particularly useful to describe the defect structure of thin films of diamond or fullerenes and C-60-C-70 nanoclusters. A columnar form of graphite is analysed, mainly by electron diffraction which allowed us to propose a growth mechanism. Diffraction contrast dark field microscopy, in combination with electron diffraction, allows a detailed characterisation of carbon nanotubes; e.g. the chirality distribution of tubes in ropes of single wall tubes is studied by selected area electron diffraction. (C) 1998 Elsevier Science Ltd. All rights reserved.
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
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“Charcaterization by high-resolution transmission electron microscopy”. van Landuyt J, Van Tendeloo G Stt, Den Haag, page 187 (1998).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
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“HREM for characterisation of nanoscale microstructures”. van Landuyt J, Van Tendeloo G, , 15 (1998)
Keywords: P3 Proceeding; Electron microscopy for materials research (EMAT)
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“Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE”. Seo JW, Perret J, Fompeyrine J, Van Tendeloo G, Loquet J-P s.l., page 300 (1998).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
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“Microstructural investigation of a La1.9Sr0.1CuO4 thin film grown by MBE under a large compressive strain”. Seo JW, Perret J, Fompeyrine J, Loquet J-P, Van Tendeloo G, Electron microscopy: vol. 2 , 287 (1998)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
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“Needle twins and right-angled twins in minerals: comparison between experiment and theory”. Salje EKH, Buckley A, Van Tendeloo G, Ishibashi Y, Nord GL, The American mineralogist 83, 811 (1998)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.021
Times cited: 43
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“Layered structures accomodating stoichiometry in M2X2O7 systems, as seen by diffraction and HREM”. Nihoul G, Leroux C, Cesari C, Van Tendeloo G, Electron microscopy: vol. 2 , 295 (1998)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
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“HREM investigation of La1-xCaxMnO3- thin films”. Lebedev OI, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier H-U, Electron microscopy: vol. 2 , 517 (1998)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
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“Structure of Y123 and Y247 fluorinated phases by HREM”. Lebedev OI, Van Tendeloo G, Abakumov AM, Shpanchenko RV, Rozova MG, Antipov EV, Electron microscopy: vol. 3 , 297 (1998)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
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“HREM investigation of La(1-x)Ca(x)MnO3-delta thin films”. Lebedev O, Van Tendeloo G, Amelinckx S, Leibold B, Habermeier HU, , 517 (1998)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
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“Crystal growth studies during aerosol synthesis of nanostructured fullerene particles”. Joutsensaari J, Kauppinen EI, Bernaerts D, Van Tendeloo G, Materials Research Society symposium proceedings 520, 63 (1998)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
Times cited: 1
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“Study of the thermal decomposition of melt-quenched Ni-rich metastable bcc and amorphous Ni-Zr alloys”. Cziraki A, Gerocs I, Fogarassy B, Van Tendeloo G, Sommer F, Bakonyi I, International journal of non-equilibrium processing 10, 265 (1998)
Abstract: The phase transformation sequences during thermal decomposition are investigated for Ni-rich melt-quenched body-centred cubic (bcc) and amorphous Ni-Zr alloys. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) are used to determine the structure of crystallization products occurring after heating the melt-spun ribbon samples to various degrees of the phase transformation process monitored by differential scanning calorimetry (DSC). A single DSC peak is observed for both the bcc and amorphous Ni(91)Zr(9) alloys and a two-step process is indicated by DSC for the amorphous Ni(90)Zr(10) alloy. In the bcc-Ni(91)Zr(9) alloy which is actually a Ni(Zr) solid solution phase, the phase transformation starts with the precipitation of Ni(5)Zr crystallites followed, after a sufficient depletion of the matrix in Zr, by the subsequent transformation of the bcc-Ni(Zr) lattice to face-centred cubic (fcc) Ni. In the amorphous alloy of the same composition, the final products are fcc-Ni and Ni(5)Zr but at intermediate stages of the phase transformation, bcc-Ni(Zr) crystallites also appear. In the a-Ni(90)Zr(10) alloy the first DSC peak corresponds to the formation of the bcc-Ni(Zr) phase which then decomposes (second DSC peak) to the equilibrium phases fcc-Ni and Ni(5)Zr. Thus, in addition to the previous observation of the formation of the metastable bcc-Ni(Zr) phase by rapid quenching from the melt, here we present evidence that this phase can form also after partial crystallization of metallic glasses of appropriate chemical compositions.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Times cited: 2
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“Characterization of MO derived nanostructured titania powders”. Ahonen PP, Kauppinen EI, Tapper U, Nenonen P, Joubert JC, Deschanvres JL, Van Tendeloo G, Electron microscopy: vol. 2 , 373 (1998)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
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“Preparation of nanocrystalline titania powder by aerosol pyrolysis of titanium alkoxide”. Ahonen PP, Kauppinen EI, Deschanvres JL, Joubert JC, Van Tendeloo G, Materials Research Society symposium proceedings 520, 109 (1998)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
Times cited: 2
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“Landscape roughness at an atomic scale”. Van Tendeloo G, De Meulenaere P, Schryvers D, Physica: D : nonlinear phenomena 107, 401 (1997). http://doi.org/10.1016/S0167-2789(97)00108-5
Abstract: A large number of materials have a highly degenerate ground state and therefore a complex microstructure. Because of this degenerate state, phase transitions between the different phases play an important role. High resolution techniques in electron microscopy and nano-scale chemical analysis allow to study not only the microstructure but also the interfaces down to an atomic scale. We focus particularly on the ambiguity of alloys oil approaching the phase transition. The short range order (SRO) in ''1 1/20'' type alloys and the microstructure of ''tweed'' and needle formation in martensite like alloys with composition Ni5Al3 are considered in more detail.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.514
Times cited: 2
DOI: 10.1016/S0167-2789(97)00108-5
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“Short-range order in phase segregation systems”. De Meulenaere P, Mommaert C, Van Tendeloo G, Solid state communications 102, 687 (1997). http://doi.org/10.1016/S0038-1098(97)00071-9
Abstract: Spin systems on an f.c.c.-lattice which exhibit phase segregation are studied by means of Monte Carlo simulations. Short-range order, both above and below the segregation temperature, is observed. Experimental evidence for short range order in Ti-V is provided by electron diffraction.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.554
DOI: 10.1016/S0038-1098(97)00071-9
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“Electron microscopy of carbon nanotubes and related structures”. Bernaerts D, Amelinckx S, Van Tendeloo G, van Landuyt J, The journal of physics and chemistry of solids 58, 1807 (1997). http://doi.org/10.1016/S0022-3697(98)80003-6
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.059
Times cited: 12
DOI: 10.1016/S0022-3697(98)80003-6
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“Cation ordering in [(Tl, M)O] layers of “1202”-based cuprates : similarity to ordering in fcc-based alloys”. Van Tendeloo G, De Meulenaere P, Letouzé, F, Martin C, Hervieu M, Raveau B, Journal of solid state chemistry 132, 113 (1997). http://doi.org/10.1006/jssc.1997.7418
Abstract: ''1201'' Tl-based substituted cuprates of the type (Tl1-xMx) Sr2CuO5 have been synthesized for M = Nb, Ta, or W. These materials do not superconduct due to a statistical distribution of some of the M for Cu. The remarkable feature of these materials is the ordering observed between Tl and M in the (Tl1-xMx-epsilon)O plane. The type of ordering depends on the composition and shows remarkable similarities with the ordering in Ni-Mo or other so-called 1 1/2 0 type fcc-based alloys or with the ordering in rocksalt oxides TiOx. The short-range order, for M = W, can be readily interpreted in terms of a mixing of nano-clusters with two different compositions. These observations of two-dimensional ordering confirm recent ideas about ordering in three-dimensional fcc-based alloys.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.299
Times cited: 2
DOI: 10.1006/jssc.1997.7418
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“Real-space characterization of short-range order in Cu-Pd alloys”. Rodewald M, Rodewald K, De Meulenaere P, Van Tendeloo G, Physical review : B : condensed matter and materials physics 55, 14173 (1997). http://doi.org/10.1103/PhysRevB.55.14173
Abstract: Cu-Pd alloys containing 10, 20, 30, 40, and 50 at. % Pd and quenched from a temperature just above the ordering temperature T-c are investigated by electron diffraction and high-resolution electron microscopy (HREM). The results show diffuse electron diffraction intensities at {100} and {110} positions for the alloy with 10 at. % Pd, but with a characteristic twofold and fourfold splitting for the alloys with more than 10 at. % Pd. High-resolution images show the formation of microdomains best developed between 20 and 30 at. % Pd. A real-space characterization has been performed by applying videographic real-structure simulations revealing that the splitting of the diffuse maxima depends on the average distance between microdomains of Cu3Au type in antiphase with each other. By applying image processing routines on the HREM images, correlation vectors are identified which correspond to correlations between microdomains.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 15
DOI: 10.1103/PhysRevB.55.14173
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“Characterisation of multilayer ramp-type REBa2Cu3O7-\delta structures by scanning probe microscopy and high-resolution electron microscopy”. Blank DHA, Rijnders AJHM, Verhoeven MAJ, Bergs RMH, Rogalla H, Verbist K, Lebedev O, Van Tendeloo G, Journal of alloys and compounds
T2 –, Symposium on High Temperature Superconductor Thin Films, Growth, Mechanisms, Interfaces, Multilayers, at the 1996 Spring Meeting of the European-Materials-Society, June 04-07, 1996, Strasbourg, France 251, 206 (1997). http://doi.org/10.1016/S0925-8388(96)02799-5
Abstract: We studied the morphology of ramps in REBa2CU3O7 (REBCO) epitaxial films on SrTiO3 substrates, fabricated by RF magnetron sputter deposition and pulsed laser deposition (PLD), by scanning probe microscopy (SPM) and high resolution electron microscopy (HREM). The ramps were fabricated by Ar ion beam etching using masks of standard photoresist and TIN. AFM-studies on ramps in sputter deposited films show a strong dependence, i.e. formation of facets and ridges, on the angle of incidence of the ion beam with respect to the substrate surface as well as the rotation angle with respect to the crystal axes of the substrate. Ramps in pulsed laser deposited films did not show this dependence, Furthermore, we studied the effect of an anneal step prior to the deposition of barrier layers (i.e. PrBa2CU3O7, SrTiO3, CeO2) on the ramp. First results show a recrystallization of the ramp surface, resulting in terraces and a non-homogeneous growth of the barrier material on top of it. The thickness variations, for thin layers of barrier material, con even become much larger than expected from the amount of deposited material and are dependent on the deposition and anneal conditions. HREM studies show a well defined interface between barrier layer and electrodes. The angle of the ramp depends on the etch rate of the mask and REBCO, and on the angle of incidence of the ion beam. TiN has a much lower etch rate compared to photoresist, resulting in an angle of the ramp comparable to the angle of incidence, resulting in a low etching rate on the ramp. These results will lead to improved electrical characteristics of ramp-type junctions.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 3.133
DOI: 10.1016/S0925-8388(96)02799-5
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“Structural features, oxygen and fluorine doping in Cu-based superconductors”. Antipov EV, Putilin SN, Shpanchenko RV, Alyoshin VA, Rozova MG, Abakumov AM, Mikhailova DA, Balagurov AM, Lebedev O, Van Tendeloo G, Physica: C : superconductivity
T2 –, International Conference on Materials and Mechanisms of, Superconductivity –, High Temperature Superconductors V, Feb. 28-Mar. 04, 1997, Beijing, Peoples R. China 282, 61 (1997). http://doi.org/10.1016/S0921-4534(97)00210-4
Abstract: The variation of structures and superconducting properties by changing extra oxygen or fluorine atoms concentration in Hg-based Cu mixed oxides and YBa2Cu3O6+delta was studied. The data obtained by NPD study of Hg-1201 can be considered as an evidence of the conventional oxygen doping mechanism with 2 delta holes per (CuO2) layer. The extra oxygen atom was found to be located in the middle of the Hg mesh only. Different formal charges of oxygen and fluorine inserted into reduced 123 structure results in its distinct variations. The fluorine incorporation into strongly reduced YBa2Cu3O6+delta causes a significant structural rearrangement and the formation of a new compound with a composition close to YBa2Cu3O6F2 (tetragonal alpha = 3.87 Angstrom and c approximate to 13 Angstrom), which structure was deduced from the combined results of X-ray diffraction, electron diffraction and high resolution electron microscopy. Fluorination treatment by XeF2 of nonsuperconducting 123 samples causes an appearance of bulk superconductivity with T-c up to 94K.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.404
Times cited: 10
DOI: 10.1016/S0921-4534(97)00210-4
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