toggle visibility
Search within Results:
Display Options:
Number of records found: 2

Select All    Deselect All
 | 
Citations
 | 
   print
Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level”. Hoornaert S, Treiger B, Valkovic V, Van Grieken R, Microchimica acta 128, 207 (1998). http://doi.org/10.1007/BF01243051
toggle visibility
Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level”. Hoornaert S, Treiger B, Van Grieken R, Valkovic V page 29 (1996).
toggle visibility
Select All    Deselect All
 | 
Citations
 | 
   print

Save Citations:
Export Records: